Description
Overview
GAOTek Flaw Detector with Auto Calibration (Spheroidization Rate) is a high speed flaw detector to locate, evaluate, and diagnose various defects with 28 DGS curves. This instrument has the embedded software within it which is very useful to update the status online. Spheroidization rate measurement is one of its best features and continuously works with the time of upto 12 hours. It complies with 14 standards of DAC. It is used as active safety inspection and service life evaluation in aerospace, railway transportation and boiler pressure vessels.
Key Features
- Automated calibration of transducer Zero Offset and/or Velocity
- Automated gain, Peak Hold and Peak Memory
- Automated display precise flaw location(Depth d, level p, distance s, amplitude, size dB,
- Automated switch three staff gauge ((Depth d, level p, distance s)
- 500 independent set-up, any criterion can be input freely, we can work in the scene
- without test block
- Big memory of 1000 A graph
- Gate and DAC alarm, Acoustic-Optical alarm
- USB port, communication with pc is easy
- The embedded software can be online updated
- Li battery, continue working time up to 12 hours
- Display freeze
- Automated echo degree
- Angles and K-value
- Lock and unlock function of system parameters
- AWS D1.1
- Dormancy and screen savers
- Electronic clock calendar
- There are 14 standards of DAC.
- Automated make video of test process and play Connect the USB Disk, the length of video is unlimited
- Two gates setting and alarm indication
- High-speed capture and very low noise
- DAC, AVG, TCG, B Scan, Solid plastic housing (IP65)
- Automated calculation of the size of the flaw with wide bottom type in AVG function
6 dB DAC functions - Provides high contrast viewing of the waveform from bright, direct sunlight to complete darkness and easy to read from all angles
- Powerful PC software and reports can be export to excel
Technical Specifications
Scanning Range | 0 in to 393 in (0 mm to 10000 mm) |
D-Delay | -20 ms to +3400 ms |
P-Delay | 0.0 ms to 99.99 ms |
MTLVEL | 1000 ms to 15000 ms |
Working Mode | Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe) |
Frequency Range | 0.5 MHz to 20MHz |
Gain Adjustment | 0 dB to 130 dB |
Reject | 0 % to 80 % of screen height, step: 1 % |
Vertical Linear Error | Vertical linear error is not more than 3 % |
Horizontal Linear Error | Not more than 0.2 % in the scanning range |
Sensitivity Leavings | ≥62 dB |
Dynamic Range | ≥34 dB |
Alarm | Three modes, i.e. forbidden wave, loss wave and auto |
A-Scan Display Area | Full screen or local
A-Scan display freezing and de-freezing A-Scan filling |
Data Save | 1000 A-Scan images (including setting of instrument) |
Standard Communication interface with PC | USB |
Measuring Unit | Inches/mm |
Battery | Li battery 7.4V 4800 mAh |
Power Adaptor | Input 100V to 240 V/50 Hz to 60 Hz
Output 9 VDC/1.5A |
Working Temperature | -4 °F to 122 °F (-20 °C to 50 °C) |
Working Humidity | 20 % to 90 % |
Dimension | 1.96 in x 6.29 in x 9.37 in ( 50 mm × 160 mm × 238 mm) |
Weight | 2.20 lbs (1.0 kg) |
Additional Information
Designation of the Instrument’s Components
How to Use:
Get ready the job;
Insert the probe plug into the probe socket of the host, rotate tightly the locking nut;
Press , turn on the instrument;
It will carry out self-test;
In normal case, when you turn on the unit, it will automatically enter into the status that it is in during last turning off. The instrument parameters are consistent with last turning off, but the waveform during last turning off will not display.
Check voltage of the battery; if the power monitor shows that the voltage is low, it will turn off automatically 1 min after alarming bell.
According to your application, ten independence setups can be applied, any criterion can be input freely, and we can work in the scene without test block.
Measure;
Save the results, big memory of 1000 A graphs.
Turn off the instrument;
Description about Screen Display
Three Display Modes of the instrument
- A-scan at normal mode
A-scan at Enlarged mode
You can activate Enlarge mode by . The gain and selected dB step value will be always displayed on the screen. And at the same time, all other functions are locked.
Manual B-scanning
Functions & Operations:
Adjustment of BASE Group
In the BASE functional group, users can adjust and set the functional items relative with the display range, including RANGE, MTLVEL, D-DELAY and T-VALUE.
