Leading North America Supplier - 20 Years of Innovation - Shipping Globally
Flaw Detector with Signal Processing (Varied Pulser Function)
Flaw Detector with Signal Processing (Varied Pulser Function)

Flaw Detector with Signal Processing (Varied Pulser Function)

ID: GT00XY00ZH
Category:

USD Call for Quote

GAOTek Flaw Detector with Signal Processing (Varied Pulser Function) is designed to test thin materials using spike pulser with low, middle and high choices of pulse energy upto 1000 Hz frequency. It provides a multi-color TFT LCD and a host of new features to meet challenging inspection requirements. It combines powerful flaw detection and measurement capabilities, extensive data storage, and the ability to transfer detailed inspection data to the PC via its high-speed USB port. This flaw detector incorporates many advanced signal processing features narrowband filters to improve signal to noise in high gain applications, a spike pulser for applications requiring higher frequencies, and a tunable square wave pulser to optimize penetration on thick or highly attenuating materials. The flaw detector can be widely used in locating and sizing hidden cracks, voids, disbands, and similar discontinuities in welds, forgings, billets, axles, shafts, tanks and pressure vessels, turbines, and structural components.

Key Features

  • Semi-automatic two point calibration of transducer zero offset and/or material velocity
  • Flaw Locating with live display sound-path, projection (surface distance), depth and amplitude.
  • Automatic flaw sizing using AVG/AVG or DAC; speed reporting of defect acceptance or rejection.
  • Digital Readout and Trig. Function displays thickness or depth in digital readout when using a normal probe and beam path.
  • Angle probe displays the surface distance and depth when the angle probe is in use.
  • Both the DAC and the AVG method of amplitude evaluation are available.
  • Pulse echo test mode; dual element and thru-transmission.
  • Gate Monitors :Two independent gates controllable over entire sweep range
  • Rectification : Positive half wave, negative half wave, full wave, RF
  • Comes with AWS D1.1 certification.
  • Comes with curved surface correction, crack height measure and weld figure features.
  • Magnify gate spreads the gate range over the entire screen width.
  • Video Recording , play and auto-gain function
  • Simultaneously displays live A-scan at 60 Hz update rate and envelope of A-scan display
  • Compares frozen peak waveforms to live A-Scans enabling easy interpretation of test results.
  • A Scan Freeze displays freeze holds waveform and sound path data while the B Scan displays features
  • 640×480 pixels full digital TFT LCD with adjustable brightness.

Technical Specifications

Range 0 in to 393.6 in (0 mm to 9999 mm); at steel velocity
Material Velocity 1000 m/s to 9999 m/s
Display Delay -20 µs to 3400 µs
Probe Delay/Zero Offset 0 µs to 99.99 µs
Sensitivity 110 dB max in selectable resolution 0.1, 1.0, 2.0, 6.0 dB and locked
Pulser Tunable Square Wave Pulser
Pulse Repetition Frequency 10 Hz to 1000 Hz
Pulse Energy 200 V, 300 V, 400 V, 500 V, 600 V
Bandwidth (amplifier bandpass) 0.5 MHz to 15 MHz
System Linearity Horizontal: +/-0.2 % FSW,

Vertical: 0.25 % FSH

Amplifier Accuracy +/-1 dB
Reject (suppression) 0 % to 80 % full screen height
Transducer Connections BNC or LEMO
Power Requirements AC Mains 100 V to 240 V AC, 50-60 Hz
Dimensions 11.02 in × 8.66 in × 2.75 in (280 mm × 220 mm × 70 mm)
Weight 3.96 lbs (1.8 KG)
Operating Temperature 14 °F to 122 °F (-10 °C to 50 °C)
Storage Temperature -22 °F to 122 °F (-30 °C to 50 °C)

Additional Information

Accessories:

No. Item Quantity
1 GAOTek Flaw Detector with Signal Processing (Varied Pulser Function) 1
2 Straight Beam Probe 1
3 Angle Probe 1
4 Machine-probe Cable 1
5 Battery Module 1
6 Power Adapter (Charger) 1
7 Support Pillar 1
8 Manual 1
9 Instrument Case 1
10 Datapro Software 1
11 USB communication Cable 1

Working Principle

The instrument incorporates many advanced signal processing features including a 15 MHz RF bandwidth to permit testing of thin materials, narrowband filters to improve signal to noise in high gain applications, a spike pulser for applications requiring higher frequencies and a tuneable square wave pulser to optimize penetration on thick or highly attenuating materials. When presence of a defect in a workpiece with homogenous material, due to the defects, it will inform the interface among different mediums between the defect and workpiece. As the acoustic resistance is different at the interface, after the pulsing ultrasonic wave met the interface, it will produce reflection. The reflected energy will be received by the probe. Then it will show a reflection waveform in a certain abscissa position in the display screen which is the defect depth in the workpiece. The height and shape of reflecting wave would be different caused by the different defects which reflect the defect’s character.

Screen Display

The instrument displays are designed to be easy to interpret.

The Instrument has a digital screen for the display of A-Scan.
The status bar above the wave display shows values of range settings and measured values.

