Description
Overview
GAOTek ultrasonic long cycle flaw detector use long cycle flaw detector adopts an embedded computer system and a super large-scale field programmable IC design, which combine all good performance of a large ultrasound system in a very small space: at least 65dB detection sensitivity surplus will meet detection demand for large forged pieces or coarse-crystal material; LAN Ethernet port for real-time communication with a PC (Host) and remote control; Cine loop function for recording the dynamic scanning process; The new-type color TFT LCD results in optimize read & measure effect and visual comfort; The simple but convenient surface wave tracking function is good for immersion detection; Together with new techniques and new functions such as DAC, RF echo display, large memory and USB port, it becomes a handy ultrasonic flaw detector with excellent performance.
Features
- Integral design, compact size
- Easy to carry and make work efficient
- Measurement data can be calibrated manually
- Though coating measurement
- The net thickness of the substrate can be measured without removing paintings
- Unique multiple-wave verify mode
Technical Specification
Detection range | 0.34 in (10 mm) |
Pulse mode | Sharp pulse, square wave, dual-square wave |
Quantitative mode | DAC curve (DGS) curve |
Damping | strong and weak adjustable |
Pulse voltage | 100 V to 300 V |
Resolution | 3.87 in x 7.56 in (800 mm x 480 mm ) |
Weight | 19.8 lb (8.98 kg) |
Size | 7.98 in x 2.56 in x 4.67 in (18.3 cm x 11.3 cm x 4.5 cm) |