During the detection, the display range of screen is in great relation to the material of work piece and probe’s nature. The work piece material will influence the transmission velocity of ultrasonic wave.
Display starting point (D-DELAY)
It can set the pulse shift during detection, viz. D delay. By which, users are allowed to adjust the starting position for waveform, as well as adjusting the zero point of pulse, so as to make sure that it is at the surface or a starting face inside the work piece. If the pulse has to be started from the surface of work piece, D delay must be set to 0.
Range: -20 µs to 3400 µs
Step: 0.1µs
Operation:
Select BASE functional group by < range > key, and by up/down key, select the functional menu for T-VALUE, and then adjust parameters for T-VALUE by the rotary knob.
Users can shift the Rough and Fine adjusting mode by the <Enter> key.
Adjustment of PROBE Group
With this functional group, it is allowed to adjust and set the functional items in relation to ultrasonic sending and receiving, including PROBE TYPE/ PROBE POS, ANGLE/K-VALUE, P-DELAY/ X-VALUE, X-COORD/ PART DIA
PROBE TYPE/ PROBE POS
This menu is multipurpose for setting probe type and probe pos, by the <Enter> key, shift between probe type and probe pos.
PROBE TYPE:
If the current probe is an echo probe, then set it to single; if it is a double-wafer probe, set it to DUAL, and if it is a through transmission probe, set it to THRU.
Options: STRAIGHT: Single straight element transducers. Use connector acts as a transmitter (T)
ANGLE: Angle straight element transducers. Use connector acts as a transmitter (T)
DUAL: Dual element transducers. One connector acts as a transmitter (T), the other acts as a receiver (R).
THRU: Two separate transducers, typically on opposite sides of the test specimen. Use the T transducer connector as the transmitter. The R transducer connector is designated as the receiver.
Operation procedure:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for PROBE TYPE, and then adjust parameters for PROBE TYPE by the rotary knob.
PROBE POS:
Select position of probe when we detect a pipe.
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for PROBE POS, and then adjust parameters for PROBE POS by the rotary knob.
Probe Angle (ANGLE)/Probe K Value (K-VALUE)
This menu is multipurpose for setting probe angle and probe k value. By the <Enter> key, shift between ANGLE and K-VALUE.
ANGLE:
It is to adjust the angle of a probe.
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for ANGLE, and then adjust parameters for ANGLE by the rotary knob.
K-VALUE:
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for K-VALUE, and then adjust parameters for K-VALUE by the rotary knob.
P-DELAY/ X-VALUE
This menu is multipurpose for setting p-delay and x-value. By the <Enter> key, shift between P-DELAY and X-VALUE.
P-DELAY:
It can set the zero point of probe during detection, viz. P Delay. It is necessary to compensate the delay in probe resulted from acoustic beam in the pitch interval from energy exchanger to work piece by P Delay.
Range: 0 µs to 99.99 µs
Step graduation: 0.01 µs
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for P-DELAY, and then adjust parameters for P-DELAY by the rotary knob.
X-VALUE:
It is to set the front edge of probe.
Range: 0.00 in to 1.96 in (0 mm to 50 mm)
Step: 0.00.39 inches (0.1 mm)
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for X-VALUE, and then adjust parameters for X-VALUE by the rotary knob.
X-COORD/ PART DIA
This menu is multipurpose for setting X-COORD and PART DIA, by the <Enter>key, shifts between X-COORD and PART DIA.
X-COORD:
Coordinate mode means the definition of the horizontal coordinate line, including “S-PATH” “P-VAL” and “DEPTH”, when the refraction angle is not zero, the function above is effective, when it is zero, and the coordinate is defined as S-PATH.
Options: S-PATH, P-VAL, DEPTH
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for X-COORD, and then adjust parameters for X-COORD by the rotary knob.
PART DIA:
When we detect a pipe, we must input the outside diameter of part and thickness exactly. Part diameter is the outside diameter of pipe.
Operation:
Select PROBE functional group By < Probe > key, and by up/down key, select the functional menu for PART DIA, and then adjust parameters for PART DIA by the rotary knob.
Function group MEM (DATA NO.)
It is for setting the MEM group no. after selecting the functional menu for Group No.
Parameter range: For waveform save, 0 to 999
MEM mode: waveform
Operation:
By <Next Page > key switch the function page.
By Left/Right key select MEM functional group, and by Up/Down key, select the functional menu for DATA NO, and then set group no. by the rotary knob.