  1. Echo height is displayed as: 17.0 %. It means that the peak echo height inside the current selected gate is 17.0 % FSH (Full Screen Height of the wave area).
  2. Flaw size value means ERS (Equivalent Reflector Size) of the reflector signal inside the current selected gate. It is displayed after the AVG curve is switched on. When the DAC curve is on, this value will be displayed as the dB offset of the peak echo inside the current selected gate to the reference DAC curve (DAC→OFFSET→SIZE REF).
  3. The icon ‘→’ indicates that the horizontal scale is displayed as sound path (S-PATH). It can be changed to ‘→’ (Projection value) or ‘↓’ (Depth) from menu.
  4. On the right of the status bar, it shows the channel file name. “CH001” means current configuration is channel 1.
  5. ECHO POSITION represents the measured values of the peak echo (↘: Sound path. →: Projection.↓: Depth) inside the current selected gate.
  6. “A↘ 229.1” means gate mode is single; current selected gate is gate A; and peak echo position: sound path 9.01 in (229.1 mm).
  7. “AB↘ 24.0” means Echo-Echo mode of the gates; selected gate is gate A; sound path: 0.94 in (24.0 mm).

The names of the menus or submenus are displayed at the bottom of the screen. The selected menu or submenu is highlighted. Indicated at the right of the display, next to the A-Scan, are the functions of the corresponding menu.

Keys and Rotary Knob Features

The instrument is designed to give the user quick access to all of the instrument’s functions. Its easy-to-use menu system allows any function to be accessed with no more than three key presses.

To access any function:

  1. Press one of the five menu keys (F1~F5) to select a menu. The menus across the bottom of the display will immediately be replaced with the submenus contained in the selected menu
  2. Press a menu key (F1~F5) again to select the submenu containing the desired function.
  3. Press and  to move the cursor to select the desired function.
  4. Change the value listed in the function box with the rotary knob. Some values can also be adjusted with repeatedly pressing the knob.
  5. Special keys such as Gain, Gate, Range, Probe Zero-Offset Calibration, Angle Calibration, Freeze, Save Waveform, Auto-Gain, Envelop, Peak Hold and etc. Are grouped together for easy thumb control. This design allows direct access to important instrument set-up parameters and provides easy and fast operating in difficult inspection environments

Functions of the keys:

Home key immediately returns the instrument to the main screen (full screen)
Freeze key freezes the A-Scan
Magnify key expands the gate range to full screen
For turning the instrument On/Off
Db-Step key selects the gain submenus or switch the db step
Gate key – Gate functions selecting gate functions and Gate A/B switch
Range key – Range function selecting
Probe-Delay key – Probe Delay calibration
Probe-Angle key selects the angle calibration functions
Save key performs a data-storage of the A-Scan pattern
Auto-Gain key starts or stops the Auto-Gain function
Envelope key turns the Envelope function on and off
Peak-Hold key turns the Peak-Hold function on and off.
Video key starts or stops recording a segment of the display
DAC-AVG key selects the menus of DAC/AVG
Up Arrow key – Move the cursor up to select the desired function
Down Arrow key – Move the cursor down to the desired function
Searches next echo towards left, or move the cursor to left when inputting digit numbers.
Searches next echo towards right, or move the cursor to right when inputting digit numbers.
Confirms or switches current selection

Rotary knob makes it convenient for handling device parameters and functions.
It supports three operations: turn clockwise, turn counter-clockwise and single press.

  1. Turn clockwise: increase the selected parameter, or change the selection.
  2. Turn counter-clockwise: decrease the selected parameter, or change the item selection.
  3. Single press: changes mode between coarse and fine parameter adjustments or changes item selection.

Menus and Functions

The instrument menu system consists of several menus, submenus, and functions. It allows the operator to select and adjust various features and instrument settings.

  1. Available menus are accessed via the Home Menu. Note that the menus visible on your particular instrument depend on which options are installed.
  2. Each menu contains several submenus.
  3. Menus and submenus are selected by pressing the key below the desired item (F1 to F5).
  4. When a submenu is selected, the functions contained in that submenu are listed in the Function Bar down the right-hand side of the display screen.
  5. Functions are then selected by pressingand.
  6. Turning the Function Knob will change the value shown in the selected function’s box.

Note that some functions, like RANGE, have both coarse and fine adjustment modes. There are three steps in the fine adjustment mode. Coarse and fine modes are selected by pressing the knob more than once. An icon of “” will appear on the left of the function name when the function is in fine adjustment mode. When the function is in coarse adjustment mode, turning the function knob will produce large changes in the selected function’s value. When the function is in fine adjustment mode, rotating the function knob will change the value by smaller amounts.

Alarm Lights

Two alarm lights appear at the top-right corner front of the instrument’s keypad. One alarm light is marked as ALRM, which is assigned to the gate alarm. When a gate alarm is triggered, this light will illuminate. The other light is marked as PWR indicating power and battery status.

