GAOTek Digital ultrasonic flaw meter(master-slave menu)

This Digital Ultrasonic Flaw Meter (Master-Slave Menu) is designed with advanced technology digital multicolour TFT LCD with a material velocity in the range from 1000 m/s to 9999 m/s.

GT00XY00YU

Description

Overview

GAOTek Digital Ultrasonic Flaw Meter (Master-Slave Menu) is designed with advanced technology digital multicolour TFT LCD with a material velocity in the range from 1000 m/s to 9999 m/s. The device has a large capacity, high-performance Lithium-Ion battery that provides a continuous operating time of 8 hours. It combines strong flaw detection and measurement capabilities, extensive data storage, and the ability to transfer detailed inspection data to the personal computer via its USB port. Gate monitors, transducer connections, real-time clock, crack height measure function and auto-gain function are some of the important features of this device. This high-performance device can be widely used in locating and sizing hidden disbands, voids, cracks, and similar discontinuities in shafts, axles, welds, billets, forgings, tanks and turbines.

Key Features

  • Gate Monitors: Two independent gates controllable over entire sweep range
  • Master slave menu designed with leading technology.
  • Rectification: Positive half wave, negative half wave, full wave, RF
  • Transducer Connections: BNC or LEMO
  • Crack Height measure and auto gain function
  • Curved Surface Correction feature
  • Test Modes: Pulse echo, dual element, and thru-transmission
  • Pulse Energy: Low, Medium and High spike pulse
  • Real-time clock
  • Hi-resolution (320×240 pixels) multi-color TFT LCD with 4 user-selectable brightness control
  • Portable and durable

Technical Specifications

Range 0 in to 236.22 in (0 mm to 6000 mm), at steel velocity
Display Delay -20 µs to 3400 µs
Material Velocity 1000 m/s to 9999 m/s
Pulse Repetition Frequency 10 Hz to 1000 Hz
Sensitivity 110 dB max in selectable resolution 0.1, 1.0, 2.0, 6.0 dB and locked
Probe Delay/Zero Offset 0 µs to 99.99 µs
Damping 100 ohms, 200 ohms, 400 ohms
System Linearity Horizontal: +/-0.2% FSW, Vertical: 0.25% FSH, Amplifier Accuracy +/-1 dB
Power Requirements AC Mains 100 VAC-240 VAC, 50 Hz-60 Hz
Bandwidth (Amplifier Bandpass ) 0.5 MHz to 10 MHz
Battery 7.2 V (Lithium-ion battery)
Reject (Suppression) 0% to 80% full-screen height
Communication High speed USB 2.0 port
Dimensions 10.35 in × 6.69 in × 2.40 in (263 mm × 170 mm × 61 mm)
Operating Temperature 14 °F to 122 °F (-10 °C to 50 °C)
Storage Temperature -22 °F to 122 °F (-30 °C to 50 °C)

Additional Information

Accessories:

  • Digital Ultrasonic Flaw Meter (Master-Slave Menu) with multi-color TFT LCD Display Straight Beam Transducer (4 MHz, Φ10)
  • Angle Beam Transducer (4 MHz, 8 mm ×9 mm, 60°)
  • Interconnect Cable for the transducer (Q9-C5, or optional C9- C5) Rechargeable Li-Ion Battery Package, 8.8 amp hour
  • Power supply/charger unit Supporting pillar
  • Operating Manual in English
  • Datapro Software
  • USB cable
  • Understanding the Keypad, Menu System and Display

Functions

  1. Flaw sizing: Automatic flaw sizing using AVG/AVG or DAC, speeds reporting of defect acceptance or rejection.
  2. AWS D1.1 feature
  3. Envelope: Simultaneous display of live A-scan at 60 Hz update rate and envelope of A-scan display
  4. Weld figure feature
  5. Video Recording and play
  6. Semiautomatic two-point calibration: Automated calibration of transducer zero offsets and/or material velocity
  7. Flaw Locating: Live display Sound-path, Projection (surface distance), Depth, Amplitude
  8. Digital Readout and Trig. Function: Thickness/Depth can be displayed in digital readout when using a normal probe and beam path, Surface Distance, and Depth are directly displayed when angle probe is in use.
  9. Both the DAC and the AVG method of amplitude evaluation are available.
  10. Magnify gate: spreading of the gate range over the entire screen width
  11. Peak Hold: Compare frozen peak waveforms to live A-Scans to easily interpret test results.
  12. A Scan Freeze: Display freeze holds waveform and sound path data
  13. B Scan display feature

