GAOTek Leeb D Impact Device Used For Leeb Hardness Testers
This Product Leeb D Impact Device used for Leeb Hardness Testers has Measurement range of 150 – 950 HLD, and Impact energy or Test force 11 Nmm
Description
Description
Technical Specifications
| Main Scope of Application | Most commonly used probe. For the majority of applications. |
| Probe | 356 00 100 Leeb D Impact Device |
| Conversion Scales | HB, HV, HRA, HRB, HRC, HS, MPA (σ1, σ2, σ3) |
| Measurement Range | 150 to 950 HLD |
| Indenter | Tungsten Carbide |
| Impact Energy or Test Force | 11 Nmm |