Status ALRM LED PWR LED
Gate alarm Red on ×
Battery charging × Flash red/green
Battery charge completed with external power connected × Green on
External power connected No battery installed × Green on
No external power × off

Initial Start-up
Power Supply

  1. The instrument can be operated with an external power adapter or with batteries.
  2. You can connect the instrument to the mains supply system even if it carries batteries. A discharged battery is charged in this case, viz. parallel to the instrument operation.


Operation Using the Power Supply Unit

Connect the instrument to the mains socket-outlet using the power supply unit. The plug receptacle is at the top left of the instrument. Push the plug of the power supply unit into the plug receptacle until it snaps into place with a clearly audible click. The PWR LED on the keypad of the instrument will light in green color if the connection is properly aligned

Operation Using Batteries

Use a lithium-ion battery pack provided with the instrument for the battery operation.
The battery compartment is situated at the instrument back. The cover is fastened with 4 screws. To insert the battery pack:

  1. Loosen the four screws of the battery cover.
  2. Lift the cover off upward.
  3. Insert the battery into the battery compartment.
  4. Close the battery compartment and fasten the screws.
  5. Turn on the instrument to make sure the battery is installed correctly and firmly.

Connecting a Probe

To prepare the instrument for operation, you have to connect a probe to it. The instrument is available with the probe connectors BNC (LEMO connectors are optional).

When connecting a probe to the instrument, it’s not only important that the probe’s physical connection be properly made. It’s also important that the instrument is properly configured to work with the installed probe. The Instrument will operate with one or two single-element probes or with a dual-element probe.

To install a single-element probe, connect the probe cable to either of the two ports on the front of the instrument. When two probes or a dual-element probe is connected to the instrument, the “Receive” probe connector should be installed in the right port and the ‘Transmit’ probe connector in the left port.

Connect one single element probe to either port. Connect leads from a Dual Element Probe to both ports.For through-transmission, connect two single element probes to the transmit  and receive ports

Starting the Instrument

To start the instrument, simply press down the On/Off key. If it operates on the internal battery pack, make sure to install the battery pack correctly before starting.The start display of the instrument appears; here you will also see the current software version and the serial number of the instrument. The instrument carries out a self-check and then switches over to stand-by mode.The instrument will automatically reload the last instrument setting. It has a special memory that retains all of its settings even when the power is off.The instrument will shut off automatically when the battery capacity level is too low.

Operation

Display mode selection

Mode A: Common display with explore menu on the foot.

Mode B: Common display with function items on the right and explore menu on the foot. Selection menu is on top level.

Mode A: Any key in F1~F5 is pressed and display mode will change to B.
Mode B: Any key in F1~F5 is pressed and display mode keeps in C but function items on the right of the screen will change accordingly. If is pressed, Display mode will change to A.

Parameter Item Selection

Any parameter item can be selected using shortcut key, function group selection key and function item selection key. The selected parameter item will be highlighted on screen.

For example if we want to change GATE MODE for 1 GATES to 2 GATES in display mode B. Firstly we press F1, secondly we press F4, It will now in Gate Logic setting interface. Press  or   key to move the cursor to GATE MODE item. Finally turn Rotary knob and select 2 GATES item.

Adjusting the Display Range

The function group BASE enables you to make the basic adjustment of the display range. The display on the screen must be adjusted for the material to be tested and for the probe used.

Calibration requires the use of calibrated standard made of the same material as the test piece. Prior to calibrating the instrument/probe combination, the A-Scan display-screen range (the material thickness value represented by the full horizontal width of the screen) will normally be set to a value equal to or slightly larger than the calibrated standard. 

  1. Activate the BASE submenu (located in the BASIC menu) by pressing the menu key below it.
  2. Three functions will appear down the right side of the display screen.
  3. Select the function item titled RANGE. You’ll note that RANGE has both coarse and fine adjustment modes. Coarse and fine modes are selected by repeatedly pressing .
  4. To change the range, turn the knob.
  5. The display’s horizontal range will remain as set.

Setting the Material Velocity

Use VEL to set the sound velocity within the test object. Always ensure that the function VEL is correctly set. The instrument calculates all range and distance indications on the basis of the value adjusted here.

Velocity range Coarse adjustment, in steps as follow
1000 m/s ~ 15000 m/s 2260 m/s 2730 m/s 3080 m/s 3230 m/s 4700 m/s 5920 m/s 6300 m/s

Setting the Display Delay

Here you can choose whether to display the adjusted range (for example 11.8 in (300 mm)) starting from the surface of the test object, or in a section of the test object starting at a later point. This allows you to shift the complete screen display and consequently also the display zero. If the display should for example start from the surface of the test object, the value in D-DELAY must be set to 0. To set the display delay

  1. Activate the BASE submenu (located in the BASIC menu) by pressing the menu key below it.
  2. Three functions will appear down the right side of the display screen.
  3. Select the function item titled D-DELAY.
  4. To change the display delay, turn the knob. You’ll note that the displayed echoes shift to the left or right.