Structure Feature

The Main Unit

  1. Belt Product Label
  2. LCD Display Support Pillar Screw
  3. LOGO Battery Case
  4. Hooks Power adapter port
  5. Menu Keys Battery Switch
  6. Alarm LED USB Socket
  7. Power LED    Probe Cable Port (Transmit)
  8. Keypad Probe Cable Port (Receive)
  9. Rotary Knob
  10. Product Label
  11. Support Pillar Screw
  12. Battery Case
  13. Power adapter port
  14. Battery Switch
  15. USB Socket
  16. Probe Cable Port (Transmit)
  17. Probe Cable Port (Receive)

Screen Display

The instrument displays are designed to be easy to interpret.

The Instrument has a digital screen for the display of A-Scan.
The status line below the wave display shows values of range settings and measured values.
On the first status line,

  1. Echo height is displayed as π24.5%. It means that the peak echo height inside the current selected gate is 24.5% FSH (Full Screen Height of the wave area).
  2. Flaw size value means ERS (Equivalent Reflector Size) of the reflector signal inside the current selected gate. It is displayed after the AVG curve is switched on. When the DAC curve is on, this value will be displayed as the dB offset of the peak echo inside the current selected gate to the reference DAC curve
  3. (DAC→OFFSET→SIZE REF).
  4. The icon  indicates that the horizontal scale is displayed as the sound path (S-PATH). It can be changed to →(Projection value) or  ↓(Depth) by simply pressing     repeatedly.

On the second status line, it shows the channel file name, the beam angle and the measured value of the peak echo inside the current selected gate.
“A →  61.3” means gate mode is single; current selected gate is gate A; and peak echo position: sound path 2.41 in (61.3 mm).
“AB → 24.0″ means the Echo-Echo mode of the gates; selected gate is gate A; sound path: 0.94 in (24.0 mm).The names of the menus or submenus are displayed at the bottom of the screen. The selected menu or submenu is highlighted.

Indicated at the right of the display, next to the A-Scan, are the functions of the corresponding menu.

The status area at the bottom-right corner shows the system status. The following status will be shown:

: Indicates the battery capacity
: Straight beam probe
: Angle beam probe
: Dual element probe
: Through-transmit mode
: Envelope function on
: Peak hold function on
   : A-Scan freezed

The status area at the top-right corner indicated shows the system gain and the sound velocity.

Keys and Rotary Knob Features

The instrument is designed to give the user quick access to all of the instrument’s functions. Its easy-to-use menu system allows any function to be accessed with no more than three key presses.
To access any function:

  1. Press one of the five menu keys (F1~F5) to select a menu. The menus across the bottom of the display will immediately be replaced with the submenus contained in the selected menu.
  2. Press a menu key (F1~F5) again to select the submenu containing the desired function.
  3. Up to four functions will be displayed in the function bar on the right side of the display.
  4. Press and   to move the cursor to select the desired function.
  5. Change the value listed in the function box with the rotary knob. Some values can also be adjusted by repeatedly pressing the knob.

Special keys such as Gain, Gate, Range, Probe Zero-Offset Calibration, Angle Calibration, Freeze, Save Waveform, Auto-Gain, Envelop, Peak Hold and etc. are grouped together for easy thumb control. This design allows direct access to important instrument set-up parameters and provides easy and fast operating in difficult inspection environments.

Menus and Functions

The instrument menu system consists of several menus, submenus, and functions. It allows the operator to select and adjust various features and instrument settings.

  1. Available menus are accessed via the Home Menu. Note that the menus visible on your particular instrument depend on which options are installed.
  2. Each menu contains several submenus.
  3. Menus and submenus are selected by pressing the key below the desired item (F1 to F5).
  4. When a submenu is selected, the functions contained in that submenu are listed in the Function Bar down the right-hand side of the display screen.
  5. Functions are then selected by pressing   and .
  6. Rotating the Function Knob, and in some cases continuing to press the knob, will change the value shown in the selected function’s box.

Note that some functions, like RANGE, have both coarse and fine adjustment modes. There are three steps in the fine adjustment mode. Coarse and fine modes are selected by pressing the knob more than once. An icon of “” will appear on the left of the function name when the function is in fine adjustment mode. When the function is in coarse adjustment mode, turning the function knob will produce large changes in the selected function’s value. When the function is in fine adjustment mode, rotating the function knob will change the value by smaller amounts.

