Description
Overview
GAOTek portable PTN/IP RAN Tester is specially designed for field testing in PTN/IP RAN bearer network. It can measure, analyze and evaluate the transmission quality, performance, and the clock synchronization of the IP bearer network. It provides reliable test data for the opening and maintenance of bearer network, to guarantee the stability of 2G/3G/4G mobile backhaul network. It is widely applicable in the opening, check and acceptance, and commissioning, troubleshooting, daily maintenance in the mobile system.
Key Features
- Ergonomic and creative design, easy to carry around, especially for field testing.
- 5 inches LCD color touchscreen, smart menu-driven operations.
- Results can be shown graphically and numerically.
- Cover/joint protection, with hand rope & kickstand provided for different test fields.
- Perfect combination of TDM, Ethernet, and Clock Synchronization measurements.
- Dual independent ports in Ethernet testing, with multiple test modes.
- Large storage capability of settings and results.
- Auto power save function.
- Print test report in A4 format with TestManagerPro.
- Upgrading embedded software for free.
Technical Specifications
| Ethernet Testing | ||
| Test Interface | Dual RJ-45 ports,10/100/1000 BASE-T
Dual SFP ports, 1000 BASE-SX/LX/ZX |
|
| Mode | Full Duplex | |
| TDM (E1) testing | ||
| Line Interface | 75Ω (Unbalance), 120Ω (Balance) | |
| Clock synchronization testing | ||
| TIE Resolution | 0.1ns | |
| Standards | Ethernet testing | IEEE 802.3, RFC-1242, RFC-2544, Y.1564, G.8261 |
| TDM (E1) testing | Pulse mask : Comply with ITU-T G.703
Jitter test : ITU-TÂ O.171, O.172 |
|
| Clock synchronization testing | ITU-TÂ G.812, G.813, G.8262 | |
| Communication Ports | USB, Ethernet RJ-45 ports | |
| External Clock Reference | 10 MHz-TTL, 10 MHz-SIN | |
| Battery | Li-ion battery (rechargeable) | |
| Power Supply | AC charger | |
| Operating System | Windows XP/ 2003/Vista/Win7 | |
| PC Software | TestManagerPro | |
| Dimension | 9.17 in x 4.33 in x 2.52 in (233 mm x 110 mm x 64 mm) | |
| Humidity | 5 % to 95 % (non-condensing) | |
| Weight | 1.76 lbs (0.8 kg) – approximately | |
| Storage Temperature | -22 ËšF to 158 ËšF (-30 ËšC to + 70 ËšC) | |
| Operating Temperature | 32 ËšF to 113 ËšF (0 ËšC to 45 ËšC) | |
Ordering Information:
| GAO A0060003 | GAOTek PTN/IP RAN Tester |
| Option 1 | Jitter Testing |
| Option 2
|
2MHz Clock Synchronization Testing |
| Option 3
|
SyncE Clock Synchronization Testing |
Standard Configurations:
PTN/IP RAN Tester – 1 set
E1 75Ω -2 pcs
E1 120Ω Balance Test Cable -1 pcs
Double E1 Balance Test Cable -1 pcs
LAN test Cable -2 pcs
Master-slave USB cable -1 pcs
Charger -1 pcs
Li-ion rechargeable Battery (Built-in) -1 pcs
Software Setup CD -1 pcs
User Guide -1 pcs
Waterproof carrying Case -1 pcs
Annex (Option)
Annex 1….. 1000 BASE-SX module (MM 850 nm)
Annex 2……1000 BASE-LX module (SM 1301 nm)
Annex 3…….1000 BASE-ZX module (SM 1550 nm)
Annex 4……..Patch cord I (Single mode)
Annex 5……..patch cord II (Multi-mode)
Ethernet Testing
- Support 10/100/1000 M dual electrical ports (RJ-45) and dual optical ports (SFP)
- Full RFC-2544 benchmark test: throughput, frame loss rate, latency, back-to-back
- Support Y.1564 test, including Service Configuration test and Service Performance test
- 8 and 128 multi-streams traffic generator
- Supports frame length, frame type, and utilization statistics under through/terminal mode
- Traffic filtration statistic at the receiver end
- Layer1, layer2, layer3 BER test, error injection and results statistics
- Service Disruption Time test
- Smart loopback
- Supports VLAN, Q-in-Q tag and DHCP
- Connectivity test: PING, TRACE ROUTE, ARP SCAN, etc.
- Cable VCT: capable of identifying short circuit, open circuit, cable length fault location, etc.
- Provides test tools like blink port, sniff frame, loop back, etc.
TDM (E1) Testing
- Out-of-service framed and unframed testing.
- In-service framed and unframed testing.
- Hi-Z and through mode BER testing.
- Timeslot activity monitoring.
- APS & Round Trip delay measurement.
- Jitter generation and Jitter measurement (Option).
- Wander measurement.
- Error insertion: Single, Fixed Rate and off.
- Frequency, Offset and Level measurements.
- Transmit clock deviation up to ±999ppm.
- Pulse Mask Measurement.
- Pulse level real-time measurement.
- Performance analysis in accordance with G.821, G.826, and M.2100.
| Error analysis | G.8261 |
| Internal Clock | 2048 Kb/s ± 1ppm |
| Frequency Deviation | ±100 ppm |
| Line Interfaces | High Input Impedance>2 KW |
| Line Code | HDB3, AMI |
| Receiving Sensitivity | > -43dB |
| Tx Clock Source | Internal, Interface |
| Pulse Mask Measurement | Comply with G.703 |
| Jitter Generation | |
| Amplitude | 0~30 UI |
| Frequency | 20 KHz ~100 KHz |
| Accuracy | 0.05 UI |
| Jitter Measurement | |
| Amplitude | 0~30 UI |
| Frequency | 20~100 KHz |
| Accuracy | 0.01UI |
| Filter | all pass, 18 KHz-100 KHz, 20 Hz-100 KHz |
| Frequency Measurement | |
| Accuracy | ±1Hz |
| Offset Measurement | |
| Accuracy | ±1 ppm |
| Range | -999 ppm ~ +999 ppm |
| Delay Measurement | |
| Accuracy | ±1μs |
 Test patterns:
- PRBS: 2 23 -1, 2 20 -1, 2 15 -1, 2 11 -1, 2 9 -1, 2 6 -1.
- Fixed Code: 1111, 0000, and 1010.
- 16-BIT: User Programmable Word.
Error Insertion
- Type: BIT, FAS, CODE, CRC4, E-BIT Single, OFF.
- Fixed Rate: 10-2 , 10-3 , 10-4 , 10-5 , 10-6 , 10-7
Clock Synchronization Testing (Option)
- E1 jitter tolerance, max output jitter, jitter transfer E1/SyncE clock wander test, TIE, MTIE, TDEV analysis E1/ SyncE clock frequency accuracy test
- Connect external clock reference source
 Other Functions
- Manual, Auto-timer measurements.
- Beeper, LED alarm and indication.
- Settings and test results can be saved inside or to flash memory directly.
- Large capability of built-in battery, continuous working for 6~8 hours.
- Provide TestManagerPro software for uploading, analyzing, filing, and printing with PC.