D-DELAY range Coarse adjustment Fine adjustment
-20 μS ~3400 μS 12 pixel space (in μS) 1 pixel space (in μS)

Selecting the Probe Test Mode

You can use the function PROBE to activate the pulse-receiver separation. The following modes are available:

  1. STRAIGHT- For single straight beam transducer operation ( will be displayed).The probe connection sockets are connected in parallel.
  2. ANGLE- For single angle beam transducer operation (will be displayed)
  3. DUAL – For the use with dual-element (TR) probes (will be displayed); the right-hand socket is connected with the amplifier input whereas the initial pulse is available at the left-hand socket.
  4. THRU – Through-transmission mode for the use with two single-element probes (will be displayed); the receiver is connected with right, the pulse is connected with left.

Select the probe model step:

  1. Activate the PROBE submenu (located in the CAL menu) by pressing the menu key below it.
  2. Select the function item titled PROBE.
  3. To change the probe mode, turn the knob. Each available probe mode is represented by an icon on screen display whenever that probe mode is indicated.
  4. The probe mode will be set to the last one displayed.

Selecting a Rectification Mode
You can select the rectification mode of the echo pulses according to your application in the function RECTIFY (BASIC→ECHO→RECTIFY).Rectification affects the orientation of the A-Scan on the display screen. The A-Scan represents the pulse (echo) that’s returned from the material being tested to the instrument. The series of echoes looks like the Radio Frequency (RF) signal.

Use the following procedure to select a rectification mode

  1. Activate the ECHO submenu (located in the BASIC menu) by pressing the menu key below it.Three functions will appear down the right side of the display screen.
  2. Select the function item titled RECTIFY. You’ll note that there are four option:
    1. POS- Shows the positive component of the RF signal
    2. NEG- Shows the negative component of the RF signal but displays it in a positive orientation
    3. FULL-Shows the positive and negative halves of the RF wave, but both are oriented in the positive direction.
    4. RF- Shows the echo with no rectification
  3. Select the rectification method.


Configuring the Gates

The gates monitor the range of the test object where you expect to detect a flaw. If an echo exceeds or falls below the gate, an alarm signal is shown via the ALRM LED. The gate chooses the echo for the digital time-of-flight or amplitude measurement.

The instrument has two gates: gate A and B. Gate A and B are independent of one another. Setting the position and characteristics of the A- and B-Gates is the first step to configuring the instrument for flaw detecting or material-thickness measurement. The GATE functions controls not only the location of the A and B-Gates, but also the alarms and other features activated when an A-Scan signal crosses a specific gate.

A-Scan signals crossing the A or B-Gate are evaluated for the purposes of flaw detection and Material-thickness evaluation. When the signal crosses the A or B-Gate, the maximum point (peak) of the signal (in the specific gate) is used for evaluation purposes. The measured value is indicated on the status line.

Selecting a Gate

Selecting a gate by using the GATE SEL function in the GATE submenu

You can also repeatedly pressto switch the selected gate between Gate A and Gate B.
The selected gate will be shown in solid line. The unselected gate will be shown in dashed line.

Positioning Gates

Use the following procedures to set the vertical and horizontal position of the A and B-Gates. Remember that gate position has the following effects on instrument performance:

  1. A-Scan echoes on the right side of the display screen represent features that occur at a greater depth from the test-material surface than those on the left of the display screen. Therefore, moving a gate to the right means that the gate is evaluating a deeper portion of the test material.
  2. A wider gate will simply span the equivalent of more test-material depth
  3. Increasing the vertical height (called threshold) of a gate means that only reflected signals of sufficiently large amplitude will cross the gate.

Setting a Gate’s Starting Point
You can fix the starting point of the gates A or B within the display range.

  1. Activate the GATE submenu (located in the BASIC menu).
  2. Select the gate to be positioned using the GATE SEL function.
  3. Select the gate START function and adjust the starting point by turning the knob. Increasing and decreasing the value of the starting point moves the gate to the right and left, respectively.
  4. The gate starting point will remain as set, even when width adjustment is made.
Coarse adjustment Fine adjustment
half of a lattice 1 pixel space

Adjusting a Gate’s Width

You can determine the gate width within the display range.

  1. Activate the GATE submenu (located in the BASIC menu).
  2. Select the gate to be positioned using the GATE SEL function.
  3. Select the gate WIDTH function and adjust its value by turning the knob.

Coarse adjustment Fine adjustment
12 pixel space 1 pixel space

Setting a Gate’s Threshold (Vertical Position)

You can determine the threshold value of the gates within the range of 0 to 99 % FSH (Full Screen Height) for triggering the LED alarm if this value is exceeded or not reached, depending on the setting of the LOGIC function.

  1. Activate the GATE submenu (located in the BASIC menu).
  2. Select the gate to be positioned using the GATE SEL function.
  3. Select the THRESH function and adjust the vertical height by turning the knob. Increasing and decreasing the value of the threshold moves the gate up and down, respectively.


Setting the Pulse Energy Level

Use the function ENERGY to set the pulse voltage. The relative energy with which the pulse fires can be set to 200 V, 300 V, 400 V, 500 V or 600 V.