Adjustment of GATE Group
It is used for adjustment of gate settings, including Gate logic, Gate alarm, Gate start, Gate width and Gate height.
Functions of gate during detection:
To monitor whether the job has flaws in the set logic and range, if yes, it will alarm.
To measure the position and size of flaw echo
It is equipped with double-gate function: Gate A and Gate B, normally Gate A is used alone for detecting the work piece flaw, and the double-gate is usually used in the measuring and calibration of multi-echo.
This functional menu is multipurpose for Width of Gate A and Gate B, when this menu is selected, by the <Enter > key, you can shift the two functions.
Response and measurement threshold (a THRESH/bTHRESH)
This functional menu is multipurpose for Threshold of Gate A and Gate B, when this menu is selected, by the <Enter > key, you can shift the two functions.
Calibration of straight probe (CSBT)
For the convenience of user’s calibration of probe zero point and sound speed of material, the function of calibration is built in the gauge.
Calibration of angle probe (CABT)
For the convenience of user’s calibration of probe angle, front edge, zero point and sound speed of material, the function of calibration is built in the gauge. Furthermore; users can also do the calibration of probe. Angle probe can be calibrated with the following method.
Select CABT in group Auto C (Automated calibration of transducer) by the < Auto Calibrate> key, by the <Enter > key, you can see 50/100 echo, and then put your probe. Try to find the highest echo of 100, then press the <Enter >key twice, the zero point and sound speed of material has been calibrated hen press the <Enter > key, you will see x (front edge) =XXX.XX inches /mm. By the <Enter > key you can see ANG echo, Then put your probe, Try to find the highest echo of the hole (φ50), then press , you will see ANG=XXX.X.
Starting of the A gate (a START) / Width of the A gate (a WIDTH)
This menu is multipurpose for Start of Gate A and Width of the gate A, the reason for setting Gate A here again is to make it easy for DAC recording under manual mode; by the <Enter > key, shift the two functions.
TYPE (Types of calibration)
Two kinds of calibration is only different for angle probe, the calibration of straight probe is only one way.
Adjustment of DAC1 Group
The DAC1 group is for setting the parameters necessary for plotting a DAC curve. It includes DAC/REVISE, RECORD/REVISE POS, A START /S WIDTH, SHOW MARK, DAC MODE
DAC display control (DAC)/ TCG display control (TCG)
This menu is multipurpose for DAC display control and TCG display control. Users can shift the functions for DAC and TCG display control (TCG) by the <Enter > key.
DAC:
It is to turn on/off the DAC display. It will be ineffective when B-scan is on.
Options: ON, OFF
Operation:
By the <DAC/AVG> key select DAC1 functional group, select the functional menu for DAC, and then adjust the DAC by the rotary knob.
DAC Plotting Point (RECORD)/DAC Revise Position (REVISE POS)
This menu is multipurpose for DAC plotting point and DAC revise position.
DAC plot is used for recording the echo information necessary for making DAC curve, and DAC revise position is used for positioning the plotting point who needs revising.
RECORD:
Range: 1 to 30
Operation:
By the <DAC/AVG> key select DAC1 functional group, and by Up/Down key, select the functional menu for RECORD.
Before each plotting, move gate A to the needed reference echo, and make sure that the reference echo is located within the gate, then add or delete a plotting point by the rotary knob.
Users can shift the functions for RECORD and REVISE POS by the <Enter> key.
REVISE POS:
Parameter range: 1 to 30, not more than DAC plotting point value
Operation:
By the <DAC/AVG> key select DAC1 functional group, and by Up/Down key, select the functional menu for REVISE POS. and then position the revision point by the rotary knob.
Users can shift the functions for RECORD and REVISE POS by the<Enter> key
Starting of the A gate (a START)/ DAC Revise (REVISE)
This menu is multipurpose for Start of Gate A and DAC Revise, the reason for setting Gate A here again is to make it easy for DAC recording under manual mode; by the <Enter> key.
ASTART:
When the DAC is open, by the <Gate> key, select the functional menu for the A START in DAC1 group, and then adjust A START by the rotary knob.
REVISE:
If the curve is not well drawn due to some plotting point with big plotting error, users can select the corresponding plotting point and adjust the gate to corresponding position, re-plot that point by the function of re-plotting.
Option: ON, OFF
Operation:
By the <DAC/AVG> key select DAC1 functional group, and by Up/Down key, select the functional menu for REVISE, and then revise plotting by the rotary knob.
