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GAOTek Metal Material Flaw Crack Detector

GAOTek Multifunctional Intelligent Digital Crack Detector

GAOTek crack detector multifunctional intelligent digital is the device that utilizes eddy current testing, a non-destructive testing technique that relies on electromagnetic induction.

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SKU: GAOTek-CRD-123 Categories: , , ,
Description

Description

Overview

GAOTek crack detector multifunctional intelligent digital is the device that utilizes eddy current testing, a non-destructive testing technique that relies on electromagnetic induction. It generates eddy currents in the metal surface and measures the resulting changes to identify cracks, defects, or material variations. Specialized device used for non-destructive testing (NDT) and evaluation of metal components. It employs eddy current testing principles to detect cracks, defects, and variations in material properties.

 

Features

  • Digitalization, intelligence, and high integration
  • The system integrates an independent 1 to 8 channels
  • With powerful detection function
  • Good stability, high sex to noise ratio
  • It can expand a variety of practical applications
  • The instrument is easy to operate, reasonable, intuitive, flexible configuration of various detection functions
  • Wider frequency can detect any solid metal workpiece
  • Optional 8 frequency material sorting module
  • Customized multi-language package

 

Technical Specifications

Customized Support  OEM, ODM
Power  Electronic
Material Sound Velocity  1 000 M to 9999 M
Frequency Range  0.4 mhz to 10 mhz (wide band) 133 10 mhz (bandpass)
Gain Range  01 dB to 10 dB (step. 1 dB, 1 dB)
Delay Range  0 in to 236.22 in (0 cm to 600 cm)
K Value Range  20 to 500
Inhibition Range  0% to 50%
Increment  0 dB to 20 dB
Quantitative Line  -20 dB to 20 d8
Scrap Line  -20 dB to 20 dB
Vertical Linearity  <3% measured by technical inspection bureau 17%
Horizontal Linearity  <0.3% measured by technical inspection bureau 0%
Transmitting Power Supply Voltage  DC 200 V
Transmit Pulse Width  Pulse square wave. 050.6 us adjustable (step o.01 us)
Transmitting Pulse Internal Resistance  Not more than 10 Q
Transmit Repetition Rate  25 Hz in 400 Hz Sound path<150 μ S
400 Hz /200 Hz FAST/SLOW
150 μS 300 μ S 100 Hz /50 HZ FAST/SLOW
Sound path > 600 μs
50 Hz /25 Hz FAST/SLOW
Probe Damping Resistance about 120 Q fixed
Amplifier Input Gain 0 dB，100% About 50 V peak at screen brightness
Input noise is about 50 μ V peak bandwidth noise is about 16 nv I Hz peak
Digital Sampling 8 bit real-time 50 MHz, equivalent to 200 MHz (Hardware Implementation)
Display Mode Detection + detection full wave
Display Device TFT industrial color LCRD, LED backlight
LCRD Refresh Frequency 50 Hz
Sluice Gate Inlet gate and loss gate, adjustable
Dynamic Range >32 dB measured by technical inspection bureau 38 dB
Sensitivity Margin >58 dB (related to probe) measured by technical inspection bureau for 66 d
Resolving Power >26 dB (probe related)