GAOTek Short Wavelength Infrared Camera
GAOTek short wavelength infrared camera is a newly developed thermal camera especially suited for temperature measurements of metals, as these exhibit a distinctly higher emissivity at the short measurement wavelength than at measurements in the previously conventional wavelength range.
Description
Overview
GAOTek short wavelength infrared camera is a newly developed thermal camera especially suited for temperature measurements of metals, as these exhibit a distinctly higher emissivity at the short measurement wavelength than at measurements in the previously conventional wavelength range. In parallel with the visualization of a thermal process, the high-performance sensor electronics allow a short reaction time of 1ms for the displaying of the temperature information of the center pixel.
Features
- High dynamic CMOS detector with up to 764 x 480 pixels resolution
- Wide measurement ranges from 842 °F to 3272 °F (450 °C to 1800 °C) without sub-ranges
- Up to 1 kHz frame rate for fast processes
- Real-time analog output with 1 ms response time
- Extensive software package and SDK included
- 1 kHz line scanning function possible
- Software and I/O interface included
- USB 2.0 interface
Technical Specification
| High Speed Analog Output (At 1 Khz Mode) | 0 V to 10 V real time output of the center pixel (1 ms response time) |
| Standard Process Interface | 0 V to 10 V input, <24 V digital input, 0 V to 10 V output |
| Relative Humidity | 20 % to 80 %, non-condensing |
| Tripod Mount | ¼ 20 UNC |
| Thermal Sensitivity | -459.65 °F (-273.14 °C) |
| Ambient Temperature | 41 °F to 122 °F (5 °C to 50 °C) |
| Storage Temperature | -40 °F to 158 °F (-40 °C to 70 °C) |
| Detector | CMOS 590.55 µin x 590.55 µin (15 µm x 15 µm) |
| Spectral Range | 33.46 µin to 43.30 µin (0.85 µm to 1.1 µm) |