Show Marks/DAC curve mode
This menu is multipurpose for show marks and DAC curve mode. By the <Enter> key, shift the two functions.
Show Marks:
We can show DAC marks as X symbol through the function. When one of marks is being revised, it will be show as small pane.
Option: ON, OFF
Operation:
By the <DAC/AVG> key, select the functional menu for Show Marks, and then On/off it by the rotary knob.
Curve mode:
The connection mode between DAC marks.
Operation:
By the <DAC/AVG> key, select the functional menu for DAC curve mode, and then select the mode by the rotary knob.
Adjustment of DAC2 Group
DAC Group is used for adjusting the relative parameters necessary for plotting a DAC curve. It includes DAC-EL/ERS-REF, DAC-SL, and DAC-RL, CORRECT.
In order to meet the standard for plotting DAC curve in different industries, the instrument is equipped with three DAC curves with adjustable offsets, which are DAC-EL (evaluating line), DAC-SL (quantifying line), and DAC-RL (reject-judging line). In addition, in order that DAC curve can be adaptive to different ambient conditions, Gain Compensation function is provided. The three offset curve are all generated from generatrix, and the generatrix is drawn according to the plotting points and the ultrasonic attenuation. According to their different functions, they appear separately as DAC-RL, DAC-SL and DAC-EL on the screen from top to bottom. CORRECT works for compensating the difference between the surfaces of test block and detected object which will influence the ultrasonic transmission between them. When the CORRECT gets increased, the three DAC offset curve will get lower correspondingly, and contrarily they will get higher.
DAC evaluating line (DAC-RL)/ DAC-REF
This menu is multipurpose for DAC-RL and DAC-REF; by , shift the two functions.
It is to set the offset of DAC reject-judging line.
Parameter range:-50dB to 50dB
Operation procedure:
By <Page up> key switch the function page.
By <F3> key select DAC2 functional group, and by “↑” or “↓” key, select the functional menu for DAC-EL, and then set the offset of DAC evaluating line by“←” or “→” key.
By key , shift between DAC-EL and DAC-REF
DAC-REF:
DAC-REF means the curve which flaw echo confirm to as standard, “generatrix” or “quantify” is often used, in which generatrix means the primary plotting curve of DAC, another available three standards are all DAC offset. The standard above works only when the DAC is well completed.
Options: GL, RL, SL, EL
Operation procedure:
By <Page up> key switch the function page.
By <F2> key select DAC2 functional group, and by “↑” or “↓” key, select the functional menu for DAC-REF, and then select the reference curve by “←” or “→” key.
By key , shift between DAC-E and DAC-REF
DAC quantifying line (DAC-SL)
It is to set the offset of DAC quantifying line.
Parameter range: -50dBto 50dB
Operation procedure:
By the <DAC/AVG> key select DAC1 functional group, and by Right key, select DAC2 functional group, select the functional menu for DAC-SL and then set DAC quantifying line by the rotary knob.
DAC evaluating line (DAC-EL)
DAC evaluating line (DAC-EL):
It is to set the offset of DAC evaluating line.
Range: -50dB to 50dB
Operation procedure:
By the <DAC/AVG> key select DAC1 functional group, and by Right key, select DAC2 functional group, select the functional menu for DAC-EL and then set the offset of DAC reject-judging line by the rotary knob.
DAC test standards (STANDARD)
There are 14 standards in the instrument “Custom ,GB/T 11345-89A ,GB/T 11345-89B,GB/T 11345-89C, JB/T 4730-2005, JG/T 3034.1/2, SY/T 4109-2005, GB/T 3559-94,ASME-3, DL-T 820-2002 A,DL-T 820-2002 B, DL-T 820-2002 C, TB 10212-98D(butt welds) , TB 10212-98J(fillet welds)”. User can set Custom freely, and other standard is fixed. On the option, user presses enter key (press the rotary knob) can enter standards set menu, in the menu, we can adjust thickness of work piece and test block.
Operation procedure:
By the <DAC/AVG> key select DAC1 functional group, and by Right key, select DAC2 functional group.
Select the functional menu for STANDARD and then set the DAC standards by the rotary knob.
Adjustment of AVG1 Group
AVG1 Group is used for adjusting the relative parameters necessary for an AVG curve. It includes AVG MODE/CHOCK VEL, PROBE NAME, FREQUENCY/DIAMETER, and REF TYPE/REF SIZE AVG MODE/CHOCK VEL
This menu is multipurpose for AVG MODE and CHOCK VEL; by the <Enter> key, shift the two functions.
