GAOTek Multifunctional Intelligent Digital Crack Detector
GAOTek crack detector multifunctional intelligent digital is the device that utilizes eddy current testing, a non-destructive testing technique that relies on electromagnetic induction.
Description
Description
Overview
GAOTek crack detector multifunctional intelligent digital is the device that utilizes eddy current testing, a non-destructive testing technique that relies on electromagnetic induction. It generates eddy currents in the metal surface and measures the resulting changes to identify cracks, defects, or material variations. Specialized device used for non-destructive testing (NDT) and evaluation of metal components. It employs eddy current testing principles to detect cracks, defects, and variations in material properties.
Features
- Digitalization, intelligence, and high integration
- The system integrates an independent 1 to 8 channels
- With powerful detection function
- Good stability, high sex to noise ratio
- It can expand a variety of practical applications
- The instrument is easy to operate, reasonable, intuitive, flexible configuration of various detection functions
- Wider frequency can detect any solid metal workpiece
- Optional 8 frequency material sorting module
- Customized multi-language package
Technical Specifications
| Customized Support | Â OEM, ODM |
| Power | Â Electronic |
| Material Sound Velocity | Â 1Â 000 M to 9999 M |
| Frequency Range | Â 0.4 mhz to 10 mhz (wide band) 133 10 mhz (bandpass) |
| Gain Range | Â 01 dB to 10 dB (step. 1 dB, 1 dB) |
| Delay Range | Â 0 in to 236.22 in (0 cm to 600 cm) |
| K Value Range | Â 20 to 500 |
| Inhibition Range | Â 0% to 50% |
| Increment | Â 0 dB to 20 dB |
| Quantitative Line | Â -20 dB to 20 d8 |
| Scrap Line | Â -20 dB to 20 dB |
| Vertical Linearity | Â <3% measured by technical inspection bureau 17% |
| Horizontal Linearity | Â <0.3% measured by technical inspection bureau 0% |
| Transmitting Power Supply Voltage | Â DC 200 V |
| Transmit Pulse Width | Â Pulse square wave. 050.6 us adjustable (step o.01 us) |
| Transmitting Pulse Internal Resistance | Â Not more than 10 Q |
| Transmit Repetition Rate |  25 Hz in 400 Hz Sound path<150 μ S 400 Hz /200 Hz FAST/SLOW 150 μS 300 μ S 100 Hz /50 HZ FAST/SLOW Sound path > 600 μs 50 Hz /25 Hz FAST/SLOW |
| Probe Damping Resistance | about 120 Q fixed |
| Amplifier Input | Gain 0 dB，100% About 50 V peak at screen brightness Input noise is about 50 μ V peak bandwidth noise is about 16 nv I Hz peak |
| Digital Sampling | 8 bit real-time 50 MHz, equivalent to 200 MHz (Hardware Implementation) |
| Display Mode | Detection + detection full wave |
| Display Device | TFT industrial color LCRD, LED backlight |
| LCRD Refresh Frequency | 50 Hz |
| Sluice Gate | Inlet gate and loss gate, adjustable |
| Dynamic Range | >32 dB measured by technical inspection bureau 38 dB |
| Sensitivity Margin | >58 dB (related to probe) measured by technical inspection bureau for 66 d |
| Resolving Power | >26 dB (probe related) |