GAOTek Flaw Detector with 3 Switch Gauge (Gate and DAC Alarm)

This Flaw Detector with 3 Switch Gauge (Gate and DAC Alarm) Depth d, level p and distance s which supports acoustic optical alarm and is designed to inspect, locate, evaluate and diagnose various defects.

GT00XY00Z4

Description

Overview

The GAOTek Flaw Detector with 3 Switch Gauge (Gate and DAC Alarm) Depth d, level p and distance s which supports acoustic optical alarm and is designed to inspect, locate, evaluate and diagnose various defects. This Flaw detector detects defects in crack, inclusion, pinholes etc. in a workplace without destruction. This flaw detector provides large memory and communicates with PC using USB port. It can be broadly used in the active safety inspection and service-life evaluation in such fields as aerospace, railway transportation and boiler pressure vessels, etc.

Key Features

  • Automated calibration of transducer Zero Offset and/or Velocity
  • Automated gain, Peak Hold and Peak Memory
  • Automated display precise flaw location (Depth d, level p, distance s, amplitude, sz dB, ф)
  • Automated three switch gauge (Depth d, level p, distance s)
  • 100 independence setup, any criterion can be input freely, we can work in the scene without test block
  • Big memory of 300 A graph
  • Gate and DAC alarm: Acoustic-Optical alarm
  • Easy to communicate to PC using USB port
  • The embedded software can be online updated
  • Li battery, continue working time up to 10 hours
  • Display freeze
  • Automated echo degree
  • Angles and K-value
  • Lock and unlock function of system parameters
  • Dormancy and screen savers
  • Electronic clock calendar
  • Two gates setting and alarm indication
  • High-speed capture and very low noise
  • DAC, AVG, B Scan ; Solid metal housing (IP65)
  • Automated calculate the size of the flaw with wide bottom type in AVG function.
  • AWS D1.1
  • 6 dB DAC functions
  • Automated video of test process and play
  • Provides high contrast viewing of the waveform from bright, direct sunlight to complete darkness and easy to read from all angles
  • Powerful pc software and reports can be export to excel

Technical Specifications

Range of Scanning 0 in ~ 236.2 in (0 mm ~ 6000 mm)
D-delay -20 µs ~   +3400 µs
P-delay 0.0 µs ~ 99.99 µs

Adjusting steps: 0.01

MTLVEL 1000 m/s ~ 15000m/s

10 fixed levels:

2260,2730,3080,3230,4700,5920,6300, 12000,13000,14000,15000

Adjusting steps: 1

Working Mode Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe)
Frequency Range 0.5 MHz ~ 15 MHz
Gain Adjustment 0 dB ~ 100 dB

Adjusting step: 0.0,0.1,0.5,1,2,6,12

Reject 0 % ~ 80 % of screen height, step: 1 %
Vertical Linear Error Vertical linear error is not more than 3 %
Horizontal Linear Error Not more than 0.2 % in the scanning range
Sensitivity Leavings ≥62 dB
Dynamic Range ≥34 dB
Alarm Three modes (forbidden wave, loss wave and auto)
A-Scan Display Area Full screen or local

A-Scan display freezing and de-freezing A-Scan filling

Data Save 300 A-Scan images (including setting of instrument)
Interface RS232/USB
Measuring unit mm/inch
Battery Li battery 7.4 V 4800 mAh
Power Adaptor Input 100 V ~ 240 V/50 Hz ~ 60 Hz

Output 9 VDC/1.5 A

Working Humidity 20 % ~ 90 %
Port Type BNC
Dimension 9.44 in × 5.90 in × 1.96 in  (240 mm × 150 mm × 50 mm)
Weight 3.52 lbs (1.6 kg)
Working Temperature 14 °F ~ 122 °F (-10 °C ~ 50 °C)

Additional Information

Standard configurations

Designation Quantity
Main unit 1
1.5 A/9 V power adaptor 1
probe connecting cable 2
Carrying case 1
Instruction manual 1
Straight probe 3/4” 2.5 MHz (One)
Angle probe 8×9 60°4 MHz (One)

List of options

Designation Quantity
Serial cable 1 (9 pin)
Communication software for PC 1 set

1 Overview of the Instrument

1.1 Designation of the Instruments Components

Fig. Outside Drawing of the Instrument

1.2 Functional Keyboard

Keys are included in three groups: Function group, usual key group and special function group. There are 6 keys in Functional group, in which F1, F2, F3, F4, F5 are corresponding with the 5 functional groups on screen, and the key <> is used for switching of pages; Usual key group comprises 9 key: Up, down, dB+, dB-,+,-, gain step key    , freeze key , Enter key. they are used for usual operating; and special function group consists of 9keys:  on/off key, full  screen key  ,  detection  zone  , gate A, gate B, Auto  gain     , extend key peak memory and measure display  .Overall arrangement of the whole face is as following picture:

Fig. Functional Keyboard

When the ultrasonic wave propagates in a job, one can detect the defect in it by the influence on the propagation of ultrasonic wave based on the acoustic characteristic demonstrated by the defect in the material. Based on this principle, by using ultrasonic wave one can measure such defects as crack, pinhole and inclusion in such media as metal, non-metal and composite, etc.

Fig. Basic working principle for ultrasonic detection

1.3 Using of Power Supply

It can work with plug-in power supply (AC, DC adaptor) or battery.

The detector will switch the power supply to adapter automatically when the power supply adapter is used.

The detector will switch the power supply to battery automatically when the power supply adapter is turned off. The batteries will be charged automatically, which is equipped with battery, is power supplied with adapter.

1.4 Working with Battery

Indicator for charging

At lower right corner of horizontal scale, there are symbols for battery voltage:

Fig. Battery status display

If it shows the symbol for low voltage, you must stop detection immediately and use adapter or charge it.

1.5 Connecting the Probe

Proper probe shall be connected when using to inspect. So long that you have a proper cable, and the working frequency is within proper range, any probe made by our company is suitable for IT. The probe connector for is BNC.

The probe shall be connected to the socket at top of the instrument casing. Both connector sockets have different function, sending socket at left (with red mark) and receiving socket at right (with blue mark) .With Single-Probe mode, the sending socket can be used only. When connecting a double-wafer (TR) probe (one wafer for sending, another for receiving) or two probes (one for sending, another for receiving), take care that the sending probe shall be connected to the sending socket and receiving probe to the receiving socket .Otherwise, it may result in loss or disorder echo waveform.

  1. Operation

2.1 Basic steps

  • Get ready the job;
  • Insert the probe plug into the probe socket of the host, rotate tightly the locking nut;
  • press , turn on the instrument;
  • It will carry out self test;
  • In normal case, when you turn on the unit, it will automatically enter into the status that it is in during last turning off. The instrument parameters are consistent with last turning off, but the waveform during last turning off will not display.
  • Check voltage of the battery; if the power monitor shows that the voltage is low, it will turn off automatically 1 min after alarming bell.
  • According to your application, ten independence setups can be applied, any criterion can be input freely, and we can work in the scene without test block. Whether it needs to calibrate the instrument, if yes, ask a professional technician to calibrate it;
  • Measure;
  • Save the results, big memory of 300 A graph.
  • Turn off the instrument;

2.2 Starting the Instrument

Press , turn on the instrument. It will carry out self test. After five seconds, the instrument comes into operation mode。

2.3 Description about Screen Display

Fig. Description about screen

2.3.1 Three Display Modes of Screen

A-scan at normal mode

Fig. A-scan at normal mode

A-scan at Enlarged mode

You can activate Enlarge mode by . The gain and selected dB step value will be always displayed on the screen. And at the same time, all other functions are locked.

Fig.  A-scan at Enlarged mode

Manual B-scanning

 

Fig. B-scan mode

2.3.2 Function Displaying Items

The 15 functional groups are displayed at lower part of the screen in three pages. The current functional group will be highlighted, as that shown in fig. and at the same time, the current function in the current functional group will also be highlighted, as that shown in fig. Under Enlarged mode, the display of functional groups disappears.

2.3.3 Description about Symbols Displayed on Screen

In the fig left, echo amplitude H=84 %, depth to the reflector=0.06 in (1.57mm), surface distance=0.98 in (25.14mm), echo times is 2, start of range=0.0mm, end of range=1.57 in (40.0mm)

In the fig left, echo amplitude (pixels) H=148, Angular distance=1.08 in (27.68 mm).

Fig. Description about the display field in screen

2.3.4 Display of echo times

When the angle of probe is not zero and the measured echo is multi-echo, the echo times will be drew on the status column as the following.

/                       One time echo

/                   two times echo

//                  three times echo

//                four times echo

//-             five and more times echo

2.3.5          Description about other symbol

There some other symbols above functional menu ,Freeze and Communication symbols are besides the battery status symbol.

 * Freeze Freeze state
 ! Communication The instruments are communicating with PC.
  Angular distance distance from the incidence point to the reflector point
  Depth to reflector depth from the incidence point to the reflector point.
  Surface distance surface distance from the incidence point to the reflector point.
  Echo amplitude The amplitude value of max echo within the gate.
  Edge sampling It shows that the instrument is in “Edge sampling” mode, depth and angular distance is the measure value of the first echo which is above the gate and within the gate.
  Peak sampling It shows that the instrument is in “Peak sampling” mode, depth and angular distance is the measure value of the echo with the max amplitude within the gate.
 P Memory peaks peaks memory function is enabled.
 T Making video Dynamic Record function is enabled.
 E Operation error Operation error last time.
  Radian revise Abscissa and measure result is revised according to radian.