Alarm Lights

Two alarm lights appear at the top-right corner front of the instrument’s keypad. One alarm light is marked as ALARM, which is assigned to the gate alarm. When a gate alarm is triggered, this light will illuminate. The other light is marked as POWER indicating power and battery status.

Status ALARM LED POWER LED
Gate Alarm Red on ×
Battery Charging × Flash red/green
Battery Charge Completed with External Power Connected × Green on
External Power Connected No Battery Installed × Green on
No External Power × off

Initial Start-up

Power Supply

The instrument can be operated with an external power adapter or with batteries. You can connect the instrument to the mains supply system even if it carries batteries. A discharged battery is charged in this case, via. parallel to the instrument operation.

Operation Using the Power Supply Unit

Connect the instrument to the mains socket-outlet using the power supply unit. The plug receptacle is at the top left of the instrument. Push the plug of the power supply unit into the plug receptacle until it snaps into place with a clearly audible click. The POWER LED on the keypad of the instrument will light in green color if the connection is properly aligned.

Operation Using Batteries

Use a lithium-ion battery pack provided with the instrument for the battery operation.

The battery compartment is situated at the instrument back. The lid is fastened with 4 attachment block. To insert the battery pack

  1. Move the four attachment block of the battery compartment downward in order to loosen them.
  2. Lift the lid off upward. At the bottom of the battery compartment, you will see two springs.
  3. Insert the battery into the battery compartment. Make sure that the two contacts on the back of the battery pack are connected with the springs in the battery compartment.
  4. Close the battery compartment and fasten the attachment blocks.
  5. Check the battery switch on the top of the instrument. Make sure to switch it on before internal charging.

Note:

The battery switch on the top of the instrument must be set to ON when operating with the battery pack or charging it.When not using the instrument, set the switch to OFF to save power.

Connecting a Probe

To prepare the instrument for operation, you have to connect a probe to it. The instrument is available with the probe connectors BNC (Lemo connectors are optional).

When connecting a probe to the instrument, it’s not only important that the probe’s physical connection be properly made. It’s also important that the instrument is properly configured to work with the installed probe. The instrument will operate with one or two single-element probes or with a dual-element probe.

To install a single-element probe, connect the probe cable to either of the two ports on the front of the instrument. When two probes or a dual-element probe is connected to the instrument, the “Receive” probe connector should be installed in the right port and the ‘Transmit’ probe connector in the left port.

Connect one single element probe to either port. Connect leads from a Dual Element Probe to both ports.

For through-transmission, connect two single element probes to the transmit and receive ports.

Starting the Instrument

To start the instrument, press the switch-on  . If it operates on the internal battery pack, make sure to set the battery switch to ON position before starting. The start display of the instrument appears; here you will also see the current software version and the serial number of the instrument. The instrument carries out a self-check and then switches over to stand-by mode.

The settings of all function values are the same as before switching-off of the instrument.The instrument will shut off automatically when the battery capacity level is too low.

Operation

Adjusting the Display Range

The function group BASE enables you to make the basic adjustment of the display range. The display on the screen must be adjusted for the material to be tested and for the probe used.

Calibration requires the use of calibrated standard made of the same material as the test piece. Prior to calibrating the instrument/probe combination, the A-Scan display-screen range (the material thickness value represented by the full horizontal width of the screen) will normally be set to a value equal to or slightly larger than the calibrated standard.

  1. Activate the BASE submenu (located in the BASIC menu) by pressing the menu key below it. Three functions will appear down the right side of the display screen.
  2. Move the cursor to the selection titled RANGE. You’ll note that RANGE has both coarse and fine adjustment modes. Coarse and fine modes are selected by repeatedly pressing the knob.
  3. To change the range, turn the knob.
  4. The display’s horizontal range will remain as set.

Setting the Material Velocity

Use VEL to set the sound velocity within the test object. Always ensure that the function VEL is correctly set. The instrument calculates all range and distance indications on the basis of the value adjusted here.

