GAOTek Foundation Pile Low Strain Wave Flaw Tester

This Foundation Pile Low Strain Wave Flaw Tester has time intervals range of 6.4 μs to 1638.4 μs and amplifier frequency range of 1 Hz to 10 Hz.

GAOTek-SFD-185

Description

Features

  • Wireless connectivity between accelerated sensor and PDA allows easy and more flexible usage on site
  • PDA can work up to 10 meters away from the accelerated sensor
  • Real time on-site processing such as smoothing, differential, filtering, exponent
  • Linear amplification can be given to tested waveform
  • The signal noise can be eliminated by taking average superposition of multiple signals
  • Superposition signals can be checked at any time, and poor-quality signals can be rejected
  • Project/pile testing data can be easily saved, accessed, edited, or deleted
  • Gain value can be adjusted according to length of pile and top surface condition of pile

 

Technical Specification

Control Mode Android platform
Screen High brightness, TFT color LCD screen
Data Storage ≥8 GB
Operation Mode touch screen
Sentinels magnify (time) 1,2,4,8,16,32 adjustable
A/D resolution (bit) 24 bits A/D
Sampling time intervals 6.4 μs to 1638.4 μs adjustable
Max length of sampling ≥2048
Trigger Signal trigger
Noise voltage of the system (mV) ≤2
Dynamic range ≥180 dB
Amplifier frequency range 1 Hz to 10 Hz
Max storage length 2048
Amplitude nonlinear degree ≤10%
Fixed point magnification 1, 2, 4, 8, 16, 32,64
Error of time indication ≤1%
Time resolution(us) 6.4
Gain error(dB) ≤1
Continuous working time(h) >5
Number of channels 1
Interference between the channels No
Transducer/Probe Sensitivity(acceleration mode)(mv/g) ≥100
Frequency range of Probe(Acceleration probe) (Hz) 0.5 to 9000
Wi-fi Yes
Weight(kg) 0.749 lb (340 g) lithium battery included
Total volume (mm) Φ 5 × 120

 

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