2.4 Overview of All Functions

The functions are included in 15 functional groups and several special functions.

The functional groups include BASE, PROBE, SET, MEM, GATE, CFG, DAC1, DAC2, AVG1, AVG1,AWS, SCR, GAIN, CFG, B/V and ADV they will be introduced in the following table.

No. Group Functions Description
1 SET SETTING NO.,SET COPY、SAVE/ SET MODIFY、DELETE/CLEAR ALL Relative items for independence setups
1 MEM DATA NO, RECALL, SAVE, DELETE Setting of data Memory
1 GATE GATE LOGIC/ALARM, aSTART/bSTART, aWIDTH/bWIDTH, aTHRESH/bTHRESH Relative items for gate configuration
2 CFG DETECT/ REJECT, GRID/BRIGHTNESS, UNIT / LANGUAGE, DATE/TIME Setting of relative state
2 DAC1 DAC/REVISE, RECORD/REVISE POS, aSTART/aWIDTH, SHOW MARK/DAC MODE Plotting DAC curve
2 DAC2 DAC-EL/ERS-REF, DAC-SL, DAC-RL, T-KORR/JDAC Setting relative with DAC curve
2 AVG1 AVG MODE/CHOCK VEL、PROBE NAME、FREQUENCY/DIAMETER、REF TYPE/REF SIZE
2 AVG2 A START/AVG CURVE、RECORD REF、TEST ATTN/CORRECT
3 AWS INDICA/ A START, REFRANCE, ATTEN, RATING
3 SCR SCR TYPE/PREVIEW, DIRECTION/SCR DELAY, SCR TEXT, ABOUT/COLOR SET
3 Gain REF GAIN, ADD REF, SCAN DB, AUTO GAIN Relative items for gain
3 B / V B-SCAN /A-SCAN, SCAN WAY/SCAN MODE, REVIEW/VIDEO, VIDEO NO
3 ADV SETTING/SAVE, RECALL, VALUEDIS/RS232 SET, DATE/TIME Advanced function

Other special functions can be realized by Special Function (SF) keys. The functions of each SF keys are introduced in the following table.

Special Functions Description of function
Gain Step To adjust the gain step
dB+、dB- To adjust the gain
Full-screen To switch over in full screen
Freeze To freeze waveform
Dynamic record On/off Dynamic record(video)
Memory Peaks Capture the max value of echo on the screen
Measure display Select the display mode of measure result on the screen
Enter Switch of multi-menu, parameters, confirmation of functions
Page Up Switch function page

 2.5 Basic Operation Way

You can select a functional group by <Fn> key; select certain function by <Menu> key and ; at this time, you can modify parameters of this current menu by Coder And for some functional menus, they are shared by two functions, when you have selected such a function, by pressing  or the corresponding <Menu> key, it can be shifted to another function.

2.5.1 Selection of Functions

There are 5 functional groups displayed below the A-scan zone, which can be selected by the corresponding <Fn> key, and the selected one will be highlighted. The four corresponding function items will be displayed closely next to the right of A-scan zone, which can be selected by press “↑” or “↓” key.

2.5.2 Multipurpose Function Items

In some cases, a functional item has two functions. Thus they can be shifted by pressing down the press “↑” or“↓” key again or striking  key. The symbol “>” displayed behind the function name means that it is a multipurpose function item.

Function I Function II Functional group
GATE LOGIC ALARM GATE
aSTART bSTART GATE
aWIDTH bWIDTH GATE
aTHRESH bTHRESH GATE
ANGLE K-VALUE ANG
X-VALUE X-COORD ANG
PROBE POS PART DIA ANG
RECORD REVISE POS DAC1
aSTART aWIDTH DAC1
SHOW MARK DAC MODE DAC1
DAC-RL ERS-REF DAC2
AVG MODE CHOCK VEL AVG1
FREQUENCY DIAMETER AVG1
REF TYPE REF SIZE AVG1
A START AVG Curve AVG2
CORRECT TEST ATTN AVG2
B-scan A-scan B/V
SCAN WAY SCAN MODE B/V
RE-FRAME RE-SPEED B/V
DIRECTION SCR DELAY SCR
SCR TYPE PREVIEW SCR
ABOUT COLOR SET SCR
DATA NO(for Wave) DATA NO MEM
Detect RS232 SET CFG
COORDINATE BRIGHTNESS CFG
FILL BUZZER CFG
LANGUAGE UNIT CFG
DATE TIME ADV
aSTART aWIDTH ADV

2.5.3 Rough and Fine Adjustment of Functions

For some functions, rough and fine adjustment is available. By pressing down the corresponding    key, you can shift between these two adjusting modes. With a symbol “*” in front of the function item that means it is in fine adjustment mode.

The following are the functional items with optional rough and fine adjustment

Functions Functional group
RANGE BASE
MTLVEL BASE/ANG
D-DELAY BASE
T-VALUE ANG

2.5.4 Example of Function Operation:

Suppose that the function of RANGE in BASE functional group is selected currently, and you want to select ALARM under GATE, what to do?

Firstly Select the P/R group by the key <F3>, and then select GATE LOGIC/ALARM functional menu by “↑”or “↓” key. This functional menu is multipurpose gate logic and alarm way, so user has to shift the two functions as he needs. If it displays ALARM way, the operation completes; if it displays GATE LOGIC, shift it to GATE LOGIC way by key , and now the operation of function selection is completed.

  1. Description of functions and operation way

3.1 Adjustment of BASE Group

In the BASE functional group, users can adjust and set the functional items relative with the display range, including RANGE, MTLVEL, D-DELAY and T-VALUE.

During the detection, the display range of screen is in great relation to the material of workpiece and probe’s nature. The workpiece material will influence the transmission velocity of ultrasonic wave.

3.1.1Detection Range (RANGE)

It is to set the measuring range for screen display during detection Range: 0 in~39.37 in (0 mm~1000 mm)

If what selected currently is RANGE functional menu, then by pressing , it is allowed to shift between Rough and Fine adjustment.

Rough adjustment: 20.09 in (2.5 mm), 0.19 in (5 mm), 0.39 in (10 mm), 0.78 in (20 mm), 1.18 in (30 mm), 1.57 in (40 mm), 1.96 in (50 mm), 2.36 in (60 mm), 2.75 in (70 mm), 3.14 in (80 mm), 3.54 in (90 mm), 3.93 in (100 mm), 5.90 in (150 mm), 7.87 in (200 mm), 9.84 in (250 mm), 11.81 in (300 mm), 13.77 in (350 mm), 15.74 in (400 mm), 17.71 in (450 mm), 19.68 in (500 mm), 23.62 in (600 mm), 27.55 in (700 mm), 31.49 in (800 mm), 35.43 in (900 mm), 39.37 in (1000 mm), 78.74 in (2000 mm), 118.11 in (3000 mm), 157.48 in (4000 mm), 196.85 in (5000 mm), 236.22 in (6000 mm), 275.99 in (7000 mm), 314.96 in (8000 mm),354.33 in (9000 mm), 393.70 (10000 mm)

Fine Adjustment

Range Step graduation
≤ 3.93 in (100 mm) 0.0039 in (0.1 mm)
> 3.93 in (100mm) 0.039 in (1 mm)
  • By <Page up> key, switch the function page.
  • Select BASE functional group by <F1> key and by “↑” or “↓” key, select the functional menu for RANGE, and then adjust parameters for RANGE by “←” or “→” key.
  • Users can shift the Rough and Fine adjusting mode by key .

3.1.2 Material velocity (MTLVEL)

Users are allowed to set the transmission velocity of ultrasonic wave in workpiece.

Range: 1,000 m/s~15000 m/s    or        0.0394 in/µs~0.3937 in/µs

If what selected currently is MTLVEL function menu, then by the key , it is allowed to shift between Rough and Fine adjustment.

Rough adjustment:

2,260 m/s 0.089 in /µs Sound velocity of transverse wave in copper
2,730 m/s 0.107 in /µs Sound velocity of longitudinal wave in organic glass
3,080 m/s 0.121 in /µs Sound velocity of transverse wave in aluminium
3,230 m/s 0.127 in /µs Sound velocity of transverse wave in steel
4,700 m/s 0.185 in /µs Sound velocity of longitudinal wave in copper
5,900 m/s 0.233 in /µs Sound velocity of longitudinal wave in steel
6,300 m/s 0.248 in /µs Sound velocity of longitudinal wave in aluminium

Fine Adjustment: Step is 1 m/s or 0.0001 in/µs

Operation

By <Page up> key, switch the function page.

  • Select BASE functional group By <F1> key and by “↑” or “↓” key, select the functional menu for MTLVEL, and then adjust parameters for MTLVEL by “←” or “→” key.
  • Users can shift the Rough and Fine adjusting mode by Enter key .

