GAOTek Flaw Detector with Transducer Calibration (Li Battery)

This portable Flaw Detector with Transducer Calibration (Li Battery) can quickly, and accurately inspect and evaluate flaw location for a range of scanning up to 393.7 in (10000 mm) and diagnose various defects in a workpiece.

GT00XY00Z3

Description

Overview

GAOTek Flaw Detector with Transducer Calibration (Li Battery) is a portable, non-destructive flaw detector which can quickly, easily and accurately inspect, locate, evaluate and diagnose various defects (crack, inclusion and pinhole, etc.) in a workpiece for a range of scanning: 0-393.7 in (0-10000 mm), in a lab or field, without destruction. This device can be used extensively in any field that needs defect inspection and quality controlling e.g. manufacturing industry, iron & steel metallurgical industry, metalworking, chemical industry, etc.; moreover, it can also be broadly used in the active safety inspection and service-life evaluation such as aerospace, railway transportation and boiler pressure vessels. It is an essential instrument for non-destructive inspection industry.

Key Features

  • Automated calibration of transducer Zero Offset and/or Velocity
  • Automated gain, Peak Hold and Peak Memory
  • Automated display of precise flaw location (depth d, level p, distances, amplitude, sz dB, Φ)
  • Automated switch three staff gauge (Depth d, level p, distance s)
  • 100 independence setup, any criterion can be input freely; can work at the scene without test block
  • Big memory of 300 A graph
  • Gate and DAC alarm; Acoustic-Optical alarm
  • RS-232/USB port makes communication with pc easy
  • The embedded software can be updated online
  • Li battery provides continuous working time up to 10 hours
  • Display freeze
  • Automated echo degree
  • Angles and K-value
  • Lock and unlock function of system parameters
  • Dormancy and screen savers
  • Electronic clock calendar
  • Two gates setting and alarm indication
  • High-speed capture and very low noise
  • DAC, AVG, B Scan; Solid metal housing (IP65);
  • Automated calculation of the size of the flaw with wide bottom type in AVG function
  • AWS D1
  • 6 dB DAC functions
  • Automated video making of test process and play
  • Provides high contrast viewing of the waveform from bright, direct sunlight to complete darkness and easy to read from all angles
  • Powerful PC software which allows reports to be exported to Excel

Technical Specifications

Designation Technical Data
Range of scanning Range of scanning (mm):0- 393.7 in (0~10000 mm)

Adjusting step: 0.1 mm (2.5 mm ~ 99.9 mm), 1 mm (100 mm~10000 mm)

D-delay D-delay (s): -20 µs~+ 3400 µs

Adjusting steps: 0.1 (-20 µs~999.9 µs), 1 (1000 µs~3400 µs)

P-delay P-delay: 0.0~99.99 s

Adjusting steps: 0.01

MTLVEL MTLVEL: 1000 m/s~15000 m/s

7 fixed levels: 2260 m/s, 2730 m/s ,3080 m/s, 3230 m/s, 4700 m/s, 5920 m/s, 6300 m/s,12000 m/s

Adjusting steps: 1

Working mode Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe)
Frequency Range 0.5 MHz ~ 20 MHz
Gain adjustment 0~120 dB

Adjusting step: 0.0,0.1,0.5,1,2,6,12

Reject 0 %~80 % of screen height, step: 1%
Vertical linear error Vertical linear error is not more than 3%
Horizontal linear error Not more than 0.2 % in the scanning range
Sensitivity Leavings ≥ 62 dB
Dynamic range ≥ 34 dB
Alarm Three modes, i.e. forbidden wave, loss wave and auto
A-Scan display area Full screen or local

A-Scan display freezing and de-freezing   A-Scan filling

Data save 300 A-Scan images (including setting of instrument)
Battery Li battery 7.4 V   4800 mAh
Power Adaptor Input 100 V~240 V/50 Hz~60 Hz

Output 9 V DC/1.5 A

Working Temperature 14 °F~122 °F (-10 °C~50 °C)
Working Humidity 20 % RH~90 % RH
Port type BNC
Dimension 9.44 in × 5.90 in × 1.96 in (240 mm × 150 mm × 50 mm)
Weight  3.5 lbs (1.6 kg)

Additional Information

Basic Working Principle for Ultrasonic Detection

When the ultrasonic wave propagates in a job, one can detect the defect in it by the influence on the propagation of ultrasonic wave based on the acoustic characteristic demonstrated by the defect in the material. Based on this principle, by using ultrasonic wave one can measure such defects as crack, pinhole and inclusion in such media as metal, non-metal and composite, etc.

