GAOTek Event Map Ethernet Tester
This Event Map Ethernet Tester have a wavelength of 1700 nm, battery life of >20 hrs, display of 4.3 in, and operating temperature of 14° F to 131° F.
SKU:
GAOTek-ENET-156
Category: Ethernet Testers
Description
Description
Features
- 9 in-1 functions
- Cover plate-type glass
- Treasure charging
- Sink-type light
- Support all interface
Technical Specification
Wavelength | 800 nm to 1700 nm |
Display | 4.3 in (10.92 cm) |
Output Wavelength | 1310 nm or 1550 nm ± 20 nm |
Measuring Range | -70 dBm to +6 dBm or -50 dBm to +26 dBm |
Battery Life | >20 Hrs |
Operating Temperature | 14° F to 131° F (-10° C to 55° C) |
Storage Temperature | -40° F to 176° F (-40° C to 80° C) |
Size | 6.88 in x 4.13 in x 1.77 in (175 mm x 105 mm x 45 mm) |
Weight | 1.23 lb (560 g) |