3.1.3 Display starting point (D-DELAY)

Can set the pulse shift during detection, viz. D delay. By which, users are allowed to adjust the starting position for waveform, as well as adjusting the zero point of pulse, so as to make sure that it is at the surface or a starting face inside the workpiece. If the pulse has to be started from the surface of workpiece, D delay must be set to 0.

Range: -20 µs~3400 µs
Step: 0.1 µs

Operation:

  • By <Page up> key, switch the function page.
  • Select BASE functional group by <F1> key and by “↑” or “↓” key, select the functional menu for D-DELAY, and then adjust parameters for D-DELAY by “←” or “→” key.
  • Users can shift the Rough and Fine adjusting mode by key .

3.1.4 Thickness of workpiece (T-VALUE)

It is to set the thickness of workpiece during detection.

Thickness range: 0.19 in ~ 39.37 in (5 mm~1000 mm)

Rough and Fine adjustment can be switched by the key .

Rough adjustment: 0.09 in (2.5 mm), 0.19 in (5 mm), 0.39 in (10 mm), 0.78 in (20 mm), 1.18 in (30 mm), 1.57 in (40 mm), 1.96 in (50 mm), 2.36 in (60 mm), 2.75 in (70 mm), 3.14 in (80 mm), 3.54 in (90 mm), 3.93 in (100 mm), 5.90 in (150 mm), 7.87 in (200 mm), 9.84 in (250 mm), 11.81 in (300 mm), 13.77 in (350 mm), 15.74 in (400 mm), 17.71 in (450 mm), 19.68 in (500 mm), 23.62 in (600 mm), 27.55 in (700 mm), 31.49 in (800 mm), 35.43 in (900 mm), 39.37 in (1000 mm)

Fine Adjustment

0.0039 in (0.1mm) <3.93 in (100 mm)
  0.039 in (1mm) >3.93in (100 mm)

Operation

  • By <Page up> key switch the function page.
  • By <F1> key select ANG functional group, and by “↑” or “↓” key, select the functional menu for T-VALUE, and then adjust the job’s thickness by “←” or “→” key.

Users can shift the Rough and Fine adjusting mode by Enter key .

3.2 Adjustment of PROBE Group

With this functional group, it is allowed to adjust and set the functional items in relation to ultrasonic sending and receiving, including PROBE TYPE/ PROBE POS, ANGLE/K-VALUE, P-DELAY/ X-VALUE, X-COORD/ PART DIA

3.2.1 PROBE TYPE/ PROBE POS

This menu is multipurpose for setting probe type and probe pos. By key , user can shift between probe type and probe pos.

PROBE TYPE:

Setting of ultrasonic probe. If the current probe is an echo probe, then set it to single; if it is a double-wafer probe, set it to DUAL, and if it is a through transmission probe, set it to THRU.

Options: SINGLE:    Single element transducers. Use the red transducer connector.

DUAL:    One connector acts as a transmitter, the other acts as a receiver. The red transducer connector is designated as the transmitter. The blue transducer connector is designated as the receiver.

THRU:   Two separate transducers, typically on opposite sides of the test specimen. Use the red transducer connector as the transmitter. The blue transducer connector is designated as the receiver.

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F2> key select PROBE functional group, and by “↑” or “↓” key, select the functional menu for PROBE TYPE, and then adjust parameters for PROBE TYPE by “←” or “→” key.

PROBE POS

Select position of probe when we detect a pipe。

Options: Outside surface: Probe is placed on the outside surface of pipe. Now the corrected d value show the depth of the flaw from the outside surface of pipe, L value show the distance between flaw and probe front edge follow outside surface.

Inside surface :Probe is placed on the inside surface of pipe. Now the corrected d value show the depth of the flaw from the inside surface of pipe, L value show the distance between flaw and probe front edge follow inside surface.

Operation:

  • By <Page up> key switch the function page.
  • By <F5> key select PROBE functional group, and by “↑” or “↓” key, select the functional menu for PROBE POS, and then select probe positioning by “←” or “→” key.

3.2.2 Probe Angle (ANGLE)/Probe K Value (K-VALUE)

  • This menu is multipurpose for setting probe angle and probe k value. By key , shift between ANGLE and K-VALUE.

ANGLE:

It is to adjust the angle of a probe.

Range Step
0.0 ~89.0 0.1

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select PROBE functional group, and by “↑” or “↓” key, select the functional menu for ANGLE, and then adjust the probe angle by “←” or “→” key.

K-VALUE:

Range Step
0.00~57.29 0.01

 Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select PROBE functional group, and by “↑” or “↓” key, select the functional menu for K-VALUE, and then adjust the probe k value by “←” or “→” key.

3.2.3 P-DELAY/ X-VALUE

  • This menu is multipurpose for setting p-delay and x-value. By key , shift between P-DELAY and X-VALUE.

P-DELAY:

Can set the zero point of probe during detection, viz. P Delay. It is necessary to compensate the delay in probe resulted from acoustic beam in the pitch interval from energy exchanger to workpiece by P Delay.

Range 0 µs~99.99 µs
Step graduation 0.01 µs

Operation:

  • By <Page up> key, switch the function page.
  • Select PROBE functional group By <F1> key and by “↑” or “↓” key, select the functional menu for P-DELAY, and then adjust parameters for P-DELAY by “←” or “→” key.

X-VALUE:

It is to set the front edge of probe.

Range 0.00 in ~ 1.9685 in (0.00 mm~50.0 mm)
Step 0.0039 in (0.1 mm)

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key, select PROBE functional group, and by “↑” or “↓” key, select the functional menu for X-VALUE, and then adjust the probe front edge by key Coder.

3.2.4 X-COORD/ PART DIA

This menu is multipurpose for setting X-COORD and PART DIA. By key , shift between X-COORD/ PART DIA.

X-COORD

Coordinate mode means the definition of the horizontal coordinate line, including “S-PATH” “P-VAL” and “DEPTH”, when the refraction angle is not zero, the function above is effective, when it is zero, and the coordinate is defined as S-PATH.

Options: S-PATH, P-VAL, DEPTH

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select PROBE functional group, and by “↑” or “↓” key, select the functional menu for X-COORD, and then adjust the coordinate mode by “←” or “→” key.

PART DIA

When we detect a pipe, we must input the outside diameter of part and thickness exactly. Part diameter is the outside diameter of pipe.

Range 0.196 in ~ 196.8 in (5.0 mm ~ 5000 mm)
Step <3.93 in (100 mm)       0.0039 in (0.1 mm)

>3.93 in (100 mm)      0.039 (1.0 mm)

Operation:

  • By <Page up> key switch the function page.
  • By <F5> key select PROBE functional group, and by “↑” or “↓” key, select the functional menu for PART DIA, and then adjust diameter value by “←” or “→” key

3.3 Adjustment of setting

Setting Group is used for Operations of detection setting. It includes SETTING, RECALL/REFACTORY,   SAVE, DELETE/CLEAR ALL

3.3.1 Detection Setting (SETTING)

SETTING:

During the detecting in scene, users usually need to do the detection on several kinds of work piece or change the probe, thus they need to calibrate the instrument time after time. To solve this problem, 100 detecting settings are available; users can set 100 different settings and save them, switch among the settings when it needed.

Parameter range: NO.1~NO.100

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select SET functional group, and by “↑” or “↓” key, select the functional menu for SETTING, and then adjust parameters for SETTING by “←” or “→” key.

3.3.2 Recall of settings (RECALL)/REFACTORY

  • This menu is multipurpose for gate logic and gate alarm. Users can shift the functions for RECALL and REFACTORY by Enter key .

RECALL:

Recalling the setting in detection setting, when it is completed successfully, the current detection parameter setting will be replaced by the recalled one.

Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select SET functional group, and by “↑” or “↓” key, select the functional menu for RECALL, and then carry out calling by “←” or “→” key.
  • If current setting has no setting, by left an right key, this functional menu will always display OFF; if it has any setting, by key Coder, it will show “Yes/No”, if you press key  then you will call out setting, and by pressing any other key, you will cancel the calling.

REFACTORY:

Users can recover the ex-factory parameter setting when turning on the machine if necessary.

3.3.3 Saving settings (SAVE)

SAVE

This functional menu is for saving setting.

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select SET functional group, and by “↑” or “↓” key, select the functional menu for SAVE, and then adjust parameters for SAVE by “←” or “→” key.

3.3.4 Delete settings (DELETE)/CLEAR ALL

This functional menu is for delete setting.

DELETE:

Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select SET functional group, and by “↑” or “↓” key, select the functional menu for DELETE, and then carry out calling by “←” or “→” key.
  • If current setting has no setting, by left and right key, this functional menu will always display OFF; if it has any setting, by key by “←” or “→” key, it will show “Yes/No”, if you press key then you will delete setting.

CLEAR ALL:

  • By <Page up> key switch the function page.
  • By <F3> key select SET functional group, and by “↑” or “↓” key, select the functional menu for CLEARALL and then carry out calling by “←” or “→” key.
  • If all setting has no setting, by left and right key, this functional menu will always display OFF; if it has any setting, by key by “←” or “→” key, it will show “Yes/No”, if you press key  then you will clear all settings, and by pressing any other key, you will cancel the clear.