Basic working principle for ultrasonic detection

Designation of the instrument’s components

     

Functional Keyboard

Keys of the instrument are included in three groups: Function group, usual key group and special function group. There are 6 keys in Functional group, in which F1, F2, F3, F4, F5 are corresponding with the 5 functional groups on screen, and the key <> is used for switching of pages; Usual key group comprises 9 keys: Up, down, dB+, dB-,+, -, gain step key, freeze key, Enter key which are used for usual operating; and special function group consists of 9 keys:  On/Off key, full screen key , detection zone , gate A, gate B, Auto gain , extend key  , peak memory   and measure display .

Functional Keyboard

Connecting the Probe

Proper probe shall be connected when using the instrument for inspection. The probe connector for this instrument is BNC.

The probe shall be connected to the socket at top of the instrument casing. Both connector sockets have different function, sending socket at left (with red mark) and receiving socket at right (with blue mark). With Single-Probe mode, only the sending socket can be used. When connecting a double-wafer (TR) probe (one wafer for sending, another for receiving) or two probes (one for sending, another for receiving), take care that the sending probe is connected to the sending socket and receiving probe to the receiving socket. Otherwise, it may result in loss or disorder echo waveform.

Operation

Basic steps

a. Get the job ready;

b. Insert the probe plug into the probe socket of the host, rotate tightly the locking nut;

c. press, turn on the instrument;

d. It will carry out self-test

In normal case, when you turn on the unit, it will automatically enter into the status that it is in during last turning off. The instrument parameters are consistent with last turning off, but the waveform during last turning off will not display.

e. Check the voltage of the battery; if the power monitor shows that the voltage is low, it  will  turn  off automatically 1 min after alarming bell

f. According to your application Ten independence setups can be applied, any criterion can be input freely, we can work in the scene without test block. Whether it needs to calibrate the instrument, if yes, ask a professional technician to calibrate it (refer to chapter IV);

g. Measure;

h. Save the results, big memory of 300 A graph.

i. Turn off the instrument.

Starting the Instrument

Press , turn on the instrument, it will carry out self-test. After five seconds, the instrument comes into operation mode.

Screen Display Description

Three Display Modes of the Screen

A-scan at normal mode

A-scan at normal mode

Ascan at Enlarged mode

You can activate Enlarge mode by . The gain and selected dB step value will be always displayed on the screen. And at the same time, all other functions are locked.

A-scan at enlarged mode

Manual B-scanning

B – Scan mode

Description about symbols displayed on screen

In the figure, echo amplitude H= 84 %, depth to the reflector = 0.06 in (1.57 mm), surface distance = 0.98 in (25.14 mm), echo times is 2, start of range = 0.0 mm, end of range = 1.57 in (40.0 mm).

In the figure, echo amplitude (pixels) H = 148, Angular distance = 1.08 in (27.68 mm).

Display of echo times

When the angle of probe is not zero and the measured echo is multi-echo, the echo times will be displayed on the status column as follows

/           one time echo

/           two times echo

/           three times echo

//        four times echo

//        five and more times echo

Description of other symbols

There some other symbols above functional menu, Freeze and Communication symbol is beside the battery status symbol.

Symbol Name Description
  Freeze Freeze state
  Communication The instrument is communicating with the PC
  Angular distance Distance from the incidence point to the reflect point
  Depth to reflector Depth from the incidence point to the reflect point
  Surface distance Surface distance from the incidence point to the reflect point
  Echo amplitude The amplitude value of max echo within the gate
  Edge sampling It shows that the instrument is in “Edge Sampling” mode, depth and angular distance is the measure value of the first echo which is above the gate and within the gate
  Peak sampling It shows that the instrument is in “Peak sampling” mode,  depth and angular distance is the measure value of the echo with the max amplitude within the gate
 P Memory peaks Peaks memory function is enabled.
 T Making video Dynamic Record function is enabled.
 E Operation error Operation error last time.
  Radian revise Abscissa and measure result is revised according to radian.

Overview of All Functions

The functions of this instrument are included in 15 functional groups and several special functions.

The functional groups include BASE, PROBE, SET, MEM, GATE, CFG, DAC1, DAC2, AVG1, AVG1,AWS, SCR, GAIN、CFG, B/V,ADV.