The setting 400 V and 500 V is recommended for most inspections. HIGH is used for inspections in which maximum sensitivity is import, e.g. for the detection of small flaws. Choose the setting LOW for broadband probes or if narrow echoes are required (better lateral resolution).

To set the pulse energy

  1. Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
  2. Select the function item titled ENERGY.
  3. Select the energy level by turning the knob or continuing to press the  key.


Setting the Probe X-Value

The function X-VALUE enables you to set the X-Value (distance between the probe’s leading face and probe index/sound exit point) of the probe used. This value is required for the automatic calculation of the reduced projection distance in angle beam transducer operation.

Adjustment range: 0 in ~ 1.96 in (0 mm ~ 50 mm)

Selecting Units
In the function UNITS you can choose your favourite unit system between METRIC and IMPERIAL unit systems.

    1.  Activate the SYS submenu (located in the CFG menu) by pressing the menu key below it.
    2. Select the function item titled UNITS. You’ll note that the following options are available:
      1. METRIC-metric unit system.
      2. IMPERIAL-Imperial unit system
    1. To change the units of measurements, Presskey or by means of the knob.
    2. The unit of measurement will be set to the choice last displayed.


Scale Setting

As an alternative to the measured values, the instrument enables to display a scale on the first status line. The scale gives you an overview of the position of echoes.

The following settings are possible:

  1. S-PATH: Display of sound path scale
  2. P-VALUE: Display of projection distance scale
  3. DEPTH: Display of depth distance scale


Select the function SCALE. Then use the knob to set the required display mode.
As an alternative, you can repeatedly press to switch the scale.
Key Sound

The key sound can be turned on or off using the KEY SOUND function located in the HORN submenu (CFG→DISP/SND→KEY SOUND).

Resetting the Instrument

In case the instrument can no longer be operated, or you need to make a basic initialization (factory setting), you can reset the instrument to original.

The instrument can be reset by the RESET ALL function. All the memory data, including the wave files, the channel files and the video files, will be cleared during system reset. And the instrument settings will be reset to default.

To reset the instrument

  1. Activate the RESET submenu (in the MEM menu) by pressing the menu key below it.
  2. Press and key to select the RESET ALL function.
  3. Presskey or turn the knob to trigger the reset action. It will prompt out “Reset to original” Press the menu key below YES to confirm the reset operation. Or press the menu key below NO to cancel the reset operation.


NOTE:

  1. The effects of resetting the instrument may not be reversed.
  2. No key action should be performed during resetting process.


Connecting to a Computer

The instrument is equipped with a USB port at the upper left of the instrument. The PC can be connected with the instrument via the USB port. A-Scan display, instrument settings, and videos stored in the memory of the instrument can be transferred to the computer through the USB port. Detailed information of the communication software and its usage refer to the Data Pro software manual.

Calibration and Measurement

Before working with the instrument, you have to calibrate the instrument: you have to adjust the material velocity and display range and allow for the probe delay depending on the material and dimensions of the test object.To ensure a safe and proper operation of the instrument, it is necessary that the operator be adequately trained in the field of ultrasonic testing technology.

Below you will find some examples of common calibration methods for certain test tasks.
Calibration with Straight- and Angle-Beam Probes
Case A: With Known Material Velocity
Calibration process

  1. Set the known material velocity in VEL function.
  2. Couple the probe to the calibration block.
  3. Set the required display range in RANGE. The calibration echo must be displayed on the screen.
  4. Position the gate on one of the calibration echoes until the sound path of the echo is indicated in the measurement line.
  5. After this, change the adjustment of the function P-DELAY until the correct sound path for the selected calibration echo is indicated in the measurement line.


Example:
You are carrying out the calibration with a straight probe for the calibration range of 11.8 in (300 mm) via the function group BASE using the calibration block DB-P (thickness 8.85 in (225 mm)) which is laid flat-wise.

  1. Select a new channel and clear that channel (MEM→CHANNEL→FILE).
  2. Set PROBE type to STRAIGHT.
  3. Set RANGE TO 11.8 in (300 mm).
  4. Set the known material velocity of 5920 m/s in VEL.
  5. Set the gate so that it is positioned on the first calibration echo (from 8.85 in (225 mm)).
  6. Read the sound path on the status line. If this value is not equal to 8.85 in (225 mm), change the adjustment for the function P-DELAY until it is at 8.85 in (225 mm).
  7. Save the calibration result to current channel file.


This completes the calibration of the instrument to the material velocity of 5920 m/s with a calibration range of 11.8 in (300 mm) for the straight-beam probe used.
Case B: With Unknown Material Velocity

Use the semiautomatic calibration function of the instrument via the function group CAL for this calibration case.The distances between two calibration echoes must be entered. The instrument will then carry out a plausibility check, calculate the material velocity and the probe delay, and automatically set the parameters using the calculation result.

Calibration Process

  1. Set the required display range in RANGE. The two calibration echoes selected must be displayed on the screen. Set the range so that the second calibration echo is located on the right edge of the screen.
  2. Select the function group PDELAY (CAL→PDELAY).
  3. Enter the distances of the two calibration echoes in S-REF1 and S-REF2.
  4. Position one gate on the first calibration echo.
  5. Position the other gate on the second calibration echo.
  6. Presskey when CAL is selected to trigger the calibration.

