Description
Overview
GAOTek high resolution flaw detector has imaging and advanced visualization capabilities, backed by its high image quality enables you to complete your inspection with greater confidence.
Features
- Incredible portability
- Lightweight and compact
- Portable, quick-change batteries
- Utilization of channel groups
- Thickness measurements
Technical Specifications
| Power Supply | 12 V, 5 A |
| Batteries | Li ion, Size 0.73 in x 2.72 in (18.5 mm x 69mm), 0.11 lb (48 g) x 6 |
| Operation time | up to 4 hr |
| Display | 7 in (177.8 mm) Monitor (1024 pixels x 600 pixels) |
| Storage | 32 GB |
| USB Port | USB xl |
| Probe Port | IPEX PA Connector xl |
| UT Port | Lemo 00 UT Connector x 2 |
| Encoder Port | 2-axis Encoder input |
| Operating temperature | 32 °F to 140 °F (0 ℃ to 60 ℃) |
| Storage Temperature Range | -4 °F to 176 °F (-20 ℃ to 80 ℃) |
| Effective Digitizing | 100 MHz |
| Max PRF | 300 kHz |
| Refresh Rate | 30 Hz |
| A-scan Height | 300% |
| PALIT Channel Configurations | 16:64 PR |
| Scan type | Linear. Sectorial, Conventional, TOFD |
| Focal Law | Unlimited |
| Channel Group | Up to 4 |
| Focusing mode | True-depth, Sound path |
| Maximum Number of A-scan Data Point | Up to 16384 |
| Rectification | RF, Full wave |
| Filtering | Selection of low-pass, Band-pass, High-pass |
| Video Filtering | Smoothing |
| TFM Raw Data Export | Yes |
| Voltage | 25 V to 160 V (5 V step) |
| Pulse Width | 50 ns to 2,000 ns |
| Gain Range | 0 dB to 90 dB |
| Band Width | 0.5 MHz to 20 MHz |
| Sample Resolution | 16 bits |
| Pulse Shape | Bipolar Pulse |
| Dynamic Sample Focusing | Yes |
| Dimensions | 8.42 in x 5.51 in x 2.95 in(214 mm x 140 mm x 75 mm) (With case) |
| Weight (With Battery x 6) | (3.31 lb) (1.5 kg) (With Battery) /(2.65 lb) (1.2 kg) (Without Battery) |