No. Group Functions Description
1 BASE RANGE, MTLVEL, D-DELAY, T-VALUE Basic adjustment items necessary for the display range
1 PROBE PROBE TYPE/PROBE POS, ANGLE/K-VALUE, P-DELAY/X-VALUE, X-COORD/PART DIA Probe adjustment items needed
1 SET SETTING NO., RECALL/REFACTORY, SAVE, DELETE/CLEAR ALL Relative   items   for independence setups
1 MEM DATA NO, RECALL, SAVE, DELETE Setting of data memory
1 GATE GATE LOGIC/ALARM, aSTART/bSTART, aWIDTH/bWIDTH aTHRESH/bTHRESH Relative items for gate configuration
2 CFG DETECT/ REJECT, GRID/BRIGHTNESS, UNIT / LANGUAGE DATE/TIME Setting of relative state
2 DAC1 DAC/REVISE, RECORD/REVISE POS, aSTART/aWIDTH, SHOW MARK/DAC MODE Plotting DAC curve
2 DAC2 DAC-EL/ERS-REF, DAC-SL, DAC-RL, CORRECT Setting relative with DAC curve
2 AVG1 AVG MODE/CHOCK VEL, PROBE NAME, FREQUENCY/DIAMETER, REF TYPE/REF SIZE
2 AVG2 A START/AVG CURVE, RECORD REF, TEST ATTN/CORRECT
3 AWS INDICA/ A START, REFRANCE, ATTEN, RATING
3 SCR SCR TYPE/PREVIEW, DIRECTION/SCR DELAY, SCR TEXT, ABOUT/COLOR SET
3 Gain REF GAIN, ADD REF, SCAN DB, AUTO-80 Relative items for gain
3 B/V B-SCAN/A-SCAN ,       SCAN WAY/SCAN MODE, RE-FRAME/RE-SPEED, REVIEW/VIDEO
3 ADV SETTING/SAVE, RECALL, VALUEDIS/RS232 SET, DATE/TIME Advanced function

Other special functions can be realized by Special Function (SF) keys.

Special Functions Description of function
Gain step To adjust the gain step
dB+, dB- To adjust the gain
Full-screen To switch over in full screen
Freeze To freeze waveform
Dynamic record On/off Dynamic record
Memory Peaks Capture the max value of echo on the screen
Measure display Select the display mode of measure result on the screen
Enter Switch of multi-menu, parameters, confirmation of functions
Page up Switch function page

Basic Operations

You can select a functional group by <Fn> key; select certain function by <Menu> key and ; at this time, you can modify parameters of this current menu by Coder And for some functional menus, they are shared by two functions, when you have selected such a function, by pressing or the corresponding <Menu> key, it can be shifted to another function.

Selection of Functions

There are 5 functional groups displayed below the A-scan zone, which can be selected by the corresponding <Fn> key, and the selected one will be highlighted. The four corresponding function items will be displayed closely next to the right of A-scan zone, which can be selected by press “↑” or “↓” key.

Multipurpose Function Items

In some cases, a functional item has two functions. Thus, they can be shifted by pressing down the press “↑” or “↓” key again or striking   key. The symbol “>” displayed behind the function name means that it is a multipurpose function item.

Function I Function II Functional group to which
GATE LOGIC ALARM GATE
aSTART bSTART GATE
aWIDTH bWADTH GATE
aTHRESH bTHRESH GATE
ANGLE K-VALUE ANG
X-VALUE X-COORD ANG
PROBE POS PART DIA ANG
RECORD REVISE POS DAC1
aSTART aWIDTH DAC1
SHOW MARK DAC MODE DAC1
DAC-RL ERS-REF DAC2
AVG MODE CHOCK VEL AVG1
FREQUENCY DIAMETER AVG1
REF TYPE REF SIZE AVG1
A START AVG Curve AVG2
CORRECT TEST ATTN AVG2
B-scan A-scan B/V
SCAN WAY SCAN MODE B/V
RE-FRAME RE-SPEED B/V
DIRECTION SCR DELAY SCR
SCR TYPE PREVIEW SCR
ABOUT COLOR SET SCR
DATA NO (for Wave) DATA NO MEM
Detect RS-232 SET CFG
COORDINATE BRIGHTNESS CFG
FILL BUZZER CFG
LANGUAGE UNIT CFG
DATE TIME ADV
aSTART aWIDTH ADV

Rough and Fine Adjustment of Functions

For some functions, rough and fine adjustment are available. By pressing down the corresponding   key, you can shift between these two adjusting modes. With a symbol “*” in front of the function item that means it is in fine adjustment mode.

The following are the functional items with optional rough and fine adjustment.

