Description
Overview
GAOTek digital bridges LCR generators are high-precision component parameter analyzers that make use of the automatic balancing bridge principle. They feature a testing bandwidth of 10 Hz to 1 MHz, continuously adjustable frequencies, 0.05% of basic measuring accuracy, automatic level control, list scanning, and position counting. These generators can provide accurate and comprehensive measurements and analyses for most components and materials, so they are widely used in product R&D, component incoming inspections, and online product sorting.Â
Features
- 0.05% basic accuracyÂ
- A maximum of 200 time/s measuring speedÂ
- Frequency measurement range of 10 Hz to 1 MHz, Continuous adjustable, 1 mHZ step by stepÂ
- Amplitude of excitation signal 10 mV to 2 V adjustable,1 mV step by stepÂ
- Internal programmable DC bias voltage -2 V to +2 VÂ
- Support external dc bias voltage applied -60 V to +60 VÂ
- Support external current sourceÂ
- V,I testing signal monitoringÂ
- 10-point list scanning testingÂ
- 10 grade sorting and counting Â
- 100 groups of correcting data for specified frequenciesÂ
- Automatic range, manual rangeÂ
- 7 in (177.8 mm) LED display screen, English interfacesÂ
- USB, Ethernet, RS232, GPIB, Handler interfacesÂ
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Technical Specifications
Power voltage | 220 V AC or 50 Hz ±10%, |
Power consumption | < 20 WÂ |
Display | 7 in (177.8 mm) TFT LCD, resolution 800 pixels x 480 pixels |
Interfaces | LAN, RS232, GPIB, USB Host, USB Device and Handler |
Service environment | 32 °F to 104 °F (0 °C to 40 °C) |
Sizes | 12.9 in x 11.22 in x 5.35 in (330 mm x 285 mm x 136 mm)Â |
Weight | Â 7.93 lb (3.6 kg)Â |
Test signal frequency range | 10 Hz to100 kHz |
Frequency resolution, accuracy | Resolution: 1 mHz, Accuracy: 0.01%Â |
Test parameters | Cp-D, Cp-Q, Cp-G, Cp-Rp, Cs-D, Cs-Q, Cs-Rs, Lp-D, Lp-Q, Lp-G, Lp-Rp, Ls-D, Ls-Q, Ls-Rs, Rs-Xs, |Z|-θr, |Z|-θd, |Y|-θr, | Y|-θd, G-B |
Measuring display speed | Fast: 50 times/s (20 ms), Medium:10 times/s (100 ms), Slow: 1.25 times/s (800 ms)Â |
Custom measuring speed | Between 0.5 times/s to 200 times/s, can be set |
LCR parameter range | Cp, Cs: 0.001000 pF to 99.9999 F Lp, Ls: 0.001000 nH to 99.9999 kH Rp, Rs, |Z|, Xs: 0.001000 mΩ to 999.999 MΩ G, B, |Y|: 0.001000 μS to 999.999 kS θr: ± 0.000001rad to 3.14159 rad θd: ± 0.000001 deg to 179.9999 deg D: ± 0.000001 to 9.99999 Q: ± 0.001 to 99999.9 |
Test signal voltage range | 0 Vrms to 2 Vrms |
Voltage resolution, accuracy | Resolution: 1 mV, accuracy: 5% +5 mVÂ |
Test signal current range | 100 μArms to 20 mArms |
Current resolution, accuracy | Resolution: 10 μA, accuracy: 5% +50 μA |
DC bias voltage source | Internal: -2 V to +2 V voltage bias, -20 mAto +20 mA current bias External: -60 V to +60 V voltage bias |
Internal resistance of signal source | 30 Ohm or 100 Ohm, selectable |
Basic accuracy | 0.05%Â |
Display resolution | 6 1/2 digit |
Comparator | 9 groups of qualified setting, one group of unqualified setting, one group of auxiliary setting |
Triggered mode | Internal, External, manual, bus |
Mathematical operations | Delta (absolute value), Delta% (percentage), Direct reading |
Calibration function | Self-calibration, open circuit, short circuit, load, 100 groups of customized frequency point |
List scanning | 10-point list scanning testing |
Storage device | Internal/USB storage device |