AVG MODE:
It is to turn on/off the AVG display. It will be ineffective when B-scan is on.
Options: ON, OFF
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for AVG MODE and then set ON/OFF for AVG Curve by the rotary knob.
CHOCK VEL:
Users are allowed to set the transmission velocity of ultrasonic wave in chock according to the sign on the probe.
Range:0.0098 inches to 0.6299 inches (250m/s to 16000m/s)
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for CHOCK VEL and then set the transmission velocity of ultrasonic wave in chock by the rotary knob.
Probe name
Users are allowed to input the name of the probe; the maximum character number is eight.
Option: ASCII character
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for Probe name and. then set the probe name for AVG Curve by the rotary knob and Enter key.
FREQUENCY/DIAMETER
This menu is multipurpose for FREQUENCY and DIAMETER; by the <Enter> key, shift the two functions.
FREQUENCY:
Probe frequency can be input.
Range:0.5MHz to 10MHz
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for FREQUENCY and then set Probe frequency by the rotary knob.
DIAMETER:
The diameter of probe can be input according to sign.
Range:0.11 in to 1.37 (3.00mm to 35.00mm)
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for DIAMETER and then set Probe diameter by the rotary knob.
REF TYPE/REF SIZE
This menu is multipurpose for REF TYPE/REF SIZE; by the <Enter> key, shift the two functions.
REF TYPE:
We must select reflector style on the standard block. There are three reference types.
Option:
Flat bottom hole (FBH): It is a columnar hole in the bottom and its diameter is equal to the size of the reference flaw.
Short horizontal hole (SDH): It is a columnar hole in the side face and its diameter is equal to the size of the reference flaw.
Wide bottom (BW): The reflector is equal to infinite flat bottom approximately.
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for REF TYPE and then set reference type by the rotary knob.
REF SIZE:
The size of reflector is in a standard block.
Range:0.019 in to 0.39 in (0.50mm to 10.00mm)
Operation:
By the <DAC/AVG> key select AVG1 functional group, select the functional menu for REF SIZE and then set reference size by the rotary knob.
Adjustment of AVG2 Group
The AVG2 group is for plotting an AVG curve and setting the parameters necessary for plotting an AVG curve. It includes a start/AVG CURVE、RECORD REF、CORRECT/TEST ATTN.
Start of Gate A / AVG Curve
This menu is multipurpose for Start of Gate A/AVG Curve; by the <Enter> key, shift the two functions.
Start of Gate A:
AVG Curve:
AVG Curve is made according to standard reflector, but when the size of standard reflector cannot meet your work, you can adjust its value.
Range:0.01 in to 0.78 in (0.30mm to 20.00mm)
Operation:
By the <DAC/AVG> key select AVG1 functional group, and by Right key, select AVG2 functional group, select the functional menu for AVG Curve and then set value by the rotary knob.
RECORD REF
The function is used for plotting AVG curve.
Option: 0 (no record) 1 (recorded)
Operation:
To make sure that the system is in single gate mode…
By the <DAC/AVG> key select AVG1 functional group, and by Right key, select AVG2 functional group, select the functional menu for RECORD REF.
Move gate A to echo we need by left or right key.
Adjust gain to make echo amplitude equal to 80% of screen.
Record the reference value by the rotary knob+.
We can revise the value by deleting it (the rotary knob-) and recording it again.
CORRECT/TEST ATTN
This menu is multipurpose for CORRECT/TEST ATTN; by the <Enter> key, shift the two functions.
CORRECT:
The function is used for correcting coupling error between work piece and probe.
Range:-30dB to 30dB
Operation:
By the <DAC/AVG> key select AVG1 functional group, and by Right key, select AVG2 functional group, select the functional menu for CORRECT and then set correct value by the rotary knob.
TEST ATTN:
The function is used for correcting ultrasonic attenuation error in work piece.
Range:0.0dB to 100.0dB
Operation:
By the <DAC/AVG> key select AVG1 functional group, and by Right key, select AVG2 functional group, select the functional menu for TEST ATTN and then set TEST ATTN value by the rotary knob.
Adjustment of Pulse Group
ENERGY
ENERGY:
To set the energy of pulse:
Operation:
By <Next Page > key switch the function page.
By Left/Right key select P/R functional group, and by by Up/Down key, select the functional menu for ENERGY, and then set the pulse energy by the rotary knob.