The calibration is confirmed by the message “Calibration is finished”. The instrument will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly. The value of the function P-DELAY will be set to the correct value.

If the instrument is not able to carry out any valid calibration on the basis of the input values and the echoes recorded, a corresponding error message is displayed. In that case, please check the values of your calibration lines and repeat the process of recording the calibration echoes.

Calibration with Dual-Element (TR) Probes
Dual-element (TR) probes are especially used for wall thickness measurement. The following peculiarities must be taken into account when using these probes:

Echo Flank. Most dual-element (TR) probes have a roof angle (transducer elements with inclined orientation toward the test surface). This causes mode conversions both at beam index (sound entry into the material) and at the reflection from the back wall, which can result in very jagged echoes.

V-Path Error. Dual-element (TR) probes produce a v-shaped sound path from the pulse via the reflection from the back wall to the receiver element. This so-called “V-path error” affects the measuring accuracy. You should therefore choose two wall thicknesses that cover the expected thickness measurement range for the calibration. In this way, the V-path error can be corrected to the greatest possible extend.

Higher Material Velocity. Due to the V-path error, a higher material velocity than that of the test material is given during calibration, especially with small thicknesses. This is typical of dual-element (TR) probes and serves for compensation of V-path error.

With small wall thicknesses, the above-described effect leads to an echo amplitude drop which has to be especially taken into account with thicknesses less than 0.078 in (2 mm).A stepped reference block having different wall thicknesses is required for calibration. The wall thicknesses must be selected so that they cover the expected readings.
Calibration Process

We recommend using the semiautomatic calibration function for the calibration with T/R probes.

  1. Set the required test RANGE
  2. Increase the probe delay until the two calibration echoes selected are displayed within the range
  3. Set the pulse and receiver functions according to the probe used and the test application.
  4. Select the function group PDELAY.
  5. Enter the distances of the two calibration echoes in S-REF1 and S-REF2.
  6. Position one gate on the first calibration echo.
  7. Position the other gate on the second calibration echo.
  8. Press key when CAL is selected to trigger the calibration.

The correct calibration is confirmed by the message “Calibration is finished”. The instrument will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly. The value of the function P-DELAY will be set to the correct value.If necessary, check the calibration on one or several known calibration lines, e.g. using the stepped reference block.

Distance Amplitude Curve

The instrument is available with Distance Amplitude Curve (DAC) function. Functions for the distance-amplitude curve are accessed through the DAC Menu, which is located by pressing.

When displayed, the DAC curve visually represents a line of constant reflector peaks over a range of material depths. A new feature of the instrument is a multiple-curve option that displays three dB offset DAC curves simultaneously. Each curve represents constant reflector size at varying material depth. Remember that in DAC mode, the only deviation from traditional display and operation is the appearance of the DAC curve. All A-Scan echoes are displayed at their non-compensated height.

A DAC curve is programmed using a series of same-reflector echoes at various depths covering the range of depths to be inspected in the test material. Because near field and beam spread vary according to transducer size and frequency, and materials vary in attenuation and velocity, DAC must be programmed differently for different applications. A DAC curve can be based on up to 16 data points (material depths).These points are recorded from the DAC menu as described below.

Recording the DAC Curve

DAC Curve points are typically taken from a standard with equally sized reflectors (holes) located at various material depths. The primary echo from each of these points (for up to a total of 16 echoes) are recorded. When DAC is active, the instrument displays a curve that represents echo peaks for constant reflectors at varying material depth. Before starting to record a reference curve, the instrument must be correctly calibrated. To program the DAC Curve:

  1. Access the DAC menu by pressing , then select the DAC submenu by pressing the menu key below it.
  2. Press and to select the PROGRAM item. Press the key or turn the knob to trigger the DAC program. When DAC program is triggered, “DAC” and a digit number indicating the point index appears on the top right corner of the display.
  3. Couple the probe to the first reference point and adjust the gate so that it is broken by the primary echo. If necessary, adjust the gain so that the echo crosses the gate and the highest peak in the gate is at approximately 80 % of full-screen height. The highest peak must not be higher than 100 % full-screen height. Note that you can press or  to search the next echo very quickly.
  4. While the gate is lined up over the first reference echo, Press and  to select the RECORD function press the key to record the first DAC Curve point. Note that the largest echo to cross the A-Gate will be treated as the reference echo. The gain value at which this point is recorded becomes the “baseline” gain value.
  5. Continue to record additional curve points up to a maximum of 16 points (note that at least one DAC Curve points are required). As soon as you have recorded at least one curve reference points, your DAC is already active.
  6. When complete press  and to select the FINISH and press key, then follow the on-screen prompts to exit the DAC program.


Note that you can change the DAC curve line type between CURVE and DIRECT.

Creating DAC Offset Curves

The three curves can be offset from the original DAC curve (ML) by a user-inputted amount.When operating with DAC turned on, three DAC curves including RL, SL and EL are typically displayed.

