Description
Overview
GAOTek precision digital LCR tester possesses a higher test speed, a more comprehensive analysis function and friendly human-computer interactive experience by adopting the latest high-speed processor and a new software system. Well-designed measuring circuit and optimized algorithms further enhance the test stability of low-D capacitance and high-Q inductors. The instrument is provided with 10 V AC test level, 10 V or 100 mA bias current and standalone 10 V or 50 mA DC current, making it convenient for applying in the test of all kinds of active or passive devices. Main or sub parameters display, enhanced display system design, 150-points list sweep and graphical analysis capabilities of multiple parameters meet the most application requirements of customers. Thanks to the application of a new generation of processors, the instrument has a more powerful data processing capability. The test results can be easily stored on the U disk or uploaded to the upper PC or network through multiple interfaces, promoting test automation and test efficiency. The test frequency is 20 Hz to 300 KHz, 20 Hz to 500 KHz and 20 Hz to 1 MHz. The instrument has a test accuracy of 0.05% and highest test speed of 9 ms/time. Being equipped with multiple interfaces of HANDLER, USB, LAN, RS232C, DCI, GPIB (option) as well as rich resources, the instrument will bring excellent cost performance experience for customers. It is completely appropriate for test requirements of all kinds of industrial and military standards.
Technical Specifications
| Frequency of test signal | 20 Hz to 1 MHz | ||
| Minimum resolution | 1 MHz, 5-digit frequency input | ||
| Accuracy | 0.01% | ||
| Display | 800 × RGB × 480, 7 in (17.78 cm) TFT LCD display | ||
| AC Level | Voltage range of test signal | 5 mV to 10 VRMS | |
| Minimum resolution of voltage | 100 μV, 3-digit input | ||
| Accuracy | ALC ON | 10% x set voltage + 2 mV | |
| ALC OFF | 6% x set voltage + 2 mV | ||
| Current range of test signal | 50 μA to 100 mA | ||
| Minimum resolution of current | 1 μA, 3-digit input | ||
| Accuracy | ALC ON | 10% x set current + 20 μA | |
| ALC OFF | 6% x set voltage + 20 μA | ||
| DC bias voltage source | Voltage or Current range | 0 V to ±10 V or 0 mA to ±100 mA | |
| Resolution | 0.5 mV or 5 μA | ||
| Voltage accuracy | 1% x set voltage + 5 mV | ||
| ISO ON | Be used for the bias test of inductance and transformer | ||
| AC Source impedance | ISO ON | 100 Ω | |
| ISO OFF | 30 Ω, 50 Ω, 100 Ω selectable | ||
| DCR Source impedance | 30 Ω, 50 Ω, 100 Ω selectable | ||
| DC Independent voltage source | Voltage or current range | 0 V to ±10 V or 0 mA to ±50 mA | |
| Resolution | 0.5 mV or 5 μA | ||
| Voltage accuracy | 1% x set voltage + 5 mV | ||
| Output resistance | 100 Ω | ||
| Test parameters of LCR | |Z|, Y|, C, L, X, B, R, G, D, Q, θ, DCR, Vdc to Idc | ||
| Parameter display of test page | Two sets of main or sub parameters, the second set can be set as ON or OFFThere can be 10 pages of list sweep and 15 points per page at most Multiple parameters continuous sweep graphical analysis. |
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| Basic accuracy | LCR test parameter | 0.05% | |
| Calibration | Warm-up time less than 30 secondsSignal voltage: 0.3 VRMS to 1 VRMS
Zeroing: After OPEN or SHORT |
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| Display range of LCR parameter | Z, R, X, DCR | 0.00001 Ω to 99.99 MΩ | |
| |Y|, G, B | 0.00001 μs to 99.99 s | ||
| C | 0.00001 pF to 9.99 F | ||
| L | 0.00001 μH to 99.99 kH | ||
| D | 0.00001 to 9.99 | ||
| Q | 0.00001 to 99999.9 | ||
| θ(DEG) | -179.99º to 179.99º | ||
| θ(RAD) | -3.14 to 3.14 | ||
| Δ% | -999.99% to 999.99% | ||
| Equivalent circuit | Serial, Parallel | ||
| Range mode | Auto, Hold | ||
| Trigger mode | Internal, Manual, External, Bus | ||
| Average times | 1 to 256 | ||
| Calibration function | Open, short calibration with full frequency or dot frequency, Load | ||
| Math operation | Direct reading, ΔABS, Δ% | ||
| Delay time setup | 0 to 999, minimum resolution: 100 us | ||
| Comparator | 10-bin sorting, BIN1-BIN9, NG, AUX | ||
| Bin counter | |||
| PASS or FAIL on front panel, LED indication | |||
| List sweep | 201-point list sweep functionList sweep of frequency, AC voltage or current, internal or external DC bias voltage or current and independent DC source voltage can be performed on each page Each sweep point can be sorted separately |
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| Graphical analysis | Graph scanning and analysis of frequency, AC level and DC bias can be performedSet the sweep start point, end point and each sweep point display the maximum value, minimum value and read any of the chosen sweep point scanning graphs can be stored into internal or external USB memory | ||
| Internal nonvolatile memory | 100 sets of LCRZ setting files memory 201 times test results 10 sets of GIF image, CSV data files | ||
| External USB memory | GIF image, CSV data filesLCRZ setting files memory
Test data can be stored via USB |
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