3.4 Adjustment of MEM Group

This is for adjusting the memorizing modes, calling out, deleting and saving the configured data and detection parameters. It includes such functional menus as DATA NO, RECALL, SAVE and DELETE.

This instrument can store memory 300 sets of data and detection parameters as well as DAC curves from A-scan.

3.4.1Function group MEM (DATA NO.)

It is for setting the MEM group No. after selecting the functional menu for Group No.

Parameter range: For waveform save, 1~300

MEM mode:    waveform

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select MEM functional group, and by “↑” or “↓” key, select the functional menu for DATA NO and then set group no. by Press “←” or “→” key .

3.4.2Recalling a stored data set (RECALL)

It is to recall data under Waveform Save mode, and call out the data corresponding to current group number. When the recalling succeeds, the current waveform and detection parameters will be substituted by the saved waveform and detection parameters, and the waveform is frozen.

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select MEM functional group, and by “↑” or “↓” key, select the functional menu for RECALL and then carry out calling by key Coder.
  • If current group number has no data in it, by key Coder, this functional menu will always display OFF; if there is data existing in the group, by key Coder, it will show “Yes/No”, and now press the corresponding menu key or , the data will be recalled, and press any other key to cancel recalling.

3.4.3Storing a data set (SAVE)

This functional menu is for saving data. It is to save the current waveform data into the current group no. depending on the displayed save mode. Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select MEM functional group, and by “↑” or “↓” key, select the functional menu for SAVE, and then carry out saving by key Coder.

3.4.4Deleting a data set (DELETE)

It is to delete data. This is to delete the data corresponding to current group number. When the deletion succeeds, “*” before this group no. disappears.

Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select MEM functional group, and by “↑” or “↓” key, select the functional menu for DELETE and then carry out deleting by key Coder.
  • If current group has no data in it, by key Coder, this functional menu will always display OFF; if there is data in the group and it is not locked, by key Coder, it will show “Yes/No”, and now press the corresponding menu key or , the data will be deleted, and the deleting will be cancelled by press any other key.

3.5 Adjustment of GATE Group

It is used for adjustment of gate settings, including Gate logic, Gate alarm, Gate start, Gate width and Gate height. Functions of gate during detection:

  • To monitor whether the job has flaws in the set logic and range, if yes, it will alarm.
  • To measure the position and size of flaw echo.

It is equipped with double-gate function: Gate A and Gate B, normally Gate A is used alone for detecting the workpiece flaw, and the double-gate is usually used in the measuring and calibration of multi-echo. Ex. Measuring the distance between surface echo and first echo during thickness measurement.

3.5.1 GATE LOGIC/ ALARM

This menu is multipurpose for gate logic and gate alarm. Users can shift the functions for GATE LOGIC and ALARM by Enter key .

GATE LOGIC:

Gate logic has four options: NONE, POS, NEG, and MUL.

Options:  NONE:   gate monitoring is off

POS:       when the echo amplitude is higher than the preset threshold of the gate, it will alarm

NEG:          when the echo amplitude is lower than the preset threshold of the gate, it will alarm

MUL:    state of double gates

Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for GATE LOGIC and then adjust the gate logic by “←” or “→” key.

ALARM:

Setting of gate alarm.

It can be used for alarm of forbidden wave and loss wave depending on the setting of Gate Logic. That is, if the gate is at positive logic, when the echo amplitude is higher than the threshold, the buzzer alarms; if the gate is at negative logic, when the echo amplitude is lower than the threshold, the buzzer alarms. When the DAC is opened, the DAC-REF is instead of gate to determine alarms.

Options:           ON:      the buzzer is on

OFF:    the buzzer is off

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for ALARM and then turn on/off the buzzer by “←” or “→” key.

3.5.2 Starting point of the gates (aSTART/bSTART)

  • This functional menu is multipurpose for Start of Gate A and Gate B. Users can shift the functions for aSTART and bSTART by key.

aSTART:

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for aSTART and then adjust the starting position of Gate A by “←” or “→” key.

bSTART:

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for bSTART and then adjust the starting position of Gate B by “←” or “→” key.

3.5.3          Width of the gates (aWIDTH/bWIDTH)

This functional menu is multipurpose for Width of Gate A and Gate B, when this menu is selected, by  you can shift the two functions.

aWIDTH:

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for aWIDTH and then adjust the width of Gate A by“←” or “→” key.

bWIDTH:

Operation procedure:

By <Page up> key switch the function page.

By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for bWIDTH and then adjust the width of Gate B by “←” or “→” key.

3.5.4 Response and measurement threshold (aTHRESH/bTHRESH)

This functional menu is multipurpose for Threshold of Gate A and Gate B, when this menu is selected, by you can shift the two functions.

aTHRESH:

It is to set the threshold of Gate A. The parameter is expressed in percentage, i.e. the percentage in relative to the full amplitude.

Parameter range: 2 %~90 %

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select GATE functional group, and by “↑” or “↓” key, select the functional menu for aTHRESH and then adjust the threshold of Gate A by “←” or “→” key.

bTHRESH:

It is to set the threshold of Gate B. The parameter is expressed in percentage, i.e. the percentage in relative to the full amplitude.

Parameter range:         2 %~90 %

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key you select GATE functional group, and by “↑” or “↓” key, you select the functional menu for bTHRESH, and then adjust the threshold of Gate B by“←” or “→” key.

3.6 Adjustment of CFG Group

Settings of DETECT/ REJECT, GRID/BRIGHTNESS, LANGUAGE / UNIT, DATE/TIME are completed in this group.

3.6.1 Measuring way (DETECT)/Reject (REJECT)

This functional menu is multipurpose for Measuring way and Reject (REJECT).

DETECT:

To select measuring way.

Option: PEAK, FLANK

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select CFG functional group, and by “↑” or “↓” key, select the functional menu for DETECT, and then set the measuring way by key Coder.
  • Select CFG functional group, and by “↑” or “↓” key  , select the functional menu for DETECT and then set the measuring way by key .
  • Users can shift the functions for DETECT and REJECT by Enter key .

REJECT:

This menu is used to reject the echo’s display amplitude, for example, to remove the structural noise in the job. It is to reject the display of echo whose amplitude is lower than the setting value by setting a percentage (i.e. percentage at full amplitude).

The suppressing percentage (i.e. percentage at full amplitude) indicates the min. echo height to be displayed.

Any echo amplitude lower than this height will be neglected and recorded as zero amplitude.

Parameter range:         0 % ~ 80 %

Step graduation:          1 %

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F1> key select CFG functional group, and by “↑” or “↓” key, select the functional menu for REJECT, and then adjust suppression percentage by “←” or “→” key.

3.6.2 GRID/ BRIGHTNESS

This menu is multipurpose for Scale and Brightness.

GRID:

It is to set the displaying way of coordinate grid.

Options:  0~3

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select CFG functional group, and by “↑” or “↓” key, select the functional menu for GRID, and then set the displaying way of coordinate grid by key Coder.
  • User can shift the functions for BRIGHTNESS and GRID by Enter key .

 BRIGHTNESS:

It is to set the brightness of the screen.

Options:  High, Mid, Low

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F1> key, select CFG functional group, and by “↑” or “↓” key, select the functional menu for BRIGHTNESS, and then adjust brightness by “←” or “→” key. User can shift the functions for BRIGHNESS and GRID by Enter key .

3.6.3 Sound of the Buzzer (BUZZER)/selecting the units (UNIT)

This menu is multipurpose for setting buzzer and unit.

BUZZER:

It is used to turn ON/OFF the buzzer.

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select CFG functional group, and by “↑” or “↓” key, select the functional menu for BUZZER, and then set ON/OFF the buzzer by “←” or “→” key.

Users can shift the functions for FILL and BUZZER by Enter key .

UNIT:

It is to select the unit for detection parameters of the instrument.

Options: mm, inch

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select CFG functional group, and by “↑” or “↓” key, select the functional menu for UNIT and then set parameter unit by “←” or “→” key.
  • Users can shift the function for LANGUAGE and UNIT by Enter key .

3.7 Adjustment of DAC1 Group

The DAC1 group is for setting the parameters necessary for plotting a DAC curve. It includes DAC/REVISE, RECORD/REVISE POS, aSTART/aWIDTH, SHOW MARK, DAC MODE

3.7.1 DAC display control (DAC)/DAC Revise (REVISE)

This menu is multipurpose for DAC display control and DAC Revise. Users can shift the functions for DAC and REVISE by Enter key .

DAC:

It is to turn on/off the DAC display. It will be ineffective when B-scan is on.

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select DAC1 functional group, and by up and down key, select the functional menu for DAC, and then set ON/OFF for DAC Curve by left or right key.

REVISE:

Re-plot the revision point. If the curve is not well drawn due to some plotting point with big plotting error, users can select the corresponding plotting point and adjust the gate to corresponding position, re-plot that point by the function of re-plotting.

Option: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key you select DAC1 functional group, and by “↑” or “↓” key, you select the functional menu for REVISE, and then revise plotting by “←” or “→” key.

3.7.2 DAC Plotting Point (RECORD) /DAC Revise Position (REVISEPOS)

This menu is multipurpose for DAC plotting point and DAC revise position.