 Functions Functional Group
RANGE BASE
MTLVEL BASE/ANG
D-DELAY BASE
T-VALUE ANG

Calibrating the Instrument and Measuring

Before working, it is necessary to calibrate the sound speed, pitch interval and probe delay for the instrument, so as to be adaptive to the detection condition. Where, the reason for calibrating sound speed and probe delay is that the calculation of parameters displayed in the status line is relative with sound speed and probe delay, therefore you must calibrate before detection; while the purpose for calibrating pitch interval is to make it display waveform in proper range of pitch interval on the screen, so as to judge and evaluate the defects better.

In order to operate the instrument safely and correctly, the instrument shall be calibrated by a professional technician from field of ultrasonic detection.

Calibrating of Single Probe

You should determine the calibrating procedures depending on the known condition of sound speed and probe delay. If the sound speed is unknown, you first calibrate the sound speed by way of “Two Points”; if the sound speed is known, calibrate the probe delay by one-point way after adjusting the sound speed into the known one.

Calibrating with Known MTLVEL

Procedure:

  • The MTLVEL setting is the known sound speed of the material,
  • Couple the probe with the calibrating test block,
  • Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, loop the gate on the primary echo, now the pitch interval measured is the pitch interval at primary echo,
  • Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block.

Calibrating with Unknown MTLVEL

Procedure:

  • First set a rough sound speed value;
  • Adjust the gate logic into Double Gate mode;
  • Couple the probe with a test block for which the thickness is known and that is of the same material with the job;
  • Move the start of gate A to the primary echo and make them intersect, adjust the height of gate A to be lower than the max. amplitude of primary echo and to a proper position, and gate A shall not intersect with the secondary echo;
  • Move the start of gate B to the secondary echo and make them intersect, adjust the height of gate B to be lower than the max. amplitude of secondary echo and to a proper position, and gate B shall not intersect with the primary echo;
  • Then adjust the sound velocity, so that the pitch interval displayed in the status line is same with the actual thickness of the test block. The sound velocity got now is the actuate sound velocity under this detection condition;
  • Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, the pitch interval measured at this time is the pitch interval at primary echo;
  • Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block. The probe delay measured at this time is the exact P delay of this probe.

Calibrating with unknown MTLVEL

MTLVEL is unknown, set the approximate MTLVEL as 5920 m/s, set the Gate Logic as double gate mode, meanwhile set the P delay as 0;

Couple the probe with a calibrating test block of 50 mm, and adjust the gate A to a position intersecting with the primary echo, Adjust gate B to a position intersecting with secondary echo;

Calibrating MTLVEL                           Calibrating P-DELAY

Increase MTLVEL, till the displayed pitch interval between the primary and secondary echo is 1.96 in (50 mm), now we get the exact sound velocity of the material, i.e. 5891 m/s; set again the gate as Single Gate mode, measure the pitch interval at the primary echo, adjust continuously P Delay till the pitch interval measured at the primary echo is 1.96 in (50 mm), now we get the exact P Delay, i.e. 0.05 us.

Calibrating of Double Probe

Procedure

  • Set double-probe state in PROBE group;
  • Set the pitch interval, functional items in PROBE group depending on current testing task and probes selected;
  • Couple the probes with the calibrating test block, adjust the P Delay in Base group till the calibrating echo approaches to the desired position, meanwhile the secondary echo is also within the display range;
  • Adjust the gain till the echo with the max. amplitude approaches to the full-screen height;
  • Turn on double gates in Gate group;
  • Select Front-edge measuring way in CFG group;
  • Move the start of Gate A to the primary echo and intersects with it, and Gate A shall not intersect with the secondary echo;
  • Move the start of Gate B to the secondary echo and intersects with it, and Gate B shall not intersect with the primary echo;
  • Adjust gate heights, so that they are at the same positions of the front edges of two standard echoes;
  • Change the sound velocity, till it displays the thickness value of the standard test block;
  • Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, the pitch interval measured at this time is the pitch interval at primary echo;
  • Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block.

Calibrating of Angle Beam Probe

Calibrating of angle beam probe is usually as following:  1. calibration of incidence angle (X-Value); 2. calibration of probe angle (K-Value); 3. calibration of material sound speed; 4. calibration of Zero point.

Calibration of incidence angle (X-Value): Test the probe zero point with || W test block (Holland test block) or CSK – | A test block, firstly adjust the sound speed to 3230 m/s, detecting range 150 mm, then start testing, locate the probe on test block and move it to make sure you have got the highest echo on R100 mm reflector, measure the distance, which is the X-Value of probe, between the front face of probe and cycle center of R100 m arc. The point corresponding to the cycle center of R100 mm arc is just the incidence point of probe.