Velocity range:1000 m/s ~ 9999 m/s coarse adjustment, in steps as follows:

2260 m/s         2730 m/s         3080 m/s         3230 m/s

4700 m/s         5920 m/s         6300 m/s

Setting the Display Delay

Here you can choose whether to display the adjusted range starting from the surface of the test object, or in a section of the test object starting at a later point. This allows you to shift the complete screen display and consequently also the display zero. If the display should, for example, start from the surface of the test object, the value in D-DELAY must be set to 0. To set the display delay

  1. Activate the BASE submenu (located in the BASIC menu) by pressing the menu key below it. Three functions will appear down the right side of the display screen.
  2. Move the cursor to the selection titled D-DELAY.
  3. To change the display delay, turn the knob. You’ll note that the displayed echoes shift to the left or right.

D-DELAY range: -20 µs~3400 µs
Coarse adjustment: 12-pixel space (in µs) Fine adjustment: 1-pixel space (in µs)

Selecting the Probe Test Mode

You can use the function PROBE to activate the pulser-receiver separation. The following modes are available:

  1. STRAIGHT – For single straight beam transducer  operation will be displayed). The probe connection sockets are connected in parallel.
  2. ANGLE – For single angle beam transducer operation ( will be displayed)
  3. DUAL – For the use with dual-element (TR) probes  will be displayed); the right-hand socket is connected to the amplifier input whereas the initial pulse is available at the left-hand socket.
  4. THRU – Through-transmission mode for the use with two single-element probes  will be displayed); the receiver is connected with the right, the pulser is connected with left.
  5. Activate the PROBE submenu (located in the CAL menu) by pressing the menu key below it.
  6. Move the cursor to the selection titled PROBE.
  7. To change the probe mode, turn the knob. Each available probe mode is represented by an icon that’s displayed near the down-right corner of the display whenever that probe mode is indicated.
  8. The probe mode will be set to the last one displayed.

Auto Gain Feature

Use the Auto Gain function to automatically set the basic gain, so as to adjust the peak echo inside the current selected gate to a target height.

  1. Set the target echo height using the AUTO function located in the FUNC submenu.
  2. Press  to start the Auto Gain function. “AUTO-XX%” will be shown on the screen.
  3. The Auto Gain function will end when the echo height reaches the target or you can stop the function by pressing  again.

Configuring the Gates

The gates monitor the range of the test object where you expect to detect a flaw. If an echo exceeds or falls below the gate, an alarm signal is sent out via the ALARM LED. The gate chooses the echo for the digital time-of-flight or amplitude measurement.

The instrument has two gates: gate A and gate B. Gate A and B are independent of one another. Setting the position and characteristics of the A- and B-Gates is the first step to configuring the instrument for flaw detecting or material-thickness measurement. The GATE functions control not only the location of the A and B-Gates but also the alarms and other features activated when an A-Scan signal crosses a specific gate.

A-Scan signals crossing the A or B-Gate are evaluated for the purposes of flaw detection and material-thickness evaluation. When the signal crosses the A or B-Gate, the maximum point (peak) of the signal (in the specific gate) is used for evaluation purposes. The measured value is indicated on the status line.

Setting the Damping Level

This function serves for matching the probe. You can use it to adjust the damping of the probe’s oscillating circuit and to consequently change the height, width, and resolution of the echo display.

Setting the Damping Level

This function serves for matching the probe. You can use it to adjust the damping of the probe’s oscillating circuit and to consequently change the height, width, and resolution of the echo display.

  1. Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
  2. Move the cursor to the selection titled DAMPING.
  3. To change the specified damping level and optimize the A-Scan signal appearance, turn the knob. You’ll note that the following damping levels are available: 100 Ω, 200 Ω, 400 Ω.
  4. The damping level will be set to the one last displayed.

Setting the Pulse Energy Level

Use the function ENERGY to set the pulser voltage. The relative energy with which the pulser fires can be set to LOW, MEDIUM or HIGH.The setting MEDIUM is recommended for most inspections. HIGH is used for inspections in which maximum sensitivity is the import, e.g. for the detection of small flaws. Choose the setting LOW for broadband probes or if narrow echoes are required (better lateral resolution).

To set the pulser energy

  1. Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
  2. Select the function titled ENERGY.
  3. Select the energy level by turning the knob.

Adjusting the Pulse Repetition Frequency (PRF)

The pulse repetition frequency indicates the number of times an initial pulse is triggered per second. You can determine whether you need the highest possible PRF value, or whether you are satisfied with a low value.
The PRF value ranges from 10 Hz to 1000 KHz. The larger your work piece, the smaller PRF values are needed in order to avoid phantom echoes. In the case of smaller PRF values, however, the A-Scan update rate becomes lower, for this reason, high values are required if a work piece should be scanned fast.
The best way to determine the suitable PRF value is by experimenting: start from the highest step and reduce the value until there are no more phantom echoes.