Pulse Width
The function is used for plotting AVG curve.
Option:30 ns to 300 ns
Operation:
By <Next Page > key switch the function page.
By Left/Right key select P/R functional group, and by Up/Down key, select the functional menu for Pulse Width, and then set pulse width by the rotary knob.
Adjustment of GAIN Group
The Angle Probe group is used for adjusting and setting the parameters for system gain. It includes REF GAIN, ADD REF, SCAN DB, and AUTO GAIN.
Compensate gain (REF GAIN)
Operation:
By <Next Page > key switch the function page.
By Left/Right key select GAIN functional group, and by Up/Down key, select the functional menu for REF GAIN, and then set ON/OFF for REF GAIN by the rotary knob.
Add reference (ADD REF)
We can add scan gain to reference gain.
Options: ON, OFF
Operation:
By <Next Page > key switch the function page.
By Left/Right key select GAIN functional group, and by Up/Down key, select the functional menu for ADD REF, and then set ON/OFF for ADD REF by the rotary knob.
Scan gain value (SCAN DB)/ Auto set gain (AUTO GAIN)
SCAN DB: We can switch scan gain value between Setting value and 0dB.
Options: ON, OFF
Operation:
By <Next Page > key switch the function page.
By Left/Right key select GAIN functional group, and by Up/Down key, select the functional menu for ADD REF, and then set ON/OFF for ADD REF by the rotary knob.
AUTO GAIN:
We can use the function to adjust the gain automatically to make amplitude of the largest echo in gate equal X % of the screen
Options: 10 % to 100%
Operation:
By <Next Page > key switch the function page.
By Left/Right key select GAIN functional group, and by Up/Down key, select the functional menu for AUTO GAIN, and then set X % by the rotary knob.
Gain correction (T-KORR)
T-KORR: Set the CORRECT GAIN.
Parameter range: 0dB to 60 dB step: 0.1dB
Operation:
By Left/Right key select GAIN functional group, and by Up/Down key, select the functional menu for T-KORR, and then set correct gain by the rotary knob.
AWS Group
The AWS menu provides a means for evaluation discontinuities when inspecting welds in accordance with the American Welding Society’s Structure Welding Code, ASNI/AWS D1.1-94. The user is referred to the AWS standard for all details of the method.
The AWS menu provides a convenient method of automatically calculating the Indication Rotating (IR) as defined by the standard. The AWS menu can be used in conjunction with the trigonometry mode which will simultaneous indicate beam path, surface distance and depth distance at the bottom of the graticule.
AWS only work with AWS size and Frequency Probes.
To set the AWS measurements, perform the following
Calibrate the probe
- Set Velocity
- Set right display range
- Put the probe on test block reference hole, For example IIW Type I, 0.05 in (1.5 mm) dia. Hole.
- Adjust the gain until back echo raise to 80 % full screen
- Press “FN” key move the high-light cursor to “AWS” position. Select AWS REFRNCE dB, press “+” key to get REFRNCE dB.
Now the instrument will automatically adjust the gain, the echo in the A Gate will automatically raise or decrease to 50% full screen.
After complete AWS setting, it can start inspection
Move the probe detected the flaw.
Move A Gate cross flaw echo.
Select AWS INDICA dB, press “+” key to get INDICA dB.
Now the instrument will automatically adjust the gain, the echo in the A Gate will automatically raise or decrease to 50% full screen.
Now the instruments will automatically calculate the ATTEN and RATING.
Test Data Display:
We can select display method of measure result on the top right corner of display area. One of S-path, Projection and Depth will be displayed here and the other two will appear in the status bar. When dB is displayed, values S-path data got from DAC curve will appear on the screen. If DAC curve is turned off or the waveform in gate is over the screen, dB will appear as “*”.
Options: S-PATH, P-VAL, DEPTH, VAL-SZ, VAL-mm
Operation:
Press “Measure Display ” key to select display method of measure result.
Calibrating of Single Probe
You should determine the calibrating procedures depending on the known condition of sound speed and probe delay. If the sound speed is unknown, you first calibrate the sound speed by way of “Two Points”; if the sound speed is known, calibrate the probe delay by one-point way after adjusting the sound speed into the known one.
Calibrating with Known MTLVEL
Procedure:
The MTLVEL setting is the known sound speed of the material,
Couple the probe with the calibrating test block,
Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, loop the gate on the primary echo, now the pitch interval measured is the pitch interval at primary echo,
Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block.