  1. Select the function DAC-RL (or DAC-SL, DAC-EL) located in the OFFSET submenu.
  2. Change the offset value by means of the knob.


The offset range is from -50 dB to 50 dB.

    

Specifying the DAC Reference Curve

Once the DAC curve is recorded and displayed (if not displayed, switch on by turning DAC DISP on), echoes are automatically compared to the size reference curve, which can be specified in the SIZE REF selection. The options include RL, SL, EL, and ML.

The dB equivalent height of the signal above or below the corresponding DAC Reference Curve amplitude is displayed as a comparison result.

Deleting a DAC Curve
To delete a stored DAC curve

  1. With the DAC menu activated, select the DEL submenu.
  2. Select the DEL DAC function.
  3. Press key or turn the knob. Then confirm your operation.

Turning On/Off the DAC display
Turning DAC DISP on and off causes the DAC curves to be displayed or removed.

  1. With the DAC menu activated, select the DISPLAY submenu.
  2. Select the DISP DAC function.
  3. Presskey or turn the knob to turn On/Off the DAC display.


Note that if the DAC curve is not created, it will prompt out “No DAC curve found” and DAC DISP will be set to OFF.
Echo Evaluation with DAC

  1. In order to be able to evaluate a flaw indication by means of the DAC, certain conditions must be met.
  2. The DAC curve must already be recorded.
  3. It only applies to the same probe that was used when recording the curve. Not even another probe of the same type must be used.
  4. The DAC only apply to the material corresponding to the material of the reference block.
  5. All functions affecting the echo amplitude must be set the same way as they were when the curve was recorded.


Curved Surface Correction

When using angle beam transducers on a curved surface the instrument will calculate the surface distance and depth of defect, taking into account the internal or external radius.

THICK: Use the THICK function to set the material’s wall thickness. This value is required for the 30 automatic calculation of the real depth. Adjustment range: 0 in ~ 196.8 in (0 mm ~ 5000 mm)

O-DIAM (Outside diameter of the test object): You will need the CSC function for tests on circular curved surfaces, for example when testing longitudinally welded tubes. In order to make the instrument carry out the corresponding correction of (reduced) projection distance and depth, you should enter the outside diameter of your test object in this function. Adjustment range: 0 in ~ 196.8 in (0 mm ~ 5000 mm)

CSC: If you plan to carry out the flaw position calculation for the curved surface workpieces, the CSC function should be turned on. Otherwise turn off the CSC function.

Flaw Sizing Feature
Using the Flaw Sizing feature, you can calculate the equivalent size of the flaw easily and quickly.

  1. Position the selected gate over the echo from the back wall of the workpiece.
  2. Adjust the gain to increase the echo height to 80 % FSH.
  3. Activating the SIZE submenu locating in the FUNC menu by pressing the corresponding key below it.
  4. Select the BACK GAIN function. Then press key to trigger the back-echo recording and analysis process. The instrument will record the echo and calculate the required gain sensitivity automatically. Then the instrument will automatically adjust the gain to the calculation result.
  5. Position the selected gate over the echo from the flaw.
  6. Adjust the gain to increase the echo height to 80 % FSH.
  7. Select the CALC function. Then press  key to calculate the equivalent size.
  8. The calculation result (the equivalent size of the flaw) will be displayed below the CALC item.


Crack Height Measuring Feature

This feature allows measuring the height of a crack found inside the workpiece. Before starting to use the Crack Height Measure function, the instrument and the probe must be correctly calibrated.

  1. Activate the CRACK submenu locating in the FUNC menu by pressing the corresponding key below it.
  2. Position the selected gate over the echo from the first point of the crack. Then record its position using the A-POINT function.
  3. Position the selected gate over the echo from the second point of the crack.
  4. Then record its position in the B-POINT function.
  5. The instrument will automatically calculate the crack height using the recorded parameters and displays the result in the HEIGHT bar.

Envelope Function

When the ENVELOPE function is activated, the echoes with the highest amplitude within selected gate will be recorded and displayed statically on the screen additionally to the live A-Scan. And the icon will in the wave window. To activate the ENVELOPE function

  1. Activate the FUNC submenu (located in the FUNC menu) by pressing the menu key below it.
  2. Select the function item titled ENVELOPE.
  3. To turn on/off the ENVELOPE function, continue pressing the key or turn the knob.

Also you can repeatedly press to turn on/off the ENVELOPE function.Note that PEAK HOLD and ENVELOPE cannot function simultaneously.
Peak Hold Feature

When PEAK HOLD is activated, the echo with the highest amplitude in the selected gate becomes the reference echo displayed statically on the screen additionally to the live A-Scan. And the icon will appear on the top-left of the display. You can use this function to record and document the peaked, maximum echo display.

To activate the Peak Hold Feature

  1. Activate the FUNC submenu (located in the FUNC menu) by pressing the menu key below it.
  2. Select the function item titled PEAK HOLD.
  3. To turn on/off the Peak Hold function, continue pressing the key or turn the knob.
  4. Also you can repeatedly press  to turn on/off the PEAK HOLD function.
  5. Note that PEAK HOLD and ENVELOPE cannot function simultaneously.