DAC plot is used for recording the echo information necessary for making DAC curve, and DAC revise position is used for positioning the plotting point who needs revising.

RECORD:

Range:    1~30

Operation:

  • Confirm that the gate is working under the state of single gate.
  • By <Page up> key switch the function page.
  • By <F2> key, select DAC1 functional group, and by “↑” or “↓” key, select the functional menu for RECORD.
  • Before each plotting, move gate A to the needed reference echo, and make sure that the reference echo is located within the gate, then add or delete a plotting point by left or right key.
  • Users can shift the functions for RECORD and REVISE POS by Enter key .

REVISE POS:

Parameter range: 1~30, not more than DAC plotting point value Operation:

  • By <Page up> key switch the function page.
  • By <F2> key, select DAC1 functional group, and by “↑” or “↓” key, select the functional menu for REVISE POS and then position the revision point by “←” or “→” key

Users can shift the functions for RECORD and REVISE POS by Enter key

3.7.3 Starting of the A gate (a START) / Width of the A gate (aWIDTH)

This menu is multipurpose for Start of Gate A and Width of the gate A, the reason for setting Gate A here again is to make it easy for DAC recording under manual mode; by , shift the two functions.

3.7.4 Show Marks/DAC curve mode

This menu is multipurpose for show marks and DAC curve mode by, shift the two functions.

Show Marks:

We can show DAC marks as X symbol through the function. When one of marks is being revised, it will be show as small pane.

Option: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key you select DAC1 functional group, and by “↑” or “↓” key, you select the functional menu for Show marks, and then open it by “←” or “→” key.

Curve mode:

The connection mode between DAC marks.

Option: beeline, curve

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key you select DAC1 functional group, and by “↑” or “↓” key, you select the functional menu for CURVE MODE and then select mode by “←” or “→” key.

3.8 Adjustment of DAC2 Group

DAC Group is used for adjusting the relative parameters necessary for plotting a DAC curve. It includes DAC-EL/ERS-REF, DAC-SL, DAC-RL, CORRECT.

In order to meet the standard for plotting DAC curve in different industries, the instrument is equipped with three DAC curves with adjustable offsets, which are DAC-EL (evaluating line), DAC-SL (quantifying line), and DAC-RL (reject-judging line). In addition, in order that DAC curve can be adaptive to different ambient conditions, Gain Compensation function is provided. The three offset curve are all generated from generatrix, and the generatrix is drawn according to the plotting points and the ultrasonic attenuation. According to their different functions, they appear separately as DAC-RL, DAC-SL and DAC-EL on the screen from top to bottom. CORRECT works for compensating the difference between the surfaces of test block and detected object which will influence the ultrasonic transmission between them. When the CORRECT gets increased, the three DAC offset curve will get lower correspondingly, and contrarily they will get higher.

3.8.1 DAC evaluating line (DAC-RL)/ DAC-REF

This menu is multipurpose for DAC-RL and DAC-REF; by , shift the two functions.

It is to set the offset of DAC reject-judging line.

Parameter range: -50 dB~50 dB

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select DAC2 functional group, and by “↑” or “↓” key, select the functional menu for DAC-EL, and then set the offset of DAC evaluating line by“←” or “→” key.
  • By key , shift between DAC-EL and DAC-REF

DAC-REF:

DAC-REF means the curve which flaw echo confirm to as standard, “generatrix” or “quantify” is often used, in which generatrix means the primary plotting curve of DAC, another available three standards are all DAC offset. The standard above works only when the DAC is well completed.

Options: GL, RL, SL, EL

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F2> key select DAC2 functional group, and by “↑” or “↓” key, select the functional menu for DAC-REF, and then select the reference curve by “←” or “→” key.
  • By key , shift between DAC-EL and DAC-REF.

3.8.2 DAC quantifying line (DAC-SL)

It is to set the offset of DAC quantifying line.

Parameter range: -50 dB~50 dB

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key you select DAC2 functional group, and by “↑” or “↓” key, you select the functional menu for DAC-SL, and then set the offset of DAC quantifying line by “←” or “→” key.

3.8.3 DAC evaluating line (DAC-EL)

DAC evaluating line (DAC-EL):

It is to set the offset of DAC evaluating line.

Range:  -50 dB~50 dB

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F3> key select DAC2 functional group, and by “↑” or “↓” key, select the functional menu for DAC-RL, and then set the offset of DAC reject-judging line by Press “←” or “→” key.

3.8.4             DAC correction (CORRECT)

Set the CORRECT of DAC.

Parameter range 0 dB~60 dB
step 0.1 dB

Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select DAC2 functional group, and by “↑” or “↓” key, select the functional menu for CORRECT, and then adjust parameters for CORRECT by Press “←” or “→” key.

3.9 Adjustment of AVG1 Group

AVG1 Group is used for adjusting the relative parameters necessary for AVG curve. It includes AVG MODE/CHOCKVEL, PROBENAME, FREQUENCY/DIAMETER, and REFTYPE/REFSIZE

3.9.1 AVGMODE/CHOCKVEL

This menu is multipurpose for AVG MODE and CHOCK VEL; by , shift the two functions.

AVG MODE:

It is to turn on/off the AVG display. It will be ineffective when B-scan is on.

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select AVG1 functional group, and by up and down key, select the functional menu for AVG MODE and then set ON/OFF for AVG Curve by left or right key.

CHOCK VEL:

Users are allowed to set the transmission velocity of ultrasonic wave in chock according to the sign on the probe.

Range:250 m/s~16000 m/s or 0.0098 in/µs~0.6299 in/µs

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select AVG1 functional group, and by up and down key, select the functional menu for AVG MODE, and then set the transmission velocity of ultrasonic wave in chock by left or right key.

3.9.2 Probe name

Users are allowed to input the name of the probe; the maximum character number is eight.

Option: ASCII character

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select AVG1 functional group, and by up and down key, select the functional menu for AVG NAME and then set the probe name for AVG Curve by left /right key and Enter key.
  • By Enter key move cursor and by left or right key to select character.

3.9.3 FREQUENCY/DIAMETER

This menu is multipurpose for FREQUENCY and DIAMETER by , shift the two functions.

FREQUENCY:

Probe frequency can be input.

Range:0.5 MHz ~ 10 MHz

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select AVG1 functional group, and by up and down key, select the functional menu for FREQUENCY, and then set Probe frequency by left or right key.

DIAMETER:

The diameter of probe can be input according to sign.

Range: 0.11 in ~ 1.37 in (3.00 mm ~ 35.00 mm)

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select AVG1 functional group, and by up and down key, select the functional menu for DIAMETER, and then set Probe diameter by left or right key.

3.9.4 REFTYPE/REFSIZE

This menu is multipurpose for REF TYPE/REF SIZE; by , shift the two functions.

REF TYPE:

We must select reflector style on the standard block. There are three reference types.

Option:

Flat bottom hole (FBH): It is a columnar hole in the bottom and its diameter is equal to the size of the reference flaw.

Short horizontal hole (SDH): It is a columnar hole in the side face and its diameter is equal to the size of the reference flaw.

Wide bottom (BW): The reflector is equal to infinite flat bottom approximately.

Operation:

  • By <Page up> key switch the function page.
  • By <F4>key select AVG1 functional group, and by up and down key, select the functional menu for REFTYPE and then set reference type by left or right key.

REF SIZE:

The size of reflector in standard block.

Range: 0.019 in ~ 0.39 in (0.50 mm~10.00 mm)

Operation:

  • By <Page up> key switch the function page.
  • By <F4> key select AVG1 functional group, and by up and down key, select the functional menu for REF SIZE, and then set reference size by left or right key.

3.10 Adjustment of AVG2 Group

The AVG2 group is for plotting AVG curve and setting the parameters necessary for plotting a AVG curve. It includes A start/AVG CURVE, RECORD REF, CORRECT/TEST ATTN.

3.10.1 Start of Gate A / AVG Curve

This menu is multipurpose for Start of Gate A/AVG Curve; by , shift the two functions.

Start of Gate A:

AVG Curve:

AVG Curve is made according to standard reflector, but when the size of standard reflector cannot meet your work, you can adjust its value.

Range: 0.011 in ~ 0.78 in (0.30 mm~20.00 mm)

Operation:

  • By <Page up> key switch the function page.
  • By <F5> key select AVG2 functional group, and by up and down key, select the functional menu for AVG CURVE, and then set value by left or right key.

3.10.2 RECORDREF

The function is used for plotting AVG curve.

Option:0 (no record), 1 (recorded)

Operation:

  • To make sure that the system is in single gate mode.
  • By <Page up> key switch the function page
  • By <F5> key select AVG2 functional group, and by up and down key, select the functional menu for RECORDREF.
  • Move gate A to echo we need by left or right key.
  • Adjust gain to make echo amplitude equal to 80 % of screen.
  • Record reference value by right key.
  • We can revise the value by deleting it (left key) and recording it again.

3.10.3 CORRECT/TESTATTN

This menu is multipurpose for CORRECT/TEST ATTN; by , shift the two functions.

CORRECT:

The function is used for correcting coupling error between work piece and probe.