Calibrating with Unknown MTLVEL
Procedure:
First set a rough sound speed value;
Adjust the gate logic into Double Gate mode;
Couple the probe with a test block for which the thickness is known and that is of the same material with the job;
Move the start of gate A to the primary echo and make them intersect, adjust the height of gate A to be lower than the max. Amplitude of primary echo and to a proper position, and gate A shall not intersect with the secondary echo;
Move the start of gate B to the secondary echo and make them intersect, adjust the height of gate B to be lower than the max. Amplitude of secondary echo and to a proper position, and gate B shall not intersect with the primary echo;
Then adjust the sound velocity, so that the pitch interval displayed in the status line is same with the actual thickness of the test block. The sound velocity got now is the actuate sound velocity under this detection condition;
Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, the pitch interval measured at this time is the pitch interval at primary echo;
Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block. The probe delay measured at this time is the exact P delay of this probe.
MTLVEL is unknown, set the approximate MTLVEL as 5920m/s, set the Gate Logic as double gate mode, meanwhile set the P delay as 0;
Couple the probe with a calibrating test block of 1.96 in (50 mm), and adjust the gate A to a position intersecting with the primary echo, Adjust gate B to a position intersecting with secondary echo;
Increase MTLVEL, till the displayed pitch interval between the primary and secondary echo is 50mm, now we get the exact sound velocity of the material, i.e. 5891m/s; Set again the gate as Single Gate mode, measure the pitch interval at the primary echo, adjust continuously P Delay till the pitch interval measured at the primary echo is 1.97 in (50 mm), now we get the exact P Delay, i.e. 0.05us.
Calibrating of Double Probe:
Calibrating procedure:
Set double-probe state in PROBE group;
Set the pitch interval, functional items in PROBE group depending on current testing task and probes selected;
Couple the probes with the calibrating test block, adjust the P Delay in Base group till the calibrating echo approaches to the desired position, meanwhile the secondary echo is also within the display range;
Adjust the gain till the echo with the max. Amplitude approaches to the full-screen height;
Turn on double gates in Gate group;
Select Front-edge measuring way in CFG group;
Move the start of Gate A to the primary echo and intersects with it, and Gate A shall not intersect with the secondary echo;
Move the start of Gate B to the secondary echo and intersects with it and Gate B shall not intersect with the primary echo;
Adjust gate heights, so that they are at the same positions of the front edges of two standard echoes;
Change the sound velocity, till it displays the thickness value of the standard test block;
Set the Gate Logic into Single-Gate mode, i.e. Positive or Negative logic, the pitch interval measured at this time is the pitch interval at primary echo;
Adjust the probe delay, so that the measurement of pitch interval in the status line is the same with the known thickness of the test block.
Calibrating of Angle Beam Probe:
Calibrating of angle beam probe is usually as following:
- Calibration of incidence angle (X-Value);
- Calibration of probe angle (K-Value);
- Calibration of material sound speed;
- Calibration of probe Zero point.
1. Calibration of incidence angle (X-Value): Test the probe zero point with W test block (Holland test block) or CSK-A test block, firstly adjust the sound speed to 3230 m/s, detecting range to 5.90 in (150mm), then start the testing, locate the probe on test block and move it as the right figure to make sure you have got the highest echo on R 3.97 in (100mm) reflector, measure the distance, which is the X-Value of probe, between the front face of probe and cycle centre of R3.97 in (100 mm) arc. The point corresponding to the cycle centre of R 3.97 in (100 mm) arc is just the incidence point of probe.
- Calibration of probe angle (K-Value): the probe plotted with angle value can be calibrated with W test block, and the probe plotted with K-Value can be calibrated with CSK-A test block. Both the two kinds of test blocks have the scales of angle and K-Value, select the proper scale for the probe (as shown on the right figure, on the upside of W test block probe of 60 to 76 degrees can be calibrated, the downside is suitable for the probe of 74 to 80 degrees. And on the upside of CSK-A test block probe of K2.0, K2.5, and K3.0 can be calibrated
When the focus on angle menu, press key, we can input L value and then press
key again, the unit will calculate the angle value.
- Calibration of sound speed: find out the highest echo in item 1, and adjust the detecting range to make sure the second echo of this echo can be displayed on the screen, switch the gate mode to double gate, adjust the A gate to cut with the first echo, and adjust B gate to cut with the second echo, adjust the sound speed to make the value of sound path(S) be 100, now the sound speed value you get is the actual sound speed.