To set the PRF level

  1. Activate the PULSER submenu (located in the CAL menu) by pressing the menu key below it.
  2. Select the function titled PRF.
  3. Change the PRF value by turning the knob.

Specifying the Probe Frequency

In this function, you can specify the probe frequency according to the frequency of your probe. The instrument will automatically utilize a built-in filter to match the probe frequency.

  1. Activate the PROBE submenu (located in the CAL menu) by pressing the menu key below it.
  2. Move the cursor to the selection titled FREQ.
  3. To change the specified frequency, turn the knob.
  4. The probe frequency will be set to the last one displayed.
  5. Specifying the Piezo Crystal Size
  6. Use DIAMETER function to set the Piezo Crystal Size of your probe. This value is required when programming the AVG.

Setting the Probe X-Value

The function X-VALUE enables you to set the X-Value (distance between the probe’s leading face and probe index/sound exit point) of the probe used. This value is required for the automatic calculation of the reduced projection distance in angle beam transducer operation.
Adjustment range: 0 in~1.96 in (0 mm~50 mm)

Connecting to a Computer

The instrument is equipped with a USB port at the upper left of the instrument. The PC can be connected to the instrument via the USB port. A-Scan display, instrument settings, and videos stored in the memory of the instrument can be transferred to the computer through the USB port.

Calibration and Measurement

Before working with the instrument, you have to calibrate the instrument: you have to adjust the material velocity and display range and allow for the probe delay depending on the material and dimensions of the test object.To ensure a safe and proper operation of the instrument, it is necessary that the operator is adequately trained in the field of ultrasonic testing technology.
Below you will find some examples of common calibration methods for certain test tasks.

Calibration with Straight- and Angle-Beam Probes

Case A: With Known Material Velocity Calibration process

  1. Set the known material velocity in VEL function.
  2. Couple the probe to the calibration block.
  3. Set the required display range in RANGE. The calibration echo must be displayed on the screen.
  4. Position the gate on one of the calibration echoes until the sound path of the echo is indicated in the measurement line.
  5. After this, change the adjustment of the function P-DELAY until the correct sound path for the selected calibration echo is indicated in the measurement line.

Case B: With Unknown Material Velocity

Use the semiautomatic calibration function of the instrument via the function group CAL for this calibration case.

The distances between two calibration echoes must be entered. The instrument will then carry out a plausibility check, calculate the material velocity and the probe delay, and automatically set the parameters using the calculation result.

Calibration Process

Set the required display range in RANGE. The two calibration echoes selected must be displayed on the screen. Set the range so that the second calibration echo is located on the right edge of the screen.

  1. Select the function group PDELAY (CAL→PDELAY).
  2. Enter the distances of the two calibration echoes in S-REF1 and S-REF2.
  3. Position one gate on the first calibration echo.
  4. Position the other gate on the second calibration echo.
  5. Press the knob while selecting the function CAL to trigger the calibration. The calibration is confirmed by the message “Calibration is finished”. The instrument will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly. The value of the function P-DELAY will be set to the correct value.
  6. If the instrument is not able to carry out any valid calibration on the basis of the input values and the echoes recorded, a corresponding error message is displayed. In that case, please check the values of your calibration lines and repeat the process of recording the calibration echoes.

Example:

You are carrying out the calibration with a straight probe for the calibration range of 11.81 in (300 mm)

  1. Select a new channel and clear that channel (MEM → CHANNEL →FILE).
  2. Set PROBE type to STRAIGHT.
  3. Enter the distances (thicknesses) of the two calibration lines S-REF1 8.85 in (225 mm) and S-REF2 17.71 in (450 mm).
  4. Position one gate on the first calibration echo.
  5. Position the other gate on the second calibration echo.
  6. Press the knob while selecting the function CAL to carry out the calibration. The valid calibration is briefly confirmed and carried out.
  7. Save the calibration result to current channel file.

Calibration with Dual-Element (TR) Probes

Dual-element (TR) probes are especially used for wall thickness measurement. The following peculiarities must be taken into account when using these probes:

Echo Flank: Most dual-element (TR) probes have a roof angle (transducer elements with an inclined orientation toward the test surface). This causes mode conversions both at beam index (sound entry into the material) and at the reflection from the back wall, which can result in very jagged echoes.