Range:-30 dB~30 dB

Operation:

  • By <Page up> key switch the function page.
  • By <F5> key select AVG2 functional group, and by up and down key, select the functional menu for CORRECT, and then set correct value by left or right key.

TEST ATTN:

The function is used for correcting ultrasonic attenuation error in work piece.

Range:0.0 dB~100.0 dB

Operation:

  • By <Page up> key switch the function page.
  • By <F5> key select AVG2 functional group, and by up and down key, select the functional menu for TEST ATTN and then set correct value by left or right key.

3.11        AWS Group

The AWS menu provides a means for evaluation discontinuities when inspecting welds in accordance with the American Welding Society’s Structure Welding Code, ASNI/AWS D1.1-94. The user is referred to the AWS standard for all details of the method.

The AWS menu provides a convenient method of automatically calculating the ”Indication Rotating (IR)” as defined by the standard. The AWS menu can be used in conjunction with the trigonometry mode which will simultaneous indicate beam path, surface distance and depth distance at the bottom of the graticule.

D Rating A INDI – B REF – C ATTEN
D Rating Is the difference in dB between the indication and the reference gain with attenuation factor correction
A INDI is the dB setting required to bring an indication to the reference level
B REF is the dB setting of the calibrated reference indication as a function of the reference standard and probe being employed.
C ATTEN is the attenuation factor required by the AWS standard.

C=0.079 dB/mm (s- 1 in (25.4 mm))

s=sound path of flaw echo.

C ATTEN is automatically calculated by unit.

When the S <= 1 in (25.4 mm) C ATTEN is 0

3.12 Adjustment of Screen Group

We can use the screen saver to save electricity. It includes SCR TYPE/PREVIEW, ERECTION/SCRDELAY, SCR TEXT, ABOUT/COLOR SET.

3.12.1 Screen saver mode / Preview

This menu is multipurpose for SCR TYPE/PREVIEW; by , shift the two functions.

SCR TYPE:

We can select screen saver type.

Option:

CLOSE: no screen saver.

CLEAR: Screen is black.

TEXT: The screen saver is fixed text.

CUSTOM: The screen saver is the text which is to be set by operator.

SLEEP:      The system will stop work and sleep, but it can come back by press any key.

POWER:   The system will be automated closed.

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for SCR-TYPE, and then set screen saver type by left or right key.

PREVIEW:

We can preview screen saver through the function.

Option: Open, Close

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for PREVIEW and then preview screen saver by left or right key.

3.12.2 DIRECTION/SCRDELAY

This menu is multipurpose for DIRECTION/SCR DELAY; by , shift the two functions.

DIRECTION:

When the screen saver type is text or custom, we can set the direction of roll.

Option:

Horizontal: The text will roll from right to left.

Vertical: The text will roll from top to bottom.

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for DIRECTION and then set the direction for screen saver by left or right key.

SCR DELAY:

It is used for setting delay for screen saver.

Rang:1 min~99 min

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for SCR DELAY, and then set the delay for screen saver by left or right key.

3.12.3 SCRTEXT

When the screen saver is custom, operator can set text on the screen saver.

Option: ASCII character

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for SCR TEXT, and then set the text of screen saver by left or right key.
  • By Enter key move cursor and by left or right key to select character.

3.12.4 COLORSET/ABOUT

This menu is multipurpose for ABOUT/COLOR SET; by , shift the two functions.

ABOUT:

Information of manufacture.

Option: Open, Close

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for ABOUT and then see information of manufacture by left or right key.
  • By <F5> key exit.

COLOR: (Only for colorful display)

There are four projects of color for our system.

Option:0, 1, 2, 3, 4

Operation:

  • By <Page up> key switch the function page.
  • By <F2> key select SCR functional group, and by up and down key, select the functional menu for COLOR, and then select color by left or right key.

3.13 Adjustment of GAIN Group

The Angle Probe group is used for adjusting and setting the parameters for system gain. It includes REFGAIN, ADDREF, SCANDB and AUTO-80.

3.13.1 Compensate gain (REF GAIN)

We can set the reference for system gain. It is very useful. When we open the REF GAIN, the gain show as:XX.X+0.0 dB, the first number is reference of gain, the second number is scan gain. Handlers can set reference before detecting, add or decrease according to the practice in the scene.

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select GAIN functional group, and by up and down key, select the functional menu for REF GAIN and then set ON/OFF for REF GAIN by left or right key.

3.13.2 Add reference (ADD REF)

We can add scan gain to reference gain.

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select GAIN functional group, and by up and down key, select the functional menu for ADD GAIN, and then set ON/OFF for ADD GAIN by left or right key.

3.13.3 Scan gain value (SCAN DB)

We can switch scan gain value between Setting value and 0 dB.

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select GAIN functional group, and by up and down key, select the functional menu for SCANDB and then set ON/OFF for SCAN DB by left or right key.

3.13.4 Auto set gain (AUTO-80)

We can use the function to adjust the gain automatically to make amplitude of the largest echo in gate equal 80 % of the screen

Options: ON, OFF

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select GAIN functional group, and by up and down key, select the functional menu for AUTO-80, and then set ON/OFF for AUTO-80 by left or right key.

3.14 Adjustment of B / V Group

B-scan is used for the area difficult to detect and displaying the section plane graph data of this area, the graph shows how the flows locate in the scanning direction in work piece. B-scan can be set beforehand, including B-SCAN/A-SCAN, and SCAN WAY.

3.14.1 B scan mode select (B-SCAN)/ A scan mode select (A-SCAN)

This menu is multipurpose for B scan mode select and A scan mode select.

B-SCAN

The switch on/off of B-scan mode.

When B-scan is turned on, B-scan mode will be displayed on screen. And when DAV curve is turned on, the switch of B-scan mode will not work. Option: ON, OFF

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F1> key select B/V functional group, and by “↑” or “↓” key, select the functional menu for B/V, and then adjust option for B/V by Press “←” or “→” key.

A-SCAN

The switch on/off of A0-scan.

When the B-scan is on, turn on A-scan, the screen will both of them half and half.

Option: ON, OFF

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F1> key select B/V functional group, and by “↑” or “↓” key, select the functional menu for A-SCAN, and then adjust option for A-SCAN by Press “←” or “→” key.

3.14.2 Scan way (SCAN WAY)

This menu is multipurpose for SCAN WAY/SCAN MODE; by, shift the two functions.

Scan way determines the refresh way. “left → right” and “right → left” are available.

Option: L->R, R->L

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F1> key, select B/V functional group, and by “↑” or “↓” key, select the functional menu for SCAN WAY and then adjust option for SCANWAY by Press “←” or “→” key.

Scan mode determines the refresh mode.

Option: ONCE, CYCLE

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F1> key, select B/V functional group, and by “↑” or “↓” key, select the functional menu for SCAN MODE, and then adjust option for SCANMODE by Press “←” or “→” key.

3.14.3 RE-FRAME/RE-SPEED

This menu is multipurpose for RE-FRAME/RE-SPEED; by , shift the two functions.

RE-FRAME:

The function is used for set review frame value of test video.

Range:1~15

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select B/V functional group, and by up and down key, select the functional menu for RE-FRAME, and then set review frame value by left or right key.

RE-SPEED:

The function is used for set review speed.0 is the maxim rapid.

Range:0~9

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select B/V functional group, and by up and down key, select the functional menu for RE-SPEED, and then set review speed by left or right key.

3.14.4 VIDEO/REVIEW

This menu is multipurpose for making video and review.

We can make and play the video of test process on the screen through this function.

Option: On, Off

Operation:

  • By <Page up> key switch the function page.
  • By <F1> key select B/V functional group, and by up and down key, select the functional menu for VIDEO or REVIEW, and then set review frame value by left or right key.

3.15 Adjustment of ADV Group

ADV Group is for adjusting and setting of special application of the instrument. It includes DATE/TIME. aSTART/aWIDTH, CSBT, CABT.

3.15.1 Setup Date (DATE)/Setup Time (TIME)

The functional group of Time is for adjusting and setting the real-time clock for the detector. It includes YEAR, MONTH, DAY, HOUR, MINUTE, SECOND, when this menu is selected, by  you can shift the six functions, and then adjust parameters by key Coder.

In the function of date, date form is M.D.Y, and in time function, time form is H:M:S.

Month Setting: setting the month.

Parameter range: 1~12

Day Setting: setting the day

Parameter range: 1~31

Year Setting: setting the year

Parameter range: 2000~2099

Hour Setting: setting the hour

Parameter range: 0~23

Minute Setting: setting the minutes

Parameter range: 0~59

Second Setting: setting the seconds

Parameter range: 0~59

3.15.2 Starting of the A gate (a START) / Width of the A gate (aWIDTH)

This menu is multipurpose for Start of Gate A and Calibrating Mode, the reason for setting Gate A here again is to make it easy for calibration under manual mode; by , shift the two functions,

3.15.3 Calibration of straight probe (CSBT)

For the convenience of user’s calibration of probe zero point and sound speed of material, the function of calibration is built in the gauge. Straight probe can be calibrated with the following method.

For example. The standard straight probe which is of the frequency 2.5 MHz, diameter 0.78 in (20mm) and single, two test blocks which are the same material with the measured object, and thickness determinate are needed.

