GAOTek Event Map Ethernet Tester

This Event Map Ethernet Tester have a wavelength of 1700 nm, battery life of >20 hrs, display of 4.3 in, and operating temperature of 14° F to 131° F.

SKU: GAOTek-ENET-156 Category:
Description

Description

Features

  • 9 in-1 functions
  • Cover plate-type glass
  • Treasure charging
  • Sink-type light
  • Support all interface

 

Technical Specification

Wavelength 800 nm to 1700 nm
Display 4.3 in (10.92 cm)
Output Wavelength 1310 nm or 1550 nm ± 20 nm
Measuring Range -70 dBm to +6 dBm or -50 dBm to +26 dBm
Battery Life >20 Hrs
Operating Temperature 14° F to 131° F (-10° C to 55° C)
Storage Temperature -40° F to 176° F (-40° C to 80° C)
Size 6.88 in x 4.13 in x 1.77 in (175 mm x 105 mm x 45 mm)
Weight 1.23 lb (560 g)