Calibration of probe angle (K-Value):  the probe plotted with angle value can be calibrated with || W test block, and the probe plotted with K-Value can be calibrated with CSK- |   A test block. Both kinds of test blocks have the scales of angle and K-Value, select the proper scale for the probe, as shown in the figure, on the upside of || W test block probe of 60 degrees ~76 degrees can be calibrated, the downside is suitable for the probe of 74 degrees ~80 degrees. And on the upside of CSK- | A test block probe of K2.0, K2.5, K3.0 can be calibrated, the downside is suitable for probe of K1.0, K1.5. Locate the probe as the figure shows, move the probe back and forth to make sure you have got the highest echo, and now the scale corresponding with incidence point is the probe angle or K-Value.

When the focus on angle menu key, we can input L value, and then press  key again, the unit will calculate the angle value.

Calibration of sound speed: find out the highest echo and adjust the detecting range to make sure the second echo of this echo can be displayed on the screen, switch the gate mode to double gate, adjust the A gate to cut with the first echo, and adjust B gate to cut with the second echo, adjust the sound speed to make the value of sound path(S) be 100, now the sound speed value you get is the actual sound speed.

Calibration of probe zero point. Keep the testing status above, and change the gate mode to plus or minus, adjust the probe zero point to make the value of sound path (s) return to 100, now the zero point value is the actual zero point value.

Angle beam probe can be calibrated in many ways, not only by standard test blocks, it can also be done with a thickness known hole, theoretically, smaller of the reference reflector more accurate calibration you will get, however, it will be more difficult to do so. When calibrating with holes, we can do the calibration on angle by working out slope through measuring the depth and level position of hole, and with which processing the calibration of sound speed and probe zero point.

Application of DAC Curve

DAC curve is used for distinguishing the reflectors with the same size and different distance. Normally, in workpiece, reflectors with the same size and different distance cause change in amplitude because of the attenuation of material and pervasion of beam. The DAC curve compensate for attenuation of material, magnetic field influence, pervasion of beam and surface smoothness in the way of graph. Normally, the echo peak points are all located in the same DAC curve. And in the same way, the echo created by smaller reflectors will be located under this DAC curve, and the bigger one will be above the curve.

  1. Selection of detecting setting. Select the advanced function group by Page key and function key <F4>, adjust the detecting setting number, choose one as the current instrument setting, for example, N1, (Note: One group of DAC plotting points can be saved in one setting, and they are saved automatically, not needing any operation), if you want to save the parameter setting at the same time, turn to the operation “ADV” “SAVE”.
  2. Turning on DAC curve function. Select the DAC1 function group through Page key and function key <F2>, and then select the DAC curve function through S1 and up/down keys, (if the DAC curve function doesn’t lie in the current menu, please switch it by the key  or S1, plot the revision function), set the DAC curve switch by “←” or “→” key.
  3. Making DAC curve. Select the DAC1 function group through Page key and function key <F2>, Add plotting points, when two plotting points are finished, the DAC curve will be protracted automatically. (Note: Plot the points in the order of small to large according to the detecting range, and the echo height of latter one must not be higher than the fore one, otherwise, the DAC curve will be a beeli)
  4. Adjust the offset of the three offset curves. Select the DAC2 function group through Page key and function key <F3>, adjust the three offset curves viz. DAC-EL, DAC-SL and DAC-RL to proper settings.
  5. Compensation for surface roughness. Select the DAC2 function group through Page key and function key <F3>, adjust the gain correct menu to compensate for the surface roughness of work piece, for example, when 5 dB is needed, just adjust the gain correct to -5 dB, and now the three DAC curves will go down for 5 d
  6. The completed DAC curve:

DAC Curve

Contents of Measurement

To use the detector for measuring, carry out the following works: Set the start of gate, gate width, gate threshold and gate alarming way.

Contents of measurement are:

S             Pitch interval

H (%)    Relative value of echo height in gate range (relative to the screen height)

h             Absolute value (in pixel) of echo height in gate range

d             Depth of defect

D (%)      Relative value of defect depth (relative to job’s thickness)

P             Horizontal distance of the defect from the probe’s front edge

Where:

s:      Pitch interval;

d:   Depth of defect;

t:       Thickness of job;

x:      Distance of ultrasonic source to the probe’s front edge;

p:      Horizontal distance of the defect from the probe’s front edge;

D:     Is the relative value of defect depth, it is obtained by the following formula:

Communication for the Instrument

The instrument is equipped with bi-directional full duplex RS-232 and USB interface, can achieve communication with PC at up level and control the serial printer to print report on detection. Connect the instrument with PC’s serial port or USB interface, and enter into the special operation software Data View for the instrument at PC.