V-Path Error: Dual-element (TR) probes produce a v-shaped sound path from the pulser via the reflection from the back wall to the receiver element. This so-called “V-path error” affects the measuring accuracy. You should, therefore, choose two wall thicknesses that cover the expected thickness measurement range for the calibration. In this way, the V-path error can be corrected to the greatest possible extent.

Calibration Process

We recommend using the semiautomatic calibration function for the calibration with T/R probes.

  1. Set the required test RANGE
  2. Increase the probe delay until the two calibration echoes selected are displayed within the range
  3. Set the pulser and receiver functions according to the probe used and the test application.
  4. Select the function group PDELAY.
  5. Enter the distances of the two calibration echoes in S-REF1 and S-REF2.
  6. Position one gate on the first calibration echo.
  7. Position the other gate on the second calibration echo.
  8. Press the knob while selecting the function CAL to trigger the calibration. The correct calibration is confirmed by the message “Calibration is finished”. The instrument will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly. The value of the function P-DELAY will be set to the correct value.
  9. If necessary, check the calibration on one or several known calibration lines, e.g. using the stepped reference block.

Distance Amplitude Curve

The instrument is available with Multi-Curve Distance Amplitude Curve (DAC) function. Functions for the distance-amplitude curve are accessed through the DAC Menu, which is located by pressing .

When displayed, the DAC curve visually represents a line of constant reflector peaks over a range of material depths. A new feature of the instrument is a multiple-curve option that displays three dB offset DAC curves simultaneously. Each curve represents constant reflector size at varying material depth. Remember that in DAC mode, the only deviation from traditional display and operation is the appearance of the DAC curve. All A-Scan echoes are displayed at their non-compensated height.

A DAC curve is programmed using a series of same-reflector echoes at various depths covering the range of depths to be inspected in the test material. Because near field and beam spread vary according to transducer size and frequency, and materials vary in attenuation and velocity, DAC must be programmed differently for different applications. A DAC curve can be based on up to 16 data points (material depths).

Measuring with DGS/AVG

Using the AVG (the same as DGS) function, you can compare the reflecting power of a natural flaw in the test object with that of a theoretical flaw (circular disk-shaped equivalent reflector) at the same depth.
Note: You are comparing the reflecting power of a natural flaw with that of a theoretical flaw. No definite conclusions may be drawn on the natural flaw (roughness, inclined position, etc.).The so-called AVG diagram forms the basis for this comparison of the reflecting power. This diagram consists of a set of curves showing the correlation of three influencing variables:

  1. Distance between the probe and circular disk-shaped equivalent reflector
  2. Difference in gain between various large circular disk-shaped equivalent reflectors and an infinitely large back wall
  3. Size of the circular disk-shaped equivalent reflector. The influencing variable always remains constant for one curve of the set of curves.

The advantage of the AVG method lies in the fact that you can carry out reproducible evaluations of small discontinuities. The reproducibility is most of all important, for example, whenever you aim to carry out an acceptance test.Apart from the influencing variables already mentioned, there are other factors determining the curve shape: sound attenuation, transfer losses, amplitude correction value, probe etc.

The following probe parameters affect the curve shape:

  1. Element or crystal diameter
  2. Frequency
  3. Delay length
  4. Delay velocity

You can adjust these parameters on the instrument in such a way that you can use the AVG method with many different probes and on different materials.

Note: Before setting the AVG function, the instrument must first be calibrated because all functions affecting the AVG evaluation mode (VEL, P-DELAY, DAMPING, ENERGY, P-WIDTH, FREQ, DIAMETER, RECTIFY) can no longer be changed after the reference echo has been recorded.

Curved Surface Correction

When using angle beam transducers on a curved surface, the instrument will calculate the surface distance and depth of defect, taking into account the internal or external radius.

THICK: Use the THICK function to set the material’s wall thickness. This value is required for the automatic calculation of the real depth.
Adjustment range: 0 in~196.85 in (0 mm~5000 mm)

O-DIAM (Outside diameter of the test object): You will need the CSC function for tests on circular curved surfaces, for example when testing longitudinally welded tubes. In order to make the instrument carry out the corresponding correction of (reduced) projection distance and depth, you should enter the outside diameter of your test object in this function.
Adjustment range: 0 in~196.85 in (0 mm~5000 mm)

CSC: If you plan to carry out the flaw position calculation for the curved surface workpieces, the CSC function should be turned on. Otherwise turn off the CSC function.