- Calibration of probe zero point. Keep the testing status above, and change the gate mode to plus or minus, adjust the probe zero point to make the value of sound path (s) return to 100, now the zero point value is the actual zero point value.
Angle beam probe can be calibrated in many ways, not only by standard test blocks, it can also be done with a thickness known hole, theoretically, smaller of the reference reflector more accurate calibration you will get, however, it will be more difficult to do so. When calibrating with holes, we can do the calibration on angle by working out slope through measuring the depth and level position of hole, and with which processing the calibration of sound speed and probe zero point.
DAC curve
Measuring:
The calibration including sound speed and P delay shall be completed, and the measuring way can be selected as front-edge and peak way. The wave amplitude measured is the max. Echo amplitude within the gate. With front-edge measuring way, the pitch interval measured is the pitch interval at front edge of echo within gate (up line of echo waveform curve).Therefore, when front-edge way is selected, the measurement on echo amplitude in the gate is influenced by the gate threshold (height).
The measurement of pitch interval can be done only when the gate is open, before measuring, you should select the measuring way: edge way and peak way. Then select single or double gate way. Under single-gate way, the measurement is the pitch interval at echo’s front edge or peak in the gate. Under double-gate way, the measurement is the pitch interval starting from the echo within gate A and ending at the echo in the gate B.
List of Operations
All operations are realized by direct triggering of different key(s) on the panel or combination of them. The following list shows the concrete icons, names and functions of panel keys.
Figure | Name | Function |
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Direction | At normal mode, Press Left/Right key to select function group; Press Up/Down key to select the functional menu. At full screen mode, Press Left/Right key to move the gate; Press Up/Down key to adjust the gain value. |
Press Knob | Enter | Press “Enter” key for switch of multi-used function item. Primary or fine adjustment of function items (if available) can be selected via “Enter” key. |
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Gate A | Press “Gate A” key to switch to gate A menu quickly. Press this key continually to select Gate A start, Gate A width or Gate A height for adjustment of corresponding functions. |
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Gain | To adjust the gain step and the gain value by the rotary knob. Press Left/Right key to select the gain step and the gain value .Gain adjustment range is 0dB~120dB. The gain step will display 12.0dB, 6.0dB, 2.0dB, 1.0dB, 0.5dB, 0.1dB and 0dB in cycle. Select suitable gain step for fast adjustment of gain. |
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Full Screen | In ASCAN mode, press “Full Screen” key to select normal mode and amplified mode of display. |
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Detection zone | Press “Detection Zone” key to switch to detection zone menu quickly for adjustment of detection zone. |
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Next page | All function groups are arranged in different pages, press “Next page” key to go to expected page. |
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Extend key | To extend the display and show detail of waveform |
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Freezing | During operation, press “Freezing” key to freeze the wave and data displayed on the screen. Press again for defreezing. |
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save | The report will be automatically saved into the first empty memory section after the No.1 memory section. |
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Auto gain | Adjust the amplitude of the echo in gate to X % (10 % to 100%) of the screen height automatically. |
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Peak Memory | Press “Peak Memory” key to enable/disenable peak memory. |
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Measure Display | Press “Measure Display” key to select display method of measure result. |
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Dynamic record | On/off Dynamic record(make video of the test) |
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Setting | Shortcut key to select the function group of setting. |
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Probe | Shortcut key to select the function group of probe. |
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System Config | Shortcut key to select the function group of CFG. |
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DAC/AVG | Shortcut key to select the function group of DAC/AVG. |
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Auto C | Shortcut key to select the function group of Auto C. |
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Soft power switch | Start/shutdown the machine. |
C | Charge LED | This LED (Green) illuminates during charging and goes off as charge ends. |
A | Alarm LED | This LED (Red) illuminates as the gate alarm is effective. |
6 dB DAC CURVE SETTING STEPS
1.Open DAC. Set the DAC MODE to Line.
2. Record the first point.
3. Record the second point.
4. Record the third point.
5. Press to inter 6dB DAC. Two conditions:
1) Focus on RECORD;
2) The count of DAC points >=3
‘A’ mark will appear. And the echo will be doubled (6dB) from the third point. (The start point must >=3)
- Record the fourth point.
7.Record the fifth point.
8.Record the sixth point.
9.If we want to exit 6dB DAC mode, we must delete the points behind the start point (the third point), then Press to inter 6dB DAC. When the focus is on ‘RECORD’;
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