Suppose that the probe is calibrated with two test blocks whose thicknesses are 1.96 in (50 mm) and 3.93 in (100 mm), the operation steps are as following:

  1. set the sound speed value to 5920 approximately, and set the zero value of probe to 0.00 µs;
  2. adjust the gate logic to single gate;
  3. adjust the detecting range to make the echo over 3.93 in (100 mm) can be displayed on the screen;
  4. couple the probe on the thin test block(1.96 in (50 mm)), move gate A start to echo and cut with it.
  5. Select the probe calibration menu in group PROBE, confirm the sound distance, then the gauge will adjust the gain automatically to make amplitude of the largest echo in gate equal 80 % of the screen, and at the same time, a number appears in the probe calibration menu, adjust this number to make it the same with actual S-PATH of test block, that is (1.96 in (50 mm)).
  6. Couple the probe on the thick test block (3.93 in (100mm)), move gate A start to echo and cut with it.
  7. Select the probe calibration menu in group PROBE, confirm the sound distance, then the gauge will adjust the gain automatically to make amplitude of the largest echo in gate equal 80 % of the screen, and at the same time, a number appears in the probe calibration menu, adjust this number to make it the same with actual S-PATH of test block, that is 3.93 in (100 mm).
  8. Press the ENTER key to confirm and finish the calibration, now the material sound speed and probe zero point of gauge will get to accurate value automatically.
  9. Before step 8, the key <FREEZE> can be used to cancel calibration.

3.15.4 Calibration of angle probe (CABT)

For the convenience of user’s calibration of probe angle, front edge, zero point and sound speed of material, the function of calibration is built in the gauge. Furthermore, users can also do the calibration of probe. Angle probe can be calibrated with the following method.

For example of the standard angle probe which is frequency 5 MHz, wafer 0.31 in × 0.35 in (8 mm × 9 mm) , single and angle K2.

We can use CSK-IIIA block to calibrate angle probe.

Fig. CSK-IIIA

Suppose that the probe is calibrated with two holes whose depths are 0.78 in (20 mm) and 1.57 in (40 mm), the operation steps are as following:

  • Set X-value to 0, and set the zero value of probe to 0.00 µs;
  • Set the sound speed value to 3230 approximately and set K-value to 2.
  • Adjust the gate logic to single gate;
  • Adjust the detecting range to make the echo over 3.93 in (100 mm) can be displayed on the screen
  • Couple the probe on the block to find the echo from the hole whose depth is 0.78 in (20 mm), move gate A start to echo and cut with it.
  • Select the probe calibration menu in group PROBE, confirm the sound distance, then the gauge will adjust the gain automatically to make amplitude of the largest echo in gate equal 80 % of the screen, and at the same time, a number appears in the probe calibration menu, adjust this number to make it the same with actual depth of hole, that is 0.78 in (20 mm).
  • Measure the distance between horizontal projection of hole and probe front, press the enter key, at the same time, a number appears in the probe calibration menu, adjust this number to make it the same with actual depth of hole, that is 1.14 in (29 mm).
  • Couple the probe on the block to find the echo from the hole whose depth is 1.57 in (40 mm), move gate A start to echo and cut with it.
  • Confirm the sound distance, then the gauge will adjust the gain automatically to make amplitude of the largest echo in gate equal 80 % of the screen, and at the same time, a number appears in the probe calibration menu, adjust this number to make it the same with actual depth of hole, that is 1.57 in (40 mm).
  • Measure the distance between horizontal projection of hole and probe front, press the enter key, at the same time, a number appears in the probe calibration menu, adjust this number to make it the same with actual depth of hole, that is 2.71 in (69 mm).
  • Press the ENTER key to confirm and finish the calibration, now probe angle, front edge, the material sound speed and probe zero point of gauge will get to accurate value automatically.
  • Before step 11, the key <FREEZE> can be used to cancel calibration.

3.16 Adjusting of Special Functions

In order to make it easy for the user to use, on the instrument’s panel, in addition to the selection for menu-type functional groups, there are also 7 keys of Special Functions that are used frequently, including Adjust of Gain Step, Gain+/-, Print Report, Full-screen Display, Waveform Freeze and extend, etc.

3.16.1 Gain Step

It is to adjust the length of gain step.

Options:  0 dB, 0.1 dB, 0.5 dB, 1.0 dB, 2.0 dB, 6.0 dB and 12.0 dB

Operation procedure:

  • By pressing Gain Step , the gain’s step graduation will change cyclically in the option.

3.16.2 Gain

When the gain step is adjusted to proper option, you can set the gain by Gain +/- .

Parameter range:         0 dB~120 dB

Operation procedure:

  • By pressing key +/- , the gain will change in the gain step set at present.

3.16.3 Full-screen

It is used to switch between full-screen display and normal display for waveform.

Operation:

  • Users can switch over full-screen and normal display modes by pressing full-screen key .

3.16.4 Freeze

It is used to freeze the waveform.

Operation procedure:

  • The gauge can be switched between freezing and non-freezing by the Freeze key .
  • Under Freeze state, prompting icon * appears in the status line.

3.16.5 Peaks Memory

Peaks Memory is used for users to conveniently find out the flaw peak and estimate the flaw accurately.

Operation:

  • By pressing < >key, we can open and close the function.

Under peaks memory state, prompting icon ‘P’ appears in the status line.

3.16.6 Extend key

It is used to extend the waveform for details by key .

Operation:

Loop the waveform to be observed by gate, press down the key , then the extended waveform will be displayed.

3.16.7 Test Data Display

We can select display method of measure result on the top right corner of display area。One of S-path, Projection and Depth will be displayed here and the other two will appear in the status bar. When dB is displayed, values S-path data got from DAC curve will appear on the screen. If DAC curve is turned off or the waveform in gate is over the screen, dB will appear as “*”.

Options: S-PATH, P-VAL, DEPTH, VAL-SZ, VAL-mm

Operation:

  • Press “Measure Display ” key to select display method of measure result.

3.16.8 Shortcut functional key

Detection zone, gate A, Auto gain is the functions in common use, so we set shortcut functional key for them。

Operation:

  • Press “  ” key to switch to detection zone menu quickly for adjustment of detection zone.
  • Press “ ” key to switch to gate A menu quickly. Press this key continually to select Gate A start, Gate A width or Gate A height for adjustment of corresponding functions.
  • Press “ ” key to adjust the gain automatically to make amplitude of the largest echo in gate equal 80 % of the screen.

3.14.9 Locking the Menus

In order to avoid modifying wrongly current detection parameters, each functional menu can be locked.

Operation:

  • Select the functional menu to be locked
  • Meanwhile press down the key , in this case the parameters of this functional menu can’t be changed
  • To unlock it, press downagain.

3.14.10 Locking the Data Group

In order to avoid deleting wrongly the waveform data group and DAC record, you can lock the data.

Operation procedure:

  • By <Page up> key switch the function page.
  • By <F4> key select MEM functional group, and by <Menu> key, select the functional menu for DATA
  • First set the Save mode as Waveform Save, then set and select the group no. of MEM group.
  • Meanwhile press down  and , you can lock this group of data, in this case the data group can’t be deleted or changed.
  • To unlock it, press down and at the same time.

3.14.11 Locking the Settings

In order to avoid deleting wrongly the setting in the setting, lock of setting is available.

Operation:

  • By <Page up> key switch the function page.
  • By <F3> key select SET functional group, and by <Menu> key, select the functional menu for SET, and then adjust parameters for SET by Press “←” or “→” key.
  • Meanwhile press down and , user can lock this group of the setting; in this case the setting group can’t be deleted or changed.
  • To unlock it, press down and at the same time.

3.14.12 Resetting the Ex-factory Setting

Users can recover the ex-factory parameter setting when turning on the machine if necessary.

Operation:

When it displays the progress bar for Turn on screen by pressing down and , you can recover the ex-factory setting.

3.16.13 Instrument program upgrade

It provides online upgrade function, and operator can perform program upgrade process by tools Data View after getting necessary upgrade files.

Operation:

  • Connect interface of the instrument and PC by the special-purpose communication cable
  • If the instrument cannot set up normally, operator can press the keys of   and when it displays the progress bar for Turn on screen. Thus, the instrument will keep the turn on screen but not shift to the operation interface.x
  1. Calibrating the Instrument and Measuring

Before working, it is necessary to calibrate the sound speed, pitch interval and probe delay for the instrument, so as to be adaptive to the detection condition. Where, the reason for calibrating sound speed and probe delay is that the calculation of parameters displayed in the status line is relative with sound speed and probe delay, therefore you must calibrate before detection; while the purpose for calibrating pitch interval is to make it display waveform in proper range of pitch interval on the screen, so as to judge and evaluate the defects better.

In order to operate the instrument safely and correctly, the calibrated shall be calibrated by a professional technician from field of ultrasonic detection. In order to illustrate well the calibrating way and steps, examples will be given later.

4.1 Calibrating of Single Probe

You should determine the calibrating procedures depending on the known condition of sound speed and probe delay. If the sound speed is unknown, you first calibrate the sound speed by way of “Two Points”; if the sound speed is known, calibrate the probe delay by one-point way after adjusting the sound speed into the known one.

