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GAOTek Dual-Wavelength UV-Vi’s Spectrophotometer

GAOTek High Quality Direct Reading Spectrometer Analysis Instrument

GAOTek High Quality Direct Reading Spectrometer Analysis Instrument is a smart, simple operate and high precise spectrophotometer.

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SKU: GAOTek-SA-181 Category:
Description

Description

Overview

GAOTek High Quality Direct Reading Spectrometer Analysis Instrument is a smart, simple operate and high precise spectrophotometer. It adopts 7 inches touch screen, full wavelength range, and an Android operate system. Illumination: reflectance D/8° and transmittance D/0° (UV included / UV excluded), high accuracy for color measurement, large storage memory, PC software, because of above advantages, it is used in laboratory for color analysis and communication.

 

Features

  • Adopts reflectance D/8° and transmittance D/0° geometry to measure both opaque and transparent materials.
  • Dual Optical PathsSpectrum Analysis Technology
  • Compatible with SCI/SCE measurement, Support SCI+SCE Measurement
  • Rotatable Touch Screen with Android Operate System
  • Open Transmittance Measurement Area, no limit on sample size
  • Different Kinds of Accessories for simple measurement
  • Accessory Drawer to Protect and Store Accessories
  • Switchable Reflectance Apertures
  • Four Kinds of UV Test Modes for Fluorescence Material Measurement

 

Technical Specifications

lamination/ Viewing System Reflection: d/8 (Diffused illumination, 8-degree viewing)
Simultaneous measurement of SCI/SCE (ISO7724/1, CIE No.15, ASTM E1164, ASTM-D1003-07, DIN5033 Teil7, JIS Z8722 Condition C standard)
Transmittance d/0 (Diffused illumination, 0-degree viewing)
Sensor Silicon Photodiode Array
Grating Method Concave Grating
Sphere Diameter 152 mm
Wavelength 360 nm to 780 nm
Wavelength Pitch 10 nm
Half Band Width 5 nm
Reflectance Range
Resolution		 0 % to 200 %
0.01 %
Light Source Pulse Xenon Lamp and LED
UV Measurement Include UV, 400 nm cut, 420 nm cut, 460 nm cut
Measurement Time SCI/SCE < 2 s
SCI+SCE < 4 s
Measurement Aperture Reflectance: XLAV Φ 30 mm, LAV 18 mm, MAV Φ 11 mm, SAV Φ 6 mm
Transmittance: Φ 25 mm (Auto aperture size recognition)
Transmittance Sample Size No limit on sample width and height, thickness ≤ 50 mm
Repeatability XLAV Spectrum Reflectance or Transmittance: standard deviation within 0.1 %
XLAV Chromaticity value: Standard deviation within ΔE*ab 0.015 * When a white calibration plate is measured 30 x at 5-second intervals after white calibration
Inter-Instrument Agreement XLAV ΔE x ab 0.15 (BCRA Series II, Average measurement of 12 tiles, at 23 °C)
Illuminants A, C, D 50, D 55, D 65, D 75, F 1, F 2, F 3, F 4, F 5, F 6, F 7, F 8, F 9, F 10, F 11, F 12
CWF, U 30, DLF, NBF, TL 83, TL 84
Language English, Russian, Spanish, Portuguese, Japanese, Thai, Korean, German, French, Polish, Chinese (simple and traditional),
Display Reflectance and Transmittance graph or value, color value, color difference values, pass or fail, color simulation, color assessment, haze, liquid chromaticity values, color tendency
Viewing Angles 2° and 10°
Color Difference ΔE x ab, ΔE x CH, ΔE x uV, ΔE x cmc, ΔE x 94, ΔE x 00, ΔE x ab(hunter),555 shade sort
Storage Memory 8 GB U Disk for data storage and transfer
Screen Size 7 Inches Touch Screen
Power 12 V / 3 A
Operate Temperature 40 °F to 104 °F (5 °C to 40 °C),

relative humidity 80 % (at 95 °F or 35 °C) no condensation
Storage Temperature -4 °F to 113 °F (-20 °C to 45 °C),

relative humidity 80 % (at 95 °F or 35 °C) no condensation
Interface USB, USB – B and RS – 232
Instrument Size 18.3 in x 9.4 in x 10.2 in (465 mm x 240 mm x 260 mm)
Weight 23.8 lb (10.8 kg)
Other Function 1. Camera to view measurement area;
2. Support horizontal, vertical and downward measurement method (need optional accessories to support for downward measurement);
3. Auto humidity and temperature compensation function.

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