B-Scan Feature

In B-SCAN mode, the instrument displays a graphical cross-section of the workpiece. Use the following procedure to switch to B-SCAN mode.

  1. Select the BSCAN function (CFG→B-SCAN→BSCAN).
  2. Switch BSCAN to ON by means of turning the knob.

Weld Figure Feature

Weld Figure feature can be enabled when detecting the weld parts using angle transducer.Weld parameters should be set before using this feature. Refer to figure.

Data Storage

The instrument is equipped with a data-storage system. A-Scans patterns, instrument settings, and video can be stored in data files for later retrieval. File data can be saved, recalled and deleted by using the MEM menu.

Wave Files

Wave files are used to store A-Scan pattern, along with the instrument settings. Data in the wave files can be stored, recalled and erased.

Wave SAVE
You can save the A-Scan pattern to a wave file using the SAVE function.

  1. Select the function FILE.
  2. Use the knob to set the file name where you would want to store the current A-Scan pattern(F0000~F9999
  3. Select the function SAVE
  4. Use the knob or repeatedly press the corresponding function key to trigger the SAVE operation.


Note: The asterisk (*) before a selected file name indicates that this file is already occupied. It is not possible to overwrite an occupied file. Users should select another file name which is still empty, or clear the occupied file to save to. To avoid loss of data e.g. in case of a software update you should save the file to a PC.
Wave RECALL 

You can recall a stored wave file; your instrument will then display all the test-relevant technical features that existed at the moment of the setup. A frozen display of the stored A-Scan appears.

Wave CLEAR

An occupied file is marked with an asterisk (*) before the file name. You can clear the file if you no longer need them. Wave Files are cleared using the CLEAR function.

  1. Select the function FILE.
  2. Use the knob to set the file name to clear (F0000~F9999).
  3. Select the function CLEAR.
  4. Use the knob or repeatedly press the corresponding function key to trigger the CLEAR operation. It will then prompt: Clear wave file?
  5. Confirm by pressing the corresponding key one more time.

The file is now cleared; the asterisk preceding the file name is no longer there.
Maintenance and Care
Care of the Instrument
        Clean the instrument and its accessories using a moist cloth. Only use the following recommended instrument cleaners: water, a mild household cleaner or alcohol (no methyl alcohol).
Attention:
Do not use any methyl alcohol, solvents, or dye penetrated cleaners.The plastic parts can be damaged
Maintenance
The instrument requires basically no maintenance.
Safety

The design of the instrument meets safety standard. During the operation, it shall meet the specified external ambient condition, and the operator shall be furnished with concerned technology background, so as to guarantee safe operation.

Charging the Batteries

  1. The approximate level of remaining battery life is visually displayed by the battery indicator. When fresh batteries with full capacity are installed, the icon will appear as. As the battery life is consumed, the icon will begin to “empty”. When the battery indicator is almost empty as indicated by the symbol, charge Before the initial start-up
  2. After a storage time of 3 months or longer
  3. After frequent partial discharge the batteries as soon as possible. You may take a second battery pack or replacement battery pack with you if you cannot connect the instrument to mains.
  4. The instrument automatically shuts off when batteries are too weak for reliable operation. Settings are saved and restored when the instrument is turned on again.
  5. You can charge the lithium-ion battery pack either directly in the instrument or by means of an external battery charger provided with the instrument.

Internal Charging

If a battery pack is located in the instrument, the charging process is started automatically when you connect the plug-in power supply unit. You can carry out ultrasonic inspections and charge a battery at the same time.The charging time is about 10 hours with a simultaneous ultrasonic inspection. If the instrument is not being used for ultrasonic inspections, the charging time is about 8 hours. This charging time applies to ambient temperatures from 77 °F ~ 86 °F (25 °C to 30 °C). Please take into consideration that the batteries are not charged to their full capacity at higher temperatures.The POWER LED display at the top-right corner of the keypad indicates the status of the charging process. It will flash red/green during the charging process. And the flash will stop when the charging process stops.

External Charging
Lithium-ion batteries can be charged by means of an external battery charger.

  1. Take out the battery pack from the battery compartment of the instrument.
  2. Plug the charger’s power cord into a 100-240 V AC power source. Its Green indication lamp will illuminate when the charger is supplied with power.
  3. Push the adapter of the charger into the plug receptacle of the battery pack until it snaps into place. The green LED of the battery pack will light if the connection is properly aligned.
  4. When charging the battery pack, the battery pack’s RED indication lamp will light steadily.
  5. When charging is complete (typically after six to eight hours) the RED indication lamp will shut off. You may remove the charger adapter from the battery pack.
  6. Reinstall the battery pack to the compartment of the instrument.


Note:

  1. The battery pack should be charged over a period of time, even not used.
  2. The instrument can only work with the specially designed battery pack and power adapter (charger) supplied by us. Working with others may result in damage of the instrument, battery leakage, fire or even explosion.

 

Questions from our customers

There are no questions yet. Be the first to ask a question about this product.

Only registered users are eligible to enter questions