4.1.1 Calibrating with Known MTLVEL

Procedure:

  • The MTLVEL setting is the known sound speed of the material,
  • Couple the probe with the calibrating test block,
  • Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, loop the gate on the primary echo, now the pitch interval measured is the pitch interval at primary echo,
  • Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block.

4.1.2 Calibrating with Unknown MTLVEL

Procedure:

  • First set a rough sound speed value;
  • Adjust the gate logic into Double Gate mode;
  • Couple the probe with a test block for which the thickness is known and that is of the same material with the job;
  • Move the start of gate A to the primary echo and make them intersect, adjust the height of gate A to be lower than the max. amplitude of primary echo and to a proper position, and gate A shall not intersect with the secondary echo;
  • Move the start of gate B to the secondary echo and make them intersect, adjust the height of gate B to be lower than the max. amplitude of secondary echo and to a proper position, and gate B shall not intersect with the primary echo;
  • Then adjust the sound velocity, so that the pitch interval displayed in the status line is same with the actual thickness of the test block. The sound velocity got now is the actuate sound velocity under this detection condition;
  • Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, the pitch interval measured at this time is the pitch interval at primary echo;
  • Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block. The probe delay measured at this time is the exact P delay of this probe.

In the following we’d like to illustrate by an example:

Fig. Calibrating with unknown MTLVEL

MTLVEL is unknown, set the approximate MTLVEL as 5920 m/s, set the Gate Logic as double gate mode, meanwhile set the P delay as 0;

Couple the probe with a calibrating test block of 1.96 in (50 mm), and adjust the gate A to a position intersecting with the primary echo, Adjust gate B to a position intersecting with secondary echo;

Fig. Calibrating MTLVEL

Fig. Calibrating P-DELAY

Increase MTLVEL, till the displayed pitch interval between the primary and secondary echo is 50 mm, now we get the exact sound velocity of the material, i.e. 5891 m/s; set again the gate as Single Gate mode, measure the pitch interval at the primary echo, adjust continuously P Delay till the pitch interval measured at the primary echo is 1.96 in (50 mm), now we get the exact P Delay, i.e. 0.05 µs.

 4.2 Calibrating of Double Probe

Calibrating procedure:

  • Set double-probe state in PROBE group;
  • Set the pitch interval, functional items in PROBE group depending on current testing task and probes selected;
  • Couple the probes with the calibrating test block, adjust the P Delay in Base group till the calibrating echo approaches to the desired position, meanwhile the secondary echo is also within the display range;
  • Adjust the gain till the echo with the max. amplitude approaches to the full-screen height;
  • Turn on double gates in Gate group;
  • Select Front-edge measuring way in CFG group;
  • Move the start of Gate A to the primary echo and intersects with it, and Gate A shall not intersect with the secondary echo;
  • Move the start of Gate B to the secondary echo and intersects with it, and Gate B shall not intersect with the primary echo;
  • Adjust gate heights, so that they are at the same positions of the front edges of two standard echoes;
  • Change the sound velocity, till it displays the thickness value of the standard test block;
  • Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, the pitch interval measured at this time is the pitch interval at primary echo;

Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block.

4.3 Calibrating of Angle Beam Probe

Calibrating of angle beam probe is usually as following:

  1. Calibration of incidence angle (X-Value);
  2. Calibration of probe angle (K-Value);
  3. Calibration of material sound speed;
  4. Calibration of probe Zero point.
  5. Calibration of incidence angle (X-Value): Test the probe zero point with II W test block (Holland test block) or CSK- I A test block, firstly adjust the sound speed to 3230 m/s, detecting range to 5.90 in (150 mm), then start the testing. Locate the probe on test block and move it as the right figure to make sure you have got the highest echo on R100 mm reflector, measure the distance, which is the X-Value of probe, between the front face of probe and cycle center of R100 m arc. The point corresponding to the cycle center of R100 mm arc is just the incidence point of probe.

  1. Calibration of probe angle (K-Value): The probe plotted with angle value can be calibrated with II W test block, and the probe plotted with K-Value can be calibrated with CSK- I A test block. Both the two kinds of test blocks have the scales of angle and K-Value, select the proper scale for the probe (as shown on the right figure, on the upside of II W test block probe of 60~76 degrees can be calibrated, the downside is suitable for the probe of 74~80 degrees. And on the upside of CSK-I A test block probe of K2.0, K2.5, and K3.0 can be calibrated, the downside is suitable for probe of K1.0, K1.5). Locate the probe as the right figure shows, move the probe back and forth to make sure you have got the highest echo, and now the scale corresponding with incidence point is the probe angle or K-Value.

   

  1. When the focus on angle menu, press  key, we can input L value (above picture) and then press  key again, the unit will calculate the angle value.
  2. Calibration of sound speed: find out the highest echo in item 1, and adjust the detecting range to make sure the second echo of this echo can be displayed on the screen, switch the gate mode to double gate, adjust the A gate to cut with the first echo, and adjust B gate to cut with the second echo, adjust the sound speed to make the value of sound path(S) be 100, now the sound speed value you get is the actual sound speed.
  3. Calibration of probe zero point. Keep the testing status above, and change the gate mode to plus or minus, adjust the probe zero point to make the value of sound path (s) return to 100, now the zero point value is the actual zero point value.

Angle beam probe can be calibrated in many ways, not only by standard test blocks, it can also be done with a thickness known hole, theoretically, smaller of the reference reflector more accurate calibration you will get, however, it will be more difficult to do so. When calibrating with holes, we can do the calibration on angle by working out slope through measuring the depth and level position of hole, and with which processing the calibration of sound speed and probe zero point.

4.4 Application of DAC Curve

DAC curve is used for distinguishing the reflectors with the same size and different distance. Normally, in work piece, reflectors with the same size and different distance cause change in amplitude because of the attenuation of material and pervasion of beam. The DAC curve compensate for attenuation of material, magnetic field influence, pervasion of beam and surface smoothness in the way of graph. Normally, the echo peak points are all located in the same DAC curve. And in the same way, the echo created by smaller reflectors will be located under this DAC curve, and the bigger one will be above the curve.

  1. Selection of detecting setting. Select the advanced function group by Page key and function key <F4>, adjust the detecting setting number, choose one as the current instrument setting, for example, No.1, (Note: One group of DAC plotting points can be saved in one setting, and they are saved automatically, not needing any operation, if you want to save the parameter setting at the same time, turn to the operation “ADV” “SAVE”.
  2. Turning on DAC curve function. Select the DAC1 function group through Page key and function key <F2>, and then select the DAC curve function through S1 and up/down keys, (if the DAC curve function doesn’t lie in the current menu, please switch it by the key  or S1, plot the revision function), set the DAC curve switch by“←” or “→” key.
  3. Making DAC curve. Select the DAC1 function group through Page key and function key <F2>, Add plotting points, when two plotting points are finished, the DAC curve will be protracted automatically. (Note: Plot the points in the order of small to large according to the detecting range, and the echo height of latter one must not be higher than the fore one, otherwise, the DAC curve will be a beeline.)
  4. Adjust the offset of the three offset curves. Select the DAC2 function group through Page key and function key<F3>, adjust the three offset curves viz. DAC-EL, DAC-SL and DAC-RL to proper settings.
  5. Compensation for surface roughness. Select the DAC2 function group through Page key and function key<F3>, adjust the gain correct menu to compensate for the surface roughness of work piece, for example, when 5 dB is needed, just adjust the gain correct to -5 dB, and now the three DAC curves will go down for 5 dB.
  6. The completed DAC curve:

Fig.DAC curve

The screen is divided into three areas, I, II and III. The three curves will be drawn on the screen during the detecting; users can determine the flaw character by the height of the echoes.

4.5 Contents of Measurement

To use the detector for measuring, you shall carry out the following works:

Set the start of gate, gate width, gate threshold and gate alarming way.

Contents of measurement are:

S                   Pitch interval

H (%)            Relative value of echo height in gate range (relative to the screen height)

h                  Absolute value (in pixel) of echo height in gate range

d                  Depth of defect

D (%)            Relative value of defect depth (relative to job’s thickness)

P                   Horizontal distance of the defect from the probe’s front edge

As for the meanings of above parameters, please refer to the following figure.

Where:

s: Pitch interval;

D: Depth of defect;

t: Thickness of job;

x: Distance of ultrasonic source to the probe’s front edge;

p: Horizontal distance of the defect from the probe’s front edge;

D: Is the relative value of defect depth, it is obtained by the following formula:

D  dt

Communication for the Instrument

The instrument is equipped with bi-directional full duplex RS232 and USB interface, can achieve communication with PC at up level and control the serial printer to print report on detection. Connect the instrument with PC’s serial port or USB interface, and enter into the special operation software Data View for the instrument at PC.

Data Communication

In the instrument, the baud rate of RS232 serial port is fixed 9600, one start bit, two stop bits, 8 digital bits, and there is no check bit.

 Connecting PC

RS232/USB connecting way: One end of the standard RS232 serial cable connects with RS232 interface of the instrument, another end with COM1 (or COM2) port of PC. The instrument will upload the images and data saved through RS232 serial port to PC. The customer software installed on PC can edit, save or print the images and data.

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