Description
Feature
- independent flaw detection channels, which can freely set and store various flaw detection processes and standards, and can store 100 flaw detection waveform signals and data
- real time dynamic color recording with recording time up to 50 minutes
- There are two scanning modes: A-scan and b-thickness scan
- Square wave pulse generator: adjustable pulse width, suitable for detecting the defects of different materials and different depth workpieces;
- DAC curve making
- 5.7 in TFT color display, users can set the screen color according to the environment
- Compatible with single crystal straight, single crystal oblique, double crystal and transmission probes
- Three detection modes: positive half wave, negative half wave and full wave
- It has automatic calibration function of straight probe and angle probe, which is easy to use;
- functions such as defect peak memory to assist in qualitative judgment of defects
- audible and visual alarm and low power alarm can be set for gate, curve wave in, wave loss and other conditions
- main menu and submenu are displayed in the same window. Clear at a glance, easy to operate, easy to find
Technical Specifications
| Working frequency | 0.2 MHz to 15 MHz |
| Sound speed range | 1000 m / S to 9999 m / S |
| Gain range | 0 dB to 110 dB |
| Sampling frequency | 100 MHz |
| Display delay | – 20 μ s to + 3400 μ s |
| Probe bias | 0 μ s to 99.99 μ s |
| Electric noise level | ≤ 10% |
| Sensitivity margin | > 62 db |
| Resolution | > 40 dB |
| Vertical linear error | ≤ 3% |
| Horizontal linear error | ≤ 0.1% |
| Dynamic range | ≥ 32 dB |
| Battery | 6 V × 3.7 V (lithium battery) |
| Power supply | 8.4 V |
| Size | 9.1 in x 6.7 in x 2.2 in (23 mm × 17 mm × 5.5 mm) |
| Weight | 3.4 in (1.56 kg) |
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