Description
Features
- Magnetic induction method
- Very compact size with integrated probe
- Measurement of non-magnetic coatings on magnetic substrates
- Quick one-hand operation
- Place instrument on specimen and see the measured value
- Ready to measure immediately without calibration
- Easy to perform zero-point correction provides correct measurement results for measuring applications with little changes in shape and substrate material
- The one-point calibration function allows for an adaptation in cases of severe changes in shape or substrate material
- Data transmitting to PC via USB cable. Statistic function allows for evaluation of measurement series and display of the most significant characteristic statistical values
Technical Specifications
| Measuring Range | 0 μm to 1500 μm (0 mil to 60 mil) |
| Graduation | 0 μm to 999μm: 0.1μm, ≥1000 μm: 1μm |
| Accuracy | 0 μm to 100μm: ± 1.5 μm, 101 μm to 1500 μm ≤1.5% |