Connecting PC

RS232/USB connecting way: One end of the standard RS-232 serial cable connects with RS-232 interface of the instrument, another end with COM1 (or COM2) port of PC. The instrument will upload the images and data saved through RS-232 serial port to PC. The customer software installed on PC can edit, save or print the images and data.

Note:

  1. Before connecting or disconnecting RS-232 with/from the instrument or PC, please first turn off the instrumen
  2. During the communication, never remove the communication cable, turn off PC software just as you like, otherwise the communication will fail hence the instrument will not work.
  3. If any abnormality happens which results in failure in communication, please re-start the instrument.

Maintenance and Repairing

Requirement on Environment

Avoid serious bumping, heavy dust, damp, strong magnetic field and greasy dirt, etc. It is strictly forbidden to wipe the casing with any solvent substance.

Charging the Battery

The status sign for battery on ELD reflects in real time the condition of battery voltage. When the battery voltage is to low, i.e. when the status sign for battery on ELD becomes the sign of under   voltage, you have to charge the instrument as soon as possible.

The charging way is as follows (you can charge either with the instrument on or off):

  1. Insert the power plug of the power adaptor into the charging socket;
  2. Connect the power adaptor with 220 V/50 Hz local power supply, both the Charging indicator lamp (red) and rapid charging indicator lamp (green) light up;
  3. When the rapid charging indicator lamp (green) goes out, the battery is fully charged. In a normal case, you can charge full the battery in about 5 h.
  4. Pull off the charging plug, the charging ends.

Appendix

List of Operations

Figure Name Function
  Fn Press Fn key to select corresponding function group listed at the bottom, and all function items in this group will display at the right.
  Direction Press the key to select items in the function group.
 

Adjust parameters Press them to increase or decrease value of the parameters or select different selections, but Gain value should be adjusted by using dB+ and dB- specially.
  Confirm Press “Confirm” key for switch of multi-used function item. Primary or fine adjustment of function items (if available) can be selected via “Confirm” key.
  Gain + Press Gain + key to increase the gain by set step. Gain adjustment range is 0 dB ~110 dB.
  Gain – Press Gain – key to decrease the gain by set step. Gain adjustment range is 0 dB ~110 dB.
  Freezing During operation, press “Freezing” key to freeze the wave and data displayed on the screen. Press again for de-freezing.
  Gain step Press “Gain Step” key, the gain step will display 12.0 dB, 6.0 dB, 2.0 dB, 1.0 dB, 0.5 dB, 0.2 dB and 0 dB in cycle. Select suitable gain step for fast adjustment of gain.
  Freezing During operation, press “Freezing” key to freeze the wave and data displayed on the screen. Press again for de-freezing.
  Gate A Press “Gate A” key to switch to gate A menu quickly. Press this key continually to select Gate A start, Gate A width or Gate A height for adjustment of corresponding functions.
  Page Up/Page Down All function groups are arranged in different pages, press “Page Up/Page Down” key to go to expected page.
  Full Screen In ASCAN mode, press “Full Screen” key to select normal mode and amplified mode of display.
  Peak Memory Press “Peak Memory” key to enable/disenable peak memory.
  Save Press the key to save results of the test.
  Measure Display Press “Measure Display” key to select display method of measure result.
  Soft power switch Start/shutdown the machine.

+

Combined Key 1 1. Press “Combined Key 1” as start-up and loading of the program to restore ex-factory configuration.

2. To avoid accidents, change to current flaw detection parameters in the operation window, press “Combined Key 1” to lock the menu. Press “Combined Key 1” again to unlock.

+

 

Combined Key 2 1. Press “Combined Key 2” as start-up and loading of the program to enter communication status.

2. To avoid accident deletion of stored flaw detection curve in the operation window, press “Combined Key 2” to lock the curve. Press “Combined Key 2” again to unlock.

3. To avoid accident deletion of configuration of current setting in the operation window, press “Combined Key 2” to lock the setting. Press “Combined Key 2” again to unlock.

R Charge LED This LED (Green) illuminates during charging and goes off as charge ends.
A Alarm LED This LED (Red) illuminates to alarm.

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