Crack Height Measuring Feature

This feature allows measuring the height of a crack found inside the workpiece. Before starting to use the Crack Height Measure function, the instrument and the probe must be correctly calibrated.

  1. Activate the CRACK submenu locating in the FUNC menu by pressing the corresponding key below it.
  2. Position the selected gate over the echo from the first point of the crack. Then record its position using the A-POINT function.
  3. Position the selected gate over the echo from the second point of the crack. Then record its position in the B-POINT function.
  4. The instrument will automatically calculate the crack height using the recorded parameters and displays the result in the HEIGHT bar.

 

Data Storage

The instrument is equipped with a data-storage system. A-Scans patterns, instrument settings, and video can be stored in data files for later retrieval. File data can be saved, recalled and deleted by using the MEM menu.

Wave Files

Wave files are used to store A-Scan pattern, along with the instrument settings. Data in the wave files can be stored, recalled and erased.

Wave STORE

You can save the A-Scan pattern to a wave file using the STORE function.

  1. Select the function FILE.
  2. Use the knob to set the file name where you would want to store the current A-Scan pattern (F000~F999).
  3. Select the function STORE
  4. Use the knob to trigger the STORE operation.

Note:

The asterisk (*) before a selected file name indicates that this file is already occupied. It is not possible to overwrite an occupied file. Users should select another file name which is still empty or clear the occupied file to save to. To avoid loss of data e.g. in case of a software update you should save the file to a PC.

Wave RECALL

You can recall a stored wave file; your instrument will then display all the test-relevant technical features that existed at the moment of the setup. A frozen display of the stored A-Scan appears.

Wave CLEAR

An occupied file is marked with an asterisk (*) before the file name. You can clear the file if you no longer need them. Wave Files are cleared using the CLEAR function.

  1. Select the function FILE.
  2. Use the knob to set the file name to clear (F000~F999).
  3. Select the function CLEAR.
  4. Use the knob to trigger the CLEAR operation. It will then prompt: Clear wave file?
  5. Confirm by pressing the corresponding key.
  6. The file is now cleared; the asterisk preceding the file name is no longer there.

Channel Files

Channel files (CH00~CH99) are used to store a specific instrument setup configuration. This means that whenever you recall a stored channel file, your instrument is again set up exactly the same as it was at the moment when the file was stored. This makes each one of your tests reproducible. You will find the following functions:

Channel STORE

To store instrument settings in a channel file follow this procedure

  1. Activate the CHANNEL submenu (located in the MEM menu) by pressing the menu key below it.
  2. Move the cursor to the selection titled FILE. Then change the file name to the one you desire by turning the knob. Note that if the file is no empty, an icon of * will appear before the file name and the instrument will automatically load the file. If the file is empty, the instrument will load the default settings.
  3. Move the cursor to the selection titled STORE. Perform the store operation by turning the knob. If the store operation is successful, it will prompt out: “Data saved”.

Note that if the channel file is not empty, it will prompt out to ask if you want to overwrite the channel file.

Channel COPY

To copy instrument settings from another channel file to this channel,

  1. Activate the CHANNEL submenu (located in the MEM menu) by pressing the menu key below it.
  2. Move the cursor to the selection titled COPY. Perform the copy operation by pressing the knob.
  3. Input the channel file to copy from. Then press the key below OK.
  4. The settings in the source file will then be copied to current channel file. If you want to save these settings to current channel file, you can carry out the channel STORE operation.

Channel CLEAR:

Channel files are cleared using this procedure:

  1. Activate the CHANNEL submenu (located in the MEM menu) by pressing the menu key below it.
  2. Select the FILE function. Turn the knob until the desired file name appears.
  3. Select the CLEAR function. Turn the knob to perform the file CLEAR function. It will prompt out: “Clear this channel?” Press the menu key below YES to confirm the operation, or press the menu key below NO to cancel the operation.

Note:

The cleared file may not be retrieved.
The current settings of the instrument will be reset to default settings after the channel clear operation.

Video Files

Video file (DV01) is used to store a segment of the video. To record a segment of video
– Activate the video recording operation by pressing  . An icon will appear in the status area when recording the video.
– To stop the recording, simply press  once more.
The recording process will automatically end when the video file is full. Use RECALL function to RECALL a video file.

RESET Function

You can clear all channels, all waves and all videos